Patents by Inventor Jamie Sullivan
Jamie Sullivan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240027425Abstract: Provided are systems and methods for analyte detection and analysis. A system can comprise an open substrate configured to rotate. The open substrate can comprise an array of immobilized analytes. A solution comprising a plurality of probes may be directed, via centrifugal force, across the array during rotation of the substrate, to couple at least one of the plurality of probes with at least one of the analytes to form a bound probe. A detector can be configured to detect a signal from the bound probe via continuous rotational area scanning of the substrate.Type: ApplicationFiled: July 20, 2023Publication date: January 25, 2024Inventors: Kristopher BARBEE, Nathan BECKETT, Denis PRISTINSKI, Derek SCHULTE, Avishai BARTOV, Jamie SULLIVAN, Dumitru BRINZA, Abizar LAKDAWALLA, Steven MENCHEN, Gilad ALMOGY, Mark PRATT
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Patent number: 11747323Abstract: Provided are systems and methods for analyte detection and analysis. A system can comprise an open substrate configured to rotate. The open substrate can comprise an array of immobilized analytes. A solution comprising a plurality of probes may be directed, via centrifugal force, across the array during rotation of the substrate, to couple at least one of the plurality of probes with at least one of the analytes to form a bound probe. A detector can be configured to detect a signal from the bound probe via continuous rotational area scanning of the substrate.Type: GrantFiled: October 7, 2022Date of Patent: September 5, 2023Assignee: ULTIMA GENOMICS, INC.Inventors: Kristopher Barbee, Nathan Beckett, Denis Pristinski, Derek Schulte, Avishai Bartov, Jamie Sullivan, Dumitru Brinza, Abizar Lakdawalla, Steven Menchen, Gilad Almogy, Mark Pratt
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Publication number: 20230152300Abstract: Provided are systems and methods for analyte detection and analysis. A system can comprise an open substrate configured to rotate. The open substrate can comprise an array of immobilized analytes. A solution comprising a plurality of probes may be directed, via centrifugal force, across the array during rotation of the substrate, to couple at least one of the plurality of probes with at least one of the analytes to form a bound probe. A detector can be configured to detect a signal from the bound probe via continuous rotational area scanning of the substrate.Type: ApplicationFiled: October 7, 2022Publication date: May 18, 2023Inventors: Kristopher BARBEE, Nathan BECKETT, Denis PRISTINSKI, Derek SCHULTE, Avishai BARTOV, Jamie SULLIVAN, Dumitru BRINZA, Abizar LAKDAWALLA, Steven MENCHEN, Gilad ALMOGY, Mark PRATT
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Patent number: 11499962Abstract: Provided are systems and methods for analyte detection and analysis. A system can comprise an open substrate configured to rotate. The open substrate can comprise an array of immobilized analytes. A solution comprising a plurality of probes may be directed, via centrifugal force, across the array during rotation of the substrate, to couple at least one of the plurality of probes with at least one of the analytes to form a bound probe. A detector can be configured to detect a signal from the bound probe via continuous rotational area scanning of the substrate.Type: GrantFiled: April 29, 2020Date of Patent: November 15, 2022Assignee: ULTIMA GENOMICS, INC.Inventors: Kristopher Barbee, Nathan Beckett, Denis Pristinski, Derek Schulte, Avishai Bartov, Jamie Sullivan, Dumitru Brinza, Abizar Lakdawalla, Steven Menchen, Gilad Almogy, Mark Pratt
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Publication number: 20200326327Abstract: Provided are systems and methods for analyte detection and analysis. A system can comprise an open substrate configured to rotate. The open substrate can comprise an array of immobilized analytes. A solution comprising a plurality of probes may be directed, via centrifugal force, across the array during rotation of the substrate, to couple at least one of the plurality of probes with at least one of the analytes to form a bound probe. A detector can be configured to detect a signal from the bound probe via continuous rotational area scanning of the substrate.Type: ApplicationFiled: April 29, 2020Publication date: October 15, 2020Inventors: Kristopher BARBEE, Nathan BECKETT, Denis PRISTINSKI, Derek SCHULTE, Avishai BARTOV, Jamie SULLIVAN, Dumitru BRINZA, Abizar LAKDAWALLA, Steven MENCHEN, Gilad ALMOGY, Mark PRATT
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Patent number: 10344328Abstract: Provided are methods for biological sample processing and analysis. A method can comprise providing a substrate configured to rotate. The substrate can comprise an array having immobilized thereto a biological analyte. A solution comprising a plurality of probes may be directed, via centrifugal force, across the substrate during rotation of the substrate, to couple at least one of the plurality of probes with the biological analyte. A detector can be configured to detect a signal from the at least one probe coupled to the biological analyte, thereby analyzing the biological analyte.Type: GrantFiled: May 8, 2018Date of Patent: July 9, 2019Assignee: ULTIMA GENOMICS, INC.Inventors: Kristopher Barbee, Nathan Beckett, Denis Pristinski, Derek Schulte, Avishai Bartov, Jamie Sullivan, Dumitru Brinza, Abizar Lakdawalla, Steven Menchen, Gilad Almogy, Mark Pratt
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Publication number: 20190153531Abstract: Provided are methods for biological sample processing and analysis. A method can comprise providing a substrate configured to rotate. The substrate can comprise an array having immobilized thereto a biological analyte. A solution comprising a plurality of probes may be directed, via centrifugal force, across the substrate during rotation of the substrate, to couple at least one of the plurality of probes with the biological analyte. A detector can be configured to detect a signal from the at least one probe coupled to the biological analyte, thereby analyzing the biological analyte.Type: ApplicationFiled: May 8, 2018Publication date: May 23, 2019Inventors: Kristopher BARBEE, Nathan BECKETT, Denis PRISTINSKI, Derek SCHULTE, Avishai BARTOV, Jamie SULLIVAN, Dumitru BRINZA, Abizar LAKDAWALLA, Steven MENCHEN, Gilad ALMOGY, Mark PRATT
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Publication number: 20190153520Abstract: Provided are systems and methods for analyte detection and analysis. A system can comprise an open substrate configured to rotate. The open substrate can comprise an array of immobilized analytes. A solution comprising a plurality of probes may be directed, via centrifugal force, across the array during rotation of the substrate, to couple at least one of the plurality of probes with at least one of the analytes to form a bound probe. A detector can be configured to detect a signal from the bound probe via continuous rotational area scanning of the substrate.Type: ApplicationFiled: May 8, 2018Publication date: May 23, 2019Inventors: Kristopher BARBEE, Nathan BECKETT, Denis PRISTINSKI, Derek SCHULTE, Avishai BARTOV, Jamie SULLIVAN, Dumitru BRINZA, Abizar LAKDAWALLA, Steven MENCHEN, Gilad ALMOGY, Mark PRATT
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Patent number: 10273528Abstract: Provided are systems and methods for analyte detection and analysis. A system can comprise an open substrate configured to rotate. The open substrate can comprise an array of immobilized analytes. A solution comprising a plurality of probes may be directed, via centrifugal force, across the array during rotation of the substrate, to couple at least one of the plurality of probes with at least one of the analytes to form a bound probe. A detector can be configured to detect a signal from the bound probe via continuous rotational area scanning of the substrate.Type: GrantFiled: May 8, 2018Date of Patent: April 30, 2019Assignee: ULTIMA GENOMICS, INC.Inventors: Kristopher Barbee, Nathan Beckett, Denis Pristinski, Derek Schulte, Avishai Bartov, Jamie Sullivan, Dumitru Brinza, Abizar Lakdawalla, Steven Menchen, Gilad Almogy, Mark Pratt
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Patent number: 10267790Abstract: Provided are systems for biological sample processing and analysis. A system can comprise a substrate configured to rotate. The substrate can comprise an array configured to immobilize a biological analyte. A fluid flow unit comprising a fluid channel can be configured to dispense a solution comprising a plurality of probes. The solution may be directed, via centrifugal force, across the substrate during rotation of the substrate, to couple at least one of the plurality of probes with the biological analyte. A detector in optical communication with the array can be configured to detect one or more signals from the at least one probe coupled to the biological analyte.Type: GrantFiled: May 8, 2018Date of Patent: April 23, 2019Assignee: ULTIMA GENOMICS, INC.Inventors: Kristopher Barbee, Nathan Beckett, Denis Pristinski, Derek Schulte, Avishai Bartov, Jamie Sullivan, Dumitru Brinza, Abizar Lakdawalla, Steven Menchen, Gilad Almogy, Mark Pratt
