Abstract: The devices, methods, and systems of the present disclosure provide for spectroscopic super-resolution microscopic imaging. In some examples, spectroscopic super-resolution microscopic imaging may be referred to or comprise spectroscopic photon localization microscopy (SPLM), a method which may employ the use of extrinsic labels or tags in a test sample suitable for imaging. In some examples spectroscopic super-resolution microscopic or spectroscopic photon localization microscopy (SPLM) may not employ extrinsic labels and be performed using the intrinsic contrast of the test sample or test sample material. Generally, spectroscopic super-resolution microscopic imaging may comprise resolving one or more non-diffraction limited images of an area of a test sample by acquiring both localization information of a subset of molecules using microscopic methods known in the art, and simultaneously or substantially simultaneously, acquiring spectral data about the same or corresponding molecules in the subset.