Patents by Inventor Jan Zimpel

Jan Zimpel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7479395
    Abstract: The invention relates to a method for monitoring a manufacturing process, which by using a linear combination of measured variables with judiciously chosen weighting, produces a suitable (optimal) signal for determining each parameter. The extraction of the parameters from the measured variables is thus greatly simplified and in many cases becomes actually possible for the first time. According to the invention, large amounts of data may now be prepared, such that the crucial information (parameters) can be obtained from the data, almost in real time, or in real time.
    Type: Grant
    Filed: July 25, 2002
    Date of Patent: January 20, 2009
    Assignee: Infineon Technologies AG
    Inventors: Ferdinand Bell, Dirk Knobloch, Knut Voigtländer, Jan Zimpel
  • Publication number: 20030008507
    Abstract: The invention relates to a method for monitoring a manufacturing process, which by using a linear combination of measured variables with judiciously chosen weighting, produces a suitable (optimal) signal for determining each parameter. The extraction of the parameters from the measured variables is thus greatly simplified and in many cases becomes actually possible for the first time. According to the invention, large amounts of data may now be prepared, such that the crucial information (parameters) can be obtained from the data, almost in real time, or in real time.
    Type: Application
    Filed: July 25, 2002
    Publication date: January 9, 2003
    Inventors: Ferdinand Bell, Dirk Knobloch, Knut Voigtlander, Jan Zimpel