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Patent number: 10060884Abstract: A method of scanning a sample includes simultaneously forming a plurality of co-linear scans. Each scan is formed by a sweep of a spot by an acousto-optical device (AOD). The co-linear scans are separated by a predetermined spacing. A first plurality of swaths are formed by repeating the simultaneous forming of the plurality of co-linear scans in a direction perpendicular to the co-linear scans. The first plurality of swaths have an inter-swath spacing that is the same as the predetermined spacing. The predetermined spacing can be a scan length or an integral number of scan lengths. A second plurality of swaths can be formed adjacent to the first plurality of swaths. Forming the second plurality of swaths can be performed in an opposite direction to that of the first plurality of swaths or in a same direction. An inspection system can implement this method by including a diffractive optical element (DOE) path after a magnification changer.Type: GrantFiled: June 16, 2016Date of Patent: August 28, 2018Assignee: KLA-Tencor CorporationInventors: Jamie Sullivan, Wenjian Cai, Yevgeniy Churin, Ralph Johnson, Meier Yitzhak Brender, Mark Shi Wang, Rex Runyon, Kai Cao
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Publication number: 20160290971Abstract: A method of scanning a sample includes simultaneously forming a plurality of co-linear scans. Each scan is formed by a sweep of a spot by an acousto-optical device (AOD). The co-linear scans are separated by a predetermined spacing. A first plurality of swaths are formed by repeating the simultaneous forming of the plurality of co-linear scans in a direction perpendicular to the co-linear scans. The first plurality of swaths have an inter-swath spacing that is the same as the predetermined spacing. The predetermined spacing can be a scan length or an integral number of scan lengths. A second plurality of swaths can be formed adjacent to the first plurality of swaths. Forming the second plurality of swaths can be performed in an opposite direction to that of the first plurality of swaths or in a same direction. An inspection system can implement this method by including a diffractive optical element (DOE) path after a magnification changer.Type: ApplicationFiled: June 16, 2016Publication date: October 6, 2016Inventors: Jamie Sullivan, Wenjian Cai, Yevgeniy Churin, Ralph Johnson, Meier Yitzhak Brender, Mark Shi Wang, Rex Runyon, Kai Cao
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Patent number: 9395340Abstract: A method of scanning a sample includes simultaneously forming a plurality of co-linear scans. Each scan is formed by a sweep of a spot by an acousto-optical device (AOD). The co-linear scans are separated by a predetermined spacing. A first plurality of swaths are formed by repeating the simultaneous forming of the plurality of co-linear scans in a direction perpendicular to the co-linear scans. The first plurality of swaths have an inter-swath spacing that is the same as the predetermined spacing. A second plurality of swaths can be formed adjacent to the first plurality of swaths. Forming the second plurality of swaths can be performed in an opposite direction to that of the first plurality of swaths or in a same direction. An inspection system can implement this method by including a diffractive optical element (DOE) path after a magnification changer.Type: GrantFiled: March 15, 2013Date of Patent: July 19, 2016Assignee: KLA-Tencor CorporationInventors: Jamie Sullivan, Wenjian Cai, Yevgeniy Churin, Ralph Johnson, Meier Yitzhak Brender, Mark Shi Wang, Rex Runyon, Kai Cao
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Patent number: 7535563Abstract: Systems configured to inspect a specimen are provided. One system includes an illumination subsystem configured to illuminate a two-dimensional field of view on the specimen. The system also includes a collection subsystem configured to collect light scattered from the specimen. In addition, the system includes an array of micro-mirrors configured to reflect a two-dimensional pattern of light diffracted from periodic structures on the specimen out of the optical path of the system without reflecting light across an entire dimension of the array out of the optical path. The system further includes a detection subsystem configured to generate output responsive to light reflected by the array into the optical path. The output can be used to detect defects on the specimen. In one embodiment, the system includes an optical element configured to increase the uniformity of the wavefront of the light reflected by the array into the optical path.Type: GrantFiled: August 15, 2006Date of Patent: May 19, 2009Assignee: KLA-Tencor Technologies CorporationInventors: Grace Hsiu-Ling Chen, Tao-Yi Fu, Jamie Sullivan, Shing Lee, Greg Kirk
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Patent number: 6922236Abstract: Systems and methods for inspecting a surface of a specimen such as a semiconductor wafer are provided. A system may include an illumination system configured to direct a first beam of light to a surface of the specimen at an oblique angle of incidence and to direct a second beam of light to a surface of the specimen at a substantially normal angle. The system may also include a collection system configured to collect at least a portion of the first and second beams of light returned from the surface of the specimen. In addition, the system may include a detection system. The detection system may be configured to process the collected portions of the first and second beams of light. In this manner, a presence of defects on the specimen may be detected from the collected portions of the first and second beams of light.Type: GrantFiled: July 10, 2002Date of Patent: July 26, 2005Assignee: KLA-Tencor Technologies Corp.Inventors: Mehdi Vaez-Iravani, Stan Stokowski, Steven Biellak, Jamie Sullivan, Keith Wells, Mehrdad Nikoonahad
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Publication number: 20050092899Abstract: Disclosed are methods and apparatus for detecting a relatively wide dynamic range of intensity values from a beam (e.g., scattered light, reflected light, or secondary electrons) originating from a sample, such as a semiconductor wafer. In other words, the inspection system provides detected output signals having wide dynamic ranges. The detected output signals may then be analyzed to determine whether defects are present on the sample. For example, the intensity values from a target die are compared to the intensity values from a corresponding portion of a reference die, where a significant intensity difference may be defined as a defect. In a specific embodiment, an inspection system for detecting defects on a sample is disclosed. The system includes a beam generator for directing an incident beam towards a sample surface and a detector positioned to detect a detected beam originating from the sample surface in response to the incident beam.Type: ApplicationFiled: November 18, 2004Publication date: May 5, 2005Inventors: Ralph Wolf, Eva Benitez, Dongsheng (Don) Chen, John Greene, Jamie Sullivan, Eric Vella, Khiem Vo
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Patent number: 6775051Abstract: Systems and methods for scanning a beam of light over a specimen are provided. A system may include a pre-scan acousto-optical deflector (AOD) configured to deflect a beam of light, a second AOD configured as a traveling lens to focus the scanning beam, a relay lens, and an objective lens. The relay lens may be centered on the scan line produced by the second AOD, while the objective lens may be substantially de-centered with respect to the relay lens to produce a telecentric scanning spot with no field tilt. The system may modulate the amplitude of the sound wave in the first AOD to compensate for attenuation in the second AOD. The system may pre-fill one chirp packet in the second AOD while another chirp packet is scanning to substantially reduce a delay between consecutive scans.Type: GrantFiled: May 3, 2002Date of Patent: August 10, 2004Assignee: KLA-Tencor TechnologiesInventors: Jamie Sullivan, Ralph Johnson, John Gibson, Mingguang Li, Eric Vella
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Publication number: 20030011760Abstract: Systems and methods for inspecting a surface of a specimen such as a semiconductor wafer are provided. A system may include an illumination system configured to direct a first beam of light to a surface of the specimen at an oblique angle of incidence and to direct a second beam of light to a surface of the specimen at a substantially normal angle. The system may also include a collection system configured to collect at least a portion of the first and second beams of light returned from the surface of the specimen. In addition, the system may include a detection system. The detection system may be configured to process the collected portions of the first and second beams of light. In this manner, a presence of defects on the specimen may be detected from the collected portions of the first and second beams of light.Type: ApplicationFiled: July 10, 2002Publication date: January 16, 2003Inventors: Mehdi Vaez-Iravani, Stan Stokowski, Stephen Biellak, Jamie Sullivan, Keith Wells, Mehrdad Nikoonahad
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Publication number: 20020181119Abstract: Systems and methods for scanning a beam of light over a specimen are provided. A system may include a pre-scan acousto-optical deflector (AOD) configured to deflect a beam of light, a second AOD configured as a traveling lens to focus the scanning beam, a relay lens, and an objective lens. The relay lens may be centered on the scan line produced by the second AOD, while the objective lens may be substantially de-centered with respect to the relay lens to produce a telecentric scanning spot with no field tilt. The system may modulate the amplitude of the sound wave in the first AOD to compensate for attenuation in the second AOD. The system may pre-fill one chirp packet in the second AOD while another chirp packet is scanning to substantially reduce a delay between consecutive scans.Type: ApplicationFiled: May 3, 2002Publication date: December 5, 2002Inventors: Jamie Sullivan, Ralph Johnson, John Gibson, Mingguang Li, Eric Vella