Patents by Inventor Jay Jordan

Jay Jordan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240081664
    Abstract: Provided herein are devices, systems, and methods for assessing, treating, and for developing new treatments for pulmonary arterial hypertension (PAH) using pulmonary artery pressure (PAP) values and/or cardiac output (CO) estimates.
    Type: Application
    Filed: November 8, 2023
    Publication date: March 14, 2024
    Inventors: Jason White, Ralph Jordan, John Erik Moore, Jay Yadav
  • Publication number: 20210139269
    Abstract: An illustrated view of an exemplary retractable rope reel device for protecting a tiger tail or jetter hose of a jet truck and trailer mounted unit. The retractable rope reel device keeps the tiger tail in place and stops the jetter hose from dragging or scraping along an edge of a pipe or manhole and causing replacement or leaking of the jetter hose. The retractable rope reel device is useful for protecting users working on the jet truck and trailer from being in the road when retrieving a rope from a side cargo area of the jet truck and trailer. Further, the retractable rope reel device is useful for saving time and energy of the users from retrieving and returning the rope from the jet truck and trailer thus being more efficient and safer in the use of time and costs. The device has a canister with a retractable reel and a trigger on an inside of the canister. The trigger allows retraction of a rope that is coupled to the reel.
    Type: Application
    Filed: November 7, 2019
    Publication date: May 13, 2021
    Inventors: Jay Jordan, Steven Rech
  • Patent number: 7511282
    Abstract: Methods of extracting a TEM sample from a substrate include milling a hole on the sample and inserting a probe into the hole. The sample adheres to the probe, and can be processed on transferred while on the probe. In another embodiment, the sample is freed from a substrate and adheres to a probe by electrostatic attraction. The sample is placed onto a TEM sample holder in a vacuum chamber.
    Type: Grant
    Filed: May 25, 2006
    Date of Patent: March 31, 2009
    Assignee: FEI Company
    Inventors: Enrique Agorio, Michael Tanguay, Christophe Roudin, Liang Hong, Jay Jordan, Craig Henry, Mark Darus
  • Patent number: 7423263
    Abstract: A method and apparatus is described for orienting samples for charged particle beam operations. A sample is attached to a probe with a major surface of the sample at a non-normal angle to the probe shaft, and the probe shaft is rotated to reorient the sample. The invention is particularly useful for preparing planar view TEM samples. The invention allows for a sample to be mounted to a TEM grid and thinning by an ion beam without removing the grid from the vacuum chamber for reorienting. In one embodiment, a probe oriented at an angle, such as 45 degrees, to the sample stage has a probe tip with a flat area oriented parallel at 45 degrees to the probe axis, that is, the flat area is parallel to the sample stage. The flat area of the probe tip is attached to the sample, and when the probe is rotated 180 degrees, the orientation of the sample changes by 90 degrees, from horizontal to vertical. The sample can then be attached to a vertically oriented TEM grid on a sample stage.
    Type: Grant
    Filed: June 23, 2006
    Date of Patent: September 9, 2008
    Assignee: FEI Company
    Inventors: Liang Hong, Craig Henry, Jay Jordan, Young-Chung Wang
  • Publication number: 20080073535
    Abstract: A method and apparatus is described for orienting samples for charged particle beam operations. A sample is attached to a probe with a major surface of the sample at a non-normal angle to the probe shaft, and the probe shaft is rotated to reorient the sample. The invention is particularly useful for preparing planar view TEM samples. The invention allows for a sample to be mounted to a TEM grid and thinning by an ion beam without removing the grid from the vacuum chamber for reorienting. In one embodiment, a probe oriented at an angle, such as 45 degrees, to the sample stage has a probe tip with a flat area oriented parallel at 45 degrees to the probe axis, that is, the flat area is parallel to the sample stage. The flat area of the probe tip is attached to the sample, and when the probe is rotated 180 degrees, the orientation of the sample changes by 90 degrees, from horizontal to vertical. The sample can then be attached to a vertically oriented TEM grid on a sample stage.
    Type: Application
    Filed: June 23, 2006
    Publication date: March 27, 2008
    Inventors: Liang Hong, Craig Henry, Jay Jordan, Young-Chung Wang
  • Publication number: 20070272854
    Abstract: Methods of extracting a TEM sample from a substrate include milling a hole on the sample and inserting a probe into the hole. The sample adheres to the probe, and can be processed on transferred while on the probe. In another embodiment, the sample is freed from a substrate and adheres to a probe by electrostatic attraction. The sample is placed onto a TEM sample holder in a vacuum chamber.
    Type: Application
    Filed: May 25, 2006
    Publication date: November 29, 2007
    Inventors: Enrique Agorio, Michael Tanguay, Christophe Roudin, Liang Hong, Jay Jordan, Craig Henry, Mark Darus