Patents by Inventor Jan Edward Vandemeer
Jan Edward Vandemeer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10804179Abstract: The present disclosure relates to a packaging process to enhance thermal and electrical performance of a wafer-level package. The wafer-level package with enhanced performance includes a first thinned die having a first device layer, a multilayer redistribution structure, a first mold compound, and a second mold compound. The multilayer redistribution structure includes package contacts on a bottom surface of the multilayer redistribution structure and redistribution interconnects connecting the first device layer to the package contacts. The first mold compound resides over the multilayer redistribution structure and around the first thinned die, and extends beyond a top surface of the first thinned die to define a cavity within the first mold compound and over the first thinned die. The second mold compound fills the cavity and is in contact with the top surface of the first thinned die.Type: GrantFiled: October 23, 2018Date of Patent: October 13, 2020Assignee: Qorvo US, Inc.Inventors: Julio C. Costa, Jan Edward Vandemeer, Jonathan Hale Hammond, Merrill Albert Hatcher, Jr., Jon Chadwick
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Patent number: 10759660Abstract: A method for processing product wafers using carrier substrates is disclosed. The method includes a step of bonding a first carrier wafer to a first product wafer using a first temporary adhesion layer between a first carrier wafer surface and a first product wafer first surface. Another step includes bonding a second carrier wafer to a second product wafer using a second temporary adhesion layer between a second carrier wafer surface and a second product wafer surface. Another step includes bonding the first product wafer to the second product wafer using a permanent bond between a first product wafer second surface and a second product wafer first surface. In exemplary embodiments, at least one processing step is performed on the first product wafer after the first temporary carrier wafer is bonded to the first product wafer before the second product wafer is permanently bonded to the first product wafer.Type: GrantFiled: May 13, 2015Date of Patent: September 1, 2020Assignee: Qorvo US, Inc.Inventors: Jonathan Hammond, Jan Edward Vandemeer, Julio Costa
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Patent number: 10679918Abstract: The present disclosure relates to a packaging process to enhance thermal and electrical performance of a wafer-level package. The wafer-level package with enhanced performance includes a first thinned die having a first device layer, a multilayer redistribution structure, a first mold compound, and a second mold compound. The multilayer redistribution structure includes package contacts on a bottom surface of the multilayer redistribution structure and redistribution interconnects connecting the first device layer to the package contacts. The first mold compound resides over the multilayer redistribution structure and around the first thinned die, and extends beyond a top surface of the first thinned die to define a cavity within the first mold compound and over the first thinned die. The second mold compound fills the cavity and is in contact with the top surface of the first thinned die.Type: GrantFiled: October 23, 2018Date of Patent: June 9, 2020Assignee: Qorvo US, Inc.Inventors: Julio C. Costa, Jan Edward Vandemeer, Jonathan Hale Hammond, Merrill Albert Hatcher, Jr., Jon Chadwick
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Patent number: 10636720Abstract: The present disclosure relates to a packaging process to enhance thermal and electrical performance of a wafer-level package. The wafer-level package with enhanced performance includes a first thinned die having a first device layer, a multilayer redistribution structure, a first mold compound, and a second mold compound. The multilayer redistribution structure includes package contacts on a bottom surface of the multilayer redistribution structure and redistribution interconnects connecting the first device layer to the package contacts. The first mold compound resides over the multilayer redistribution structure and around the first thinned die, and extends beyond a top surface of the first thinned die to define a cavity within the first mold compound and over the first thinned die. The second mold compound fills the cavity and is in contact with the top surface of the first thinned die.Type: GrantFiled: October 23, 2018Date of Patent: April 28, 2020Assignee: Qorvo US, Inc.Inventors: Julio C. Costa, Jan Edward Vandemeer, Jonathan Hale Hammond, Merrill Albert Hatcher, Jr., Jon Chadwick
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Patent number: 10600711Abstract: The present disclosure relates to a packaging process to enhance thermal and electrical performance of a wafer-level package. The wafer-level package with enhanced performance includes a first thinned die having a first device layer, a multilayer redistribution structure, a first mold compound, and a second mold compound. The multilayer redistribution structure includes package contacts on a bottom surface of the multilayer redistribution structure and redistribution interconnects connecting the first device layer to the package contacts. The first mold compound resides over the multilayer redistribution structure and around the first thinned die, and extends beyond a top surface of the first thinned die to define a cavity within the first mold compound and over the first thinned die. The second mold compound fills the cavity and is in contact with the top surface of the first thinned die.Type: GrantFiled: October 23, 2018Date of Patent: March 24, 2020Assignee: Qorvo US, Inc.Inventors: Julio C. Costa, Jan Edward Vandemeer, Jonathan Hale Hammond, Merrill Albert Hatcher, Jr., Jon Chadwick
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Patent number: 10529639Abstract: The present disclosure relates to a packaging process to enhance thermal and electrical performance of a wafer-level package. The wafer-level package with enhanced performance includes a first thinned die having a first device layer, a multilayer redistribution structure, a first mold compound, and a second mold compound. The multilayer redistribution structure includes package contacts on a bottom surface of the multilayer redistribution structure and redistribution interconnects connecting the first device layer to the package contacts. The first mold compound resides over the multilayer redistribution structure and around the first thinned die, and extends beyond a top surface of the first thinned die to define a cavity within the first mold compound and over the first thinned die. The second mold compound fills the cavity and is in contact with the top surface of the first thinned die.Type: GrantFiled: October 23, 2018Date of Patent: January 7, 2020Assignee: Qorvo US, Inc.Inventors: Julio C. Costa, Jan Edward Vandemeer, Jonathan Hale Hammond, Merrill Albert Hatcher, Jr., Jon Chadwick
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Patent number: 10486963Abstract: The present disclosure relates to a wafer-level package that includes a first thinned die, a multilayer redistribution structure, a first mold compound, and a second mold compound. The first thinned die resides over a top surface of the multilayer redistribution structure. The multilayer redistribution structure includes at least one support pad that is on a bottom surface of the multilayer redistribution structure and vertically aligned with the first thinned die. The first mold compound resides over the multilayer redistribution structure and around the first thinned die, and extends beyond a top surface of the first thinned die to define an opening within the first mold compound and over the first thinned die. The second mold compound fills the opening and is in contact with the top surface of the first thinned die.Type: GrantFiled: August 14, 2017Date of Patent: November 26, 2019Assignee: Qorvo US, Inc.Inventors: Merrill Albert Hatcher, Jr., Jonathan Hale Hammond, Jon Chadwick, Julio C. Costa, Jan Edward Vandemeer
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Patent number: 10486965Abstract: The present disclosure relates to a wafer-level package that includes a first thinned die, a multilayer redistribution structure, a first mold compound, and a second mold compound. The first thinned die includes a first device layer formed from glass materials. The multilayer redistribution structure includes redistribution interconnects that connect the first device layer to package contacts on a bottom surface of the multilayer redistribution structure. Herein, the connections between the redistribution interconnects and the first device layer are solder-free. The first mold compound resides over the multilayer redistribution structure and around the first thinned die, and extends beyond a top surface of the first thinned die to define an opening within the first mold compound and over the first thinned die. The second mold compound fills the opening and is in contact with the top surface of the first thinned die.Type: GrantFiled: August 14, 2017Date of Patent: November 26, 2019Assignee: Qorvo US, Inc.Inventors: Jan Edward Vandemeer, Jonathan Hale Hammond, Julio C. Costa
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Patent number: 10490476Abstract: The present disclosure relates to a packaging process to enhance thermal and electrical performance of a wafer-level package. The wafer-level package with enhanced performance includes a first thinned die having a first device layer, a multilayer redistribution structure, a first mold compound, and a second mold compound. The multilayer redistribution structure includes package contacts on a bottom surface of the multilayer redistribution structure and redistribution interconnects connecting the first device layer to the package contacts. The first mold compound resides over the multilayer redistribution structure and around the first thinned die, and extends beyond a top surface of the first thinned die to define a cavity within the first mold compound and over the first thinned die. The second mold compound fills the cavity and is in contact with the top surface of the first thinned die.Type: GrantFiled: October 23, 2018Date of Patent: November 26, 2019Assignee: Qorvo US, Inc.Inventors: Julio C. Costa, Jan Edward Vandemeer, Jonathan Hale Hammond, Merrill Albert Hatcher, Jr., Jon Chadwick
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Patent number: 10442684Abstract: The present disclosure relates to a wafer-level package that includes a first thinned die, a multilayer redistribution structure, a first mold compound, and a second mold compound. The first thinned die resides over a top surface of the multilayer redistribution structure. The multilayer redistribution structure includes at least one support pad that is on a bottom surface of the multilayer redistribution structure and vertically aligned with the first thinned die. The first mold compound resides over the multilayer redistribution structure and around the first thinned die, and extends beyond a top surface of the first thinned die to define an opening within the first mold compound and over the first thinned die. The second mold compound fills the opening and is in contact with the top surface of the first thinned die.Type: GrantFiled: August 14, 2017Date of Patent: October 15, 2019Assignee: Qorvo US, Inc.Inventors: Merrill Albert Hatcher, Jr., Jonathan Hale Hammond, Jon Chadwick, Julio C. Costa, Jan Edward Vandemeer
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Patent number: 10442687Abstract: The present disclosure relates to a wafer-level package that includes a first thinned die, a multilayer redistribution structure, a first mold compound, and a second mold compound. The first thinned die includes a first device layer formed from glass materials. The multilayer redistribution structure includes redistribution interconnects that connect the first device layer to package contacts on a bottom surface of the multilayer redistribution structure. Herein, the connections between the redistribution interconnects and the first device layer are solder-free. The first mold compound resides over the multilayer redistribution structure and around the first thinned die, and extends beyond a top surface of the first thinned die to define an opening within the first mold compound and over the first thinned die. The second mold compound fills the opening and is in contact with the top surface of the first thinned die.Type: GrantFiled: August 14, 2017Date of Patent: October 15, 2019Assignee: Qorvo US, Inc.Inventors: Jan Edward Vandemeer, Jonathan Hale Hammond, Julio C. Costa
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Patent number: 10407302Abstract: The present disclosure relates to a wafer-level package that includes a first thinned die, a multilayer redistribution structure, a first mold compound, and a second mold compound. The first thinned die includes a first device layer formed from glass materials. The multilayer redistribution structure includes redistribution interconnects that connect the first device layer to package contacts on a bottom surface of the multilayer redistribution structure. Herein, the connections between the redistribution interconnects and the first device layer are solder-free. The first mold compound resides over the multilayer redistribution structure and around the first thinned die, and extends beyond a top surface of the first thinned die to define an opening within the first mold compound and over the first thinned die. The second mold compound fills the opening and is in contact with the top surface of the first thinned die.Type: GrantFiled: August 14, 2017Date of Patent: September 10, 2019Assignee: Qorvo US, Inc.Inventors: Jan Edward Vandemeer, Jonathan Hale Hammond, Julio C. Costa
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Patent number: 10377627Abstract: The present disclosure relates to a wafer-level package that includes a first thinned die, a multilayer redistribution structure, a first mold compound, and a second mold compound. The first thinned die resides over a top surface of the multilayer redistribution structure. The multilayer redistribution structure includes at least one support pad that is on a bottom surface of the multilayer redistribution structure and vertically aligned with the first thinned die. The first mold compound resides over the multilayer redistribution structure and around the first thinned die, and extends beyond a top surface of the first thinned die to define an opening within the first mold compound and over the first thinned die. The second mold compound fills the opening and is in contact with the top surface of the first thinned die.Type: GrantFiled: August 14, 2017Date of Patent: August 13, 2019Assignee: Qorvo US, Inc.Inventors: Merrill Albert Hatcher, Jr., Jonathan Hale Hammond, Jon Chadwick, Julio C. Costa, Jan Edward Vandemeer
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Patent number: 10364146Abstract: The present disclosure relates to a wafer-level package that includes a first thinned die, a multilayer redistribution structure, a first mold compound, and a second mold compound. The first thinned die includes a first device layer formed from glass materials. The multilayer redistribution structure includes redistribution interconnects that connect the first device layer to package contacts on a bottom surface of the multilayer redistribution structure. Herein, the connections between the redistribution interconnects and the first device layer are solder-free. The first mold compound resides over the multilayer redistribution structure and around the first thinned die, and extends beyond a top surface of the first thinned die to define an opening within the first mold compound and over the first thinned die. The second mold compound fills the opening and is in contact with the top surface of the first thinned die.Type: GrantFiled: August 14, 2017Date of Patent: July 30, 2019Assignee: Qorvo US, Inc.Inventors: Jan Edward Vandemeer, Jonathan Hale Hammond, Julio C. Costa
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Patent number: 10239751Abstract: The present disclosure relates to a wafer-level package that includes a first thinned die, a multilayer redistribution structure, a first mold compound, and a second mold compound. The first thinned die includes a first device layer formed from glass materials. The multilayer redistribution structure includes redistribution interconnects that connect the first device layer to package contacts on a bottom surface of the multilayer redistribution structure. Herein, the connections between the redistribution interconnects and the first device layer are solder-free. The first mold compound resides over the multilayer redistribution structure and around the first thinned die, and extends beyond a top surface of the first thinned die to define an opening within the first mold compound and over the first thinned die. The second mold compound fills the opening and is in contact with the top surface of the first thinned die.Type: GrantFiled: August 14, 2017Date of Patent: March 26, 2019Assignee: Qorvo US, Inc.Inventors: Jan Edward Vandemeer, Jonathan Hale Hammond, Julio C. Costa
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Patent number: 10227231Abstract: The present disclosure relates to a wafer-level package that includes a first thinned die, a multilayer redistribution structure, a first mold compound, and a second mold compound. The first thinned die resides over a top surface of the multilayer redistribution structure. The multilayer redistribution structure includes at least one support pad that is on a bottom surface of the multilayer redistribution structure and vertically aligned with the first thinned die. The first mold compound resides over the multilayer redistribution structure and around the first thinned die, and extends beyond a top surface of the first thinned die to define an opening within the first mold compound and over the first thinned die. The second mold compound fills the opening and is in contact with the top surface of the first thinned die.Type: GrantFiled: August 14, 2017Date of Patent: March 12, 2019Assignee: Qorvo US, Inc.Inventors: Merrill Albert Hatcher, Jr., Jonathan Hale Hammond, Jon Chadwick, Julio C. Costa, Jan Edward Vandemeer
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Publication number: 20190057922Abstract: The present disclosure relates to a packaging process to enhance thermal and electrical performance of a wafer-level package. The wafer-level package with enhanced performance includes a first thinned die having a first device layer, a multilayer redistribution structure, a first mold compound, and a second mold compound. The multilayer redistribution structure includes package contacts on a bottom surface of the multilayer redistribution structure and redistribution interconnects connecting the first device layer to the package contacts. The first mold compound resides over the multilayer redistribution structure and around the first thinned die, and extends beyond a top surface of the first thinned die to define a cavity within the first mold compound and over the first thinned die. The second mold compound fills the cavity and is in contact with the top surface of the first thinned die.Type: ApplicationFiled: October 23, 2018Publication date: February 21, 2019Inventors: Julio C. Costa, Jan Edward Vandemeer, Jonathan Hale Hammond, Merrill Albert Hatcher, JR., Jon Chadwick
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Patent number: 10196260Abstract: The present disclosure relates to a wafer-level package that includes a first thinned die, a multilayer redistribution structure, a first mold compound, and a second mold compound. The first thinned die resides over a top surface of the multilayer redistribution structure. The multilayer redistribution structure includes at least one support pad that is on a bottom surface of the multilayer redistribution structure and vertically aligned with the first thinned die. The first mold compound resides over the multilayer redistribution structure and around the first thinned die, and extends beyond a top surface of the first thinned die to define an opening within the first mold compound and over the first thinned die. The second mold compound fills the opening and is in contact with the top surface of the first thinned die.Type: GrantFiled: August 14, 2017Date of Patent: February 5, 2019Assignee: Qorvo US, Inc.Inventors: Merrill Albert Hatcher, Jr., Jonathan Hale Hammond, Jon Chadwick, Julio C. Costa, Jan Edward Vandemeer
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Patent number: 10160643Abstract: The present disclosure relates to a wafer-level package that includes a first thinned die, a multilayer redistribution structure, a first mold compound, and a second mold compound. The first thinned die includes a first device layer formed from glass materials. The multilayer redistribution structure includes redistribution interconnects that connect the first device layer to package contacts on a bottom surface of the multilayer redistribution structure. Herein, the connections between the redistribution interconnects and the first device layer are solder-free. The first mold compound resides over the multilayer redistribution structure and around the first thinned die, and extends beyond a top surface of the first thinned die to define an opening within the first mold compound and over the first thinned die. The second mold compound fills the opening and is in contact with the top surface of the first thinned die.Type: GrantFiled: August 14, 2017Date of Patent: December 25, 2018Assignee: Qorvo US, Inc.Inventors: Jan Edward Vandemeer, Jonathan Hale Hammond, Julio C. Costa
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Patent number: 10155658Abstract: The present disclosure relates to a wafer-level package that includes a first thinned die, a multilayer redistribution structure, a first mold compound, and a second mold compound. The first thinned die resides over a top surface of the multilayer redistribution structure. The multilayer redistribution structure includes at least one support pad that is on a bottom surface of the multilayer redistribution structure and vertically aligned with the first thinned die. The first mold compound resides over the multilayer redistribution structure and around the first thinned die, and extends beyond a top surface of the first thinned die to define an opening within the first mold compound and over the first thinned die. The second mold compound fills the opening and is in contact with the top surface of the first thinned die.Type: GrantFiled: August 14, 2017Date of Patent: December 18, 2018Assignee: Qorvo US, Inc.Inventors: Merrill Albert Hatcher, Jr., Jonathan Hale Hammond, Jon Chadwick, Julio C. Costa, Jan Edward Vandemeer