Abstract: The described embodiments provide a configurable clock circuit. The clock circuit includes a control and enable circuit and a clock distribution circuit. During operation, when a signal on an enable input to the control and enable circuit is asserted and the control and enable circuit is configured in a clock mode, the control and enable circuit generates an enable signal on a control output to enable a signal on a clock input to propagate through the clock distribution circuit to the clock output. Alternatively, when a signal on the enable input to the control and enable circuit is asserted and the control and enable circuit is configured in a pulse mode, the control and enable circuit generates a pulsed control signal on the control output to control a length of a pulse generated from the clock input on a clock output by the clock distribution circuit.

Abstract: A flop circuit is disclosed. The flop circuit includes an input circuit configured to hold a logic value of an input signal received on its input node. The flop circuit further includes a storage circuit configured to, responsive to a pulse clock transitioning to a first logic level, receive and store the logic value and a complement of the logic value. A transfer circuit is coupled between the input circuit and the storage circuit, wherein the transfer circuit is configured to transfer the logic value from the input circuit to the storage circuit responsive to the pulse clock transitioning to the first logic level. The transfer circuit includes a first float node and a second float node and is configured such that at least one of the float nodes is floating during a portion of the operational cycle of the flop circuit.

Abstract: A flop circuit is disclosed. The flop circuit includes an input circuit configured to hold a logic value of an input signal received on its input node. The flop circuit further includes a storage circuit configured to, responsive to a pulse clock transitioning to a first logic level, receive and store the logic value and a complement of the logic value. A transfer circuit is coupled between the input circuit and the storage circuit, wherein the transfer circuit is configured to transfer the logic value from the input circuit to the storage circuit responsive to the pulse clock transitioning to the first logic level. The transfer circuit includes a first float node and a second float node and is configured such that at least one of the float nodes is floating during a portion of the operational cycle of the flop circuit.

Abstract: A SRAM (Static Random Access Memory) macro test flop circuit includes a flip-flop circuit, a scan control circuit, and an output buffer circuit. The flip-flop circuit includes a master latch circuit and a slave latch circuit. The master latch circuit includes a master feed-back circuit including a master storage node and a master feed-forward circuit. The slave latch circuit includes a slave feed-back circuit including a slave storage node and a slave feed-forward circuit driven from the master latch. The scan control circuit includes a scan slave feed-forward circuit, a scan latch circuit, and a scan driver circuit driven by the scan feed-back circuit. The scan latch circuit includes a scan feed-back circuit comprising a scan storage node and a scan feed-forward circuit driven from the slave latch. The output buffer circuit includes a master driver driven from master latch circuit and a slave driver driven from slave latch circuit.

Abstract: A latch circuit includes a feed-forward circuit, a keeper circuit, and a feed-back circuit. The feed-forward circuit includes a first-inverting-stage with a first input and a first output, wherein the first-inverting-stage comprises a first clocked device, and a second-inverting-stage with a second input and a second output, wherein the second-inverting-stage comprises a second clocked device, and a keeper circuit. The first output is operatively connected to the second input. The keeper circuit is operatively connected to the first output, and the keeper circuit is driven from the second output. The feed-back circuit includes a third-inverting-stage with a third input and a third output, wherein the third input is operatively connected to the second output, and a fourth-inverting-stage with a fourth input and a fourth output. The fourth input is operatively connected to the third output. The fourth output is connected to the third input to form a storage node.

Abstract: A SRAM (Static Random Access Memory) macro test flop circuit includes a flip-flop circuit, a scan control circuit, and an output buffer circuit. The flip-flop circuit includes a master latch circuit and a slave latch circuit. The master latch circuit includes a master feed-back circuit including a master storage node and a master feed-forward circuit. The slave latch circuit includes a slave feed-back circuit including a slave storage node and a slave feed-forward circuit driven from the master latch. The scan control circuit includes a scan slave feed-forward circuit, a scan latch circuit, and a scan driver circuit driven by the scan feed-back circuit. The scan latch circuit includes a scan feed-back circuit comprising a scan storage node and a scan feed-forward circuit driven from the slave latch. The output buffer circuit includes a master driver driven from master latch circuit and a slave driver driven from slave latch circuit.

Abstract: The described embodiments provide a configurable clock circuit. The clock circuit includes a control and enable circuit and a clock distribution circuit. During operation, when a signal on an enable input to the control and enable circuit is asserted and the control and enable circuit is configured in a clock mode, the control and enable circuit generates an enable signal on a control output to enable a signal on a clock input to propagate through the clock distribution circuit to the clock output. Alternatively, when a signal on the enable input to the control and enable circuit is asserted and the control and enable circuit is configured in a pulse mode, the control and enable circuit generates a pulsed control signal on the control output to control a length of a pulse generated from the clock input on a clock output by the clock distribution circuit.

Abstract: A D-latch circuit includes a feed forward circuit, a full keeper circuit, and an output buffer circuit. The feed forward circuit inputs a clock signal and a data signal. The feed forward circuit is connected to an input of the full keeper circuit. The feed forward circuit is connected to an output of the full keeper circuit and an input of the output buffer circuit. The output buffer circuit outputs an output signal. The D-latch consists of a single clocked device that switches with the clock signal.

Abstract: A latch circuit includes a feed-forward circuit, a keeper circuit, and a feed-back circuit. The feed-forward circuit includes a first-inverting-stage with a first input and a first output, wherein the first-inverting-stage comprises a first clocked device, and a second-inverting-stage with a second input and a second output, wherein the second-inverting-stage comprises a second clocked device, and a keeper circuit. The first output is operatively connected to the second input. The keeper circuit is operatively connected to the first output, and the keeper circuit is driven from the second output. The feed-back circuit includes a third-inverting-stage with a third input and a third output, wherein the third input is operatively connected to the second output, and a fourth-inverting-stage with a fourth input and a fourth output. The fourth input is operatively connected to the third output. The fourth output is connected to the third input to form a storage node.

Abstract: A clock generating circuit includes a source clock, a first clock generated from the source clock through a first header, a second clock generated from the source clock through a second header and an inverter, wherein the second clock is out of phase with respect to the first clock, a first delayed falling edge clock, wherein the first delayed falling edge clock corresponds to the first clock with a first delayed falling edge, and a second delayed falling edge clock, wherein the second delayed falling edge clock corresponds to the second clock with a second delayed falling edge. The first delayed falling edge clock is generated from a first leading edge path and a first falling edge path, both originating from the source clock, that are inputted to a first delay chain.

Abstract: A flip-flop or other state circuit that includes level-shifting functionality. In connection with a flip-flop, embodiments include an inverter circuit element that has a data input line as its input and a data complement line as its output. The inverter resides in voltage domain that is lower than the voltage domain associated with remainder of the flip-flop.

Abstract: A flip-flop or other state circuit that includes level-shifting functionality. In connection with a flip-flop, embodiments include an inverter circuit element that has a data input line as its input and a data complement line as its output. The inverter resides in voltage domain that is lower than the voltage domain associated with remainder of the flip-flop.

Abstract: A single-input/dual output sense amplifier includes cross-coupled transistors connected to a reference voltage; a first input transistor and a second input transistor connected to the cross-coupled transistors, wherein the first input transistor is coupled to a single input bit-line and the second input transistor is coupled to a reference voltage; an inverter receiving the input bit-line signal and outputting a complement of the input bit-line signal; a control circuit coupled to the second input transistor and receiving the complement of the input bit-line signal, wherein the cross-coupled transistors produce dual differential outputs.

Abstract: A non-blocking multiple-phase clocking system for use with domino-type dynamic logic provides clock phases with overlapping evaluation phases to a circuit including a several cascaded dynamic logic gates. The circuit also includes a first flip-flop that is coupled to provide input signal(s) to the first dynamic logic gate of the cascade and a second flip-flop that is coupled to receive output signal(s) from the last dynamic logic gate of the cascade. The clocking system provides a first clock phase to the first dynamic logic gate, a second clock phase to the second dynamic logic gate and so on. A timing analysis is performed of each logic path in the circuit to determine the arrival time of each critical input signals to each dynamic logic gate. The delay between adjacent clock phase is then predetermined so that each dynamic logic gate enters its evaluation phase before the critical input signal(s) to the particular dynamic logic gate arrives.

Abstract: A method for generating non-blocking multiple-phase clocking system for use with domino-type dynamic logic includes receiving a primary clock signal and generating several delayed phases of the received primary clock signal. The number of clock phases equals the number of dynamic logic gates in the circuit. The method provides a first clock phase to the first dynamic logic gate of the circuit, a second clock phase to the second dynamic logic gate and so on. A timing analysis is performed of each logic path in the circuit to determine the arrival time of each critical input signals to each dynamic logic gate. The delay between adjacent clock phase is then predetermined so that each dynamic logic gate enters its evaluation phase before the critical input signal(s) to the particular dynamic logic gate arrives. This adjustment of the clock phases maximizes the logic evaluation speed of the dynamic logic circuit.