Abstract: Disclosed is a fence support including a generally vertically oriented main support post in the form of a T shaped iron bar and a single brace. The brace includes an elongated bearing element that is received in the bite of the T and a collar member fits over the top of the main support post and bearing elements to hold them together. The brace has at its bottom end a stake holder which receive a stakes that are driven into the ground. Two different gate adapters are shown for mounting in a hinge like manner a gate to a T-post or the like.

Abstract: Disclosed is a fence support including a generally vertically oriented main support post in the form of a T shaped iron bar and a single brace. The brace includes an elongated bearing element that is received in the bite of the T and a collar member fits over the top of the main support post and bearing elements to hold them together. The brace has at its bottom end a stake holder which receive a stakes that are driven into the ground. Two different gate adapters are shown for mounting in a hinge like manner a gate to a T-post or the like.

Abstract: An in-circuit test fixture for use in making a nonfunctional electrical inspection of individual components and/or circuit paths on a printed circuit board or wired backpanel assembly. The present in-circuit test fixture is cost effective and can be used when only small or moderate numbers of printed circuit boards have to be tested. The present test fixture eliminates the necessity for drilling holes in a support plate. Rather, a test head unit and a transition head unit are put together in modular fashion using assemblies which may be positioned in stacked arrays to provide a two-dimensional series of channels for support of pins to provide a test head for testing a two-dimensional product and to provide a two-dimensional series of channels for support of pins to provide a transition head for interconnection with an electronic circuit analyzer.

Abstract: Disclosed is a fence support including a generally vertically oriented main support post 31 in the form of a T shaped iron bar and a pair of braces 18. Each brace 18 includes an elongated bearing element 26 that is received in the bites of the T and a collar member 25 fits over the top of the main support post 31 and bearing elements 26 to hold them together. The braces 18 have at their bottom ends stake holders 16 and 17 which receive stakes 23 that are driven into the ground. An anchor 24 holds the main support post 31 in position.

Abstract: An electrical test system is provided including a plurality of parallel probes made of a spring quality, wire-type conductive material having a diameter ranging between 0.001 and 0.050 inch. The probes are carried in a housing which moves them towards and away from an electronic component being tested. Each probe extends into a housing between the housing and the electronic component being tested, and each probe has a bend in its end which engages the housing wall and permits the housing to move the probe in and out of a conductive tubular member. Preferably, the tubular members are moved sideways as the housing is moved toward and away from the component being tested. The ends of the probes in the tubular member engage the side wall of these members to provide electrical contact.

Abstract: Disclosed is a test fixture which electrically tests units which have on-grid and off-grid test sites defined by holes. The central feature of this test fixture is the use of an array of flexible test probes which are arranged in an on-grid configuration. Each probe has a conical tip which is inserted into the hole, ahead at the end of a shaft which engages electrical test equipment, and a flexible shaft which connects the head to the tip. A table provides a generally flat surface which is moved in two directions in the same plane, generally at 90.degree. relative to each other. The unit being tested is placed on the surface of the table so that the test sites are presented to the probes and are aligned so that the test sites which are on-grid are in registration with the tips of the test probes. The probes and unit are brought into engagement with each other and the table is actuated. The probes tips slide freely over the surface of the unit being tested and, when they pass a hole, drop into it.

Abstract: An in-circuit test fixture for use in making a non-functional electrical inspection of individual components and/or circuit paths on a printed circuit board or wired backpanel assembly. The present in-circuit test fixture is cost effective and can be used when only small or moderate numbers of printed circuit boards have to be tested. The present test fixture eliminates the necessity for drilling holes in a support plate. Rather, a test head unit and a transition head unit are put together in modular fashion using assemblies which may be positioned in stacked arrays to provide a two-dimensional series of channels for support of pins to provide a test head for testing a two-dimensional product and to provide a two-dimensional series of channels for support of pins to provide a transition head for interconnection with an electronic circuit analyzer.

Abstract: In an in-circuit test fixture of the type including a bed of pins, first ends of which are adapted to contact a circuit board, means for supporting the pins, and means for making electrical connection thereto, there is disclosed an improvement wherein the pins are solid members and are freely slideable in the supporting means and wherein the test fixture includes a sheet of resilient material engaging second ends of all of the pins for providing the force necessary to urge the pins into contact with the circuit board. The means for supporting the pins includes a modular assembly which forms channels for the pins and eliminates the necessity for drilling holes in a board. The modular assembly includes a circuit board and a plurality of spring contacts for making electrical connection to the solid pins.