Patents by Inventor James P. Fulton
James P. Fulton has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 6054210Abstract: A molded magnetic article and fabrication method are provided. Particles of ferromagnetic material embedded in a polymer binder are molded under heat and pressure into a geometric shape. Each particle is an oblate spheroid having a radius-to-thickness aspect ratio approximately in the range of 15-30. Each oblate spheroid has flattened poles that are substantially in perpendicular alignment to a direction of the molding pressure throughout the geometric shape.Type: GrantFiled: April 9, 1997Date of Patent: April 25, 2000Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space AdministrationInventors: Robert G. Bryant, Min Namkung, Russell A. Wincheski, James P. Fulton, Robert L. Fox
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Patent number: 5942894Abstract: A radially focused eddy current sensor detects longitudinal flaws in a metal tube. A drive coil induces eddy currents within the wall of the metal tube. A pick-up coil is spaced apart from the drive coil along the length of the metal tube. The pick-up coil is positioned with one end thereof lying adjacent the wall of the metal tube such that the pick-up coil's longitudinal axis is perpendicular to the wall of the metal tube. To isolate the pick-up coil from the magnetic flux of the drive coil and the flux from the induced eddy currents, except the eddy currents diverted by a longitudinal flaw, an electrically conducting material high in magnetic permeability surrounds all of the pick-up coil except its one end that is adjacent the walls of the metal tube. The electrically conducting material can extend into and through the drive coil in a coaxial relationship therewith.Type: GrantFiled: September 13, 1995Date of Patent: August 24, 1999Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space AdministrationInventors: Russell A. Wincheski, John W. Simpson, James P. Fulton, Shridhar C. Nath, Ronald G. Todhunter, Min Namkung
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Patent number: 5847562Abstract: A thickness gauging instrument uses a flux focusing eddy current probe and two-point nonlinear calibration algorithm. The instrument is small and portable due to the simple interpretation and operational characteristics of the probe. A nonlinear interpolation scheme incorporated into the instrument enables a user to make highly accurate thickness measurements over a fairly wide calibration range from a single side of nonferromagnetic conductive metals. The instrument is very easy to use and can be calibrated quickly.Type: GrantFiled: May 8, 1997Date of Patent: December 8, 1998Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space AdministrationInventors: James P. Fulton, Min Namkung, John W. Simpson, Russell A. Wincheski, Shridhar C. Nath
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Patent number: 5698977Abstract: Flux-focusing electromagnetic sensor using a ferromagnetic flux-focusing lens simplifies inspections and increases detectability of fatigue cracks and material loss in high conductivity material. A ferrous shield isolates a high-turn pick-up coil from an excitation coil. Use of the magnetic shield produces a null voltage output across the receiving coil in presence of an unflawed sample. Redistribution of the current flow in the sample caused by the presence of flaws, eliminates the shielding condition and a large output voltage is produced, yielding a clear unambiguous flaw signal.Maximum sensor output is obtained when positioned symmetrically above the crack. By obtaining position of maximum sensor output, it is possible to track the fault and locate the area surrounding its tip.Type: GrantFiled: June 5, 1995Date of Patent: December 16, 1997Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space AdministrationInventors: John W. Simpson, James P. Fulton, Russell A. Wincheski, Ronald G. Todhunter, Min Namkung, Shridhar C. Nath
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Patent number: 5648721Abstract: A flux-focusing electromagnetic sensor which uses a ferromagnetic flux-focusing lens simplifies inspections and increases detectability of fatigue cracks about circular fasteners and other circular inhomogeneities in high conductivity material. The unique feature of the device is the ferrous shield isolating a high-turn pick-up coil from an excitation coil, The use of the magnetic shield is shown to produce a null voltage output across the receiving coil in the presence of an unflawed sample. A redistribution of the current flow in the sample caused by the presence of flaws, however, eliminates the shielding condition and a large output voltage is produced, yielding a clear unambiguous flaw signal.By rotating the probe in a path around a circular fastener such as a rivet while maintaining a constant distance between the probe and the center of a rivet, the signal due to current flow about the rivet can be held constant.Type: GrantFiled: November 22, 1994Date of Patent: July 15, 1997Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space AdministrationInventors: Russell A. Wincheski, James P. Fulton, Shridhar C. Nath, John W. Simpson, Min Namkung
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Patent number: 5617024Abstract: A flux-focusing electromagnetic sensor which uses a ferromagnetic flux-focusing lens simplifies inspections and increases detectability of fatigue cracks and material loss in high conductivity material. The unique feature of the device is the ferrous shield isolating a high-turn pick-up coil from an excitation coil. The use of the magnetic shield is shown to produce a null voltage output across the receiving coil in the presence of an unflawed sample. A redistribution of the current flow in the sample caused by the presence of flaws, however, eliminates the shielding condition and a large output voltage is produced, yielding a clear unambiguous flaw signal.The maximum sensor output is obtained when positioned symmetrically above the crack. Hence, by obtaining the position of the maximum sensor output, it is possible to track the fault and locate the area surrounding its tip.Type: GrantFiled: May 8, 1996Date of Patent: April 1, 1997Assignee: The United States of America as represented by the United States National Aeronautics and Space AdministrationInventors: John W. Simpson, C. Gerald Clendenin, James P. Fulton, Russell A. Wincheski, Ronald G. Todhunter, Min Namkung, Shridhar C. Nath
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Patent number: 5493511Abstract: A device and method are provided which non-destructively detect crack length and crack geometry in thin metallic plates. A non-contacting vibration apparatus produces resonant vibrations without introducing extraneous noise. Resulting resonant vibration shifts in cracked plates are correlated to known crack length in plates with similar resonant vibration shifts. In addition, acoustic emissions of cracks at resonance frequencies are correlated to acoustic emissions from known crack geometries.Type: GrantFiled: December 8, 1992Date of Patent: February 20, 1996Assignee: Administrator, National Aeronautics and Space AdministrationInventors: Buzz A. Wincheski, Joseph S. Heyman, Min Namkung, James P. Fulton