Abstract: A method, apparatus and product for hard error simulation and usage thereof. The method comprises obtaining a design of a circuit, which comprises one or more monitoring signals for identifying errors and one or more critical nodes; obtaining a trace of a run of a test of the circuit; and obtaining a hard error fault on a node. The method comprises determining a hard-error test coverage for the hard error fault, wherein the hard-error test coverage is indicative of whether or not the one or more monitoring signals identifies the hard error fault during an execution of the test, and wherein said determining comprises: simulating the execution of the circuit together with the hard error fault and noting whether or not any one or more of the one or more monitoring signals has detected the hard error fault. An indication of the hard-error test coverage may be outputted.

Abstract: A method, apparatus and product for hard error simulation and usage thereof. The method comprises obtaining a design of a circuit, which comprises one or more monitoring signals for identifying errors and one or more critical nodes; obtaining a trace of a run of a test of the circuit; and obtaining a hard error fault on a node. The method comprises determining a hard-error test coverage for the hard error fault, wherein the hard-error test coverage is indicative of whether or not the one or more monitoring signals identifies the hard error fault during an execution of the test, and wherein said determining comprises: simulating the execution of the circuit together with the hard error fault and noting whether or not any one or more of the one or more monitoring signals has detected the hard error fault. An indication of the hard-error test coverage may be outputted.

Abstract: A method, apparatus and product for hard error simulation and usage thereof. The method comprises obtaining a design of a circuit, which comprises one or more monitoring signals for identifying errors and one or more critical nodes; obtaining a trace of a run of a test of the circuit; and obtaining a hard error fault on a node. The method comprises determining a hard-error test coverage for the hard error fault, wherein the hard-error test coverage is indicative of whether or not the one or more monitoring signals identifies the hard error fault during an execution of the test, and wherein said determining comprises: simulating the execution of the circuit together with the hard error fault and noting whether or not any one or more of the one or more monitoring signals has detected the hard error fault. An indication of the hard-error test coverage may be outputted.

Abstract: A method, apparatus and product for hard error simulation and usage thereof. The method comprises obtaining a design of a circuit, which comprises one or more monitoring signals for identifying errors and one or more critical nodes; obtaining a trace of a run of a test of the circuit; and obtaining a hard error fault on a node. The method comprises determining a hard-error test coverage for the hard error fault, wherein the hard-error test coverage is indicative of whether or not the one or more monitoring signals identifies the hard error fault during an execution of the test, and wherein said determining comprises: simulating the execution of the circuit together with the hard error fault and noting whether or not any one or more of the one or more monitoring signals has detected the hard error fault. An indication of the hard-error test coverage may be outputted.

Abstract: A register transfer level (RTL) design is received which models a digital circuit in terms of the flow of digital signals. A power intent description is received which may include a description of power domains, identification of retention flops for each power domain, a list of isolation signals, and power switch definitions. A transformed RTL is produced accounting for functionality described in the power intent description. The transformed RTL includes flops designated as retention flops and non-retention flops. A retention flop module analyzes the flops to ensure that flops are properly designated as retention or non-retention flops. A verification module performs power aware sequential equivalence checking on various RTL and power intent descriptions to verify that RTL and power intent description outputs behave the same when accounting for power states.

Abstract: A register transfer level (RTL) design is received which models a digital circuit in terms of the flow of digital signals. A power intent description is received which may include a description of power domains, identification of retention flops for each power domain, a list of isolation signals, and power switch definitions. A transformed RTL is produced accounting for functionality described in the power intent description. The transformed RTL includes flops designated as retention flops and non-retention flops. A retention flop module analyzes the flops to ensure that flops are properly designated as retention or non-retention flops. A verification module performs power aware sequential equivalence checking on various RTL and power intent descriptions to verify that RTL and power intent description outputs behave the same when accounting for power states.