Abstract: Disclosed is an apparatus including a datapath and a test circuit. The datapath is configured to transfer data between a memory core and an IO interface. The datapath includes a plurality of circuits, and a memory core interface. The plurality of circuits operates according to a supply voltage. The test circuit is coupled to the datapath, and configured to determine, from a set of operable voltage levels of the supply voltage, a first minimum operable voltage level for the datapath to operate for the data traversing the datapath at a first frequency.

Abstract: Disclosed is an apparatus including a datapath and a test circuit. The datapath is configured to transfer data between a memory core and an IO interface. The datapath includes a plurality of circuits, and a memory core interface. The plurality of circuits operates according to a supply voltage. The test circuit is coupled to the datapath, and configured to determine, from a set of operable voltage levels of the supply voltage, a first minimum operable voltage level for the datapath to operate for the data traversing the datapath at a first frequency.

Abstract: A temperature identification system may include temperature sensing circuitry and a temperature measurement module. The temperature sensing circuitry may include a ring oscillator that generates a ring oscillator output signal having a frequency that varies depending on an operating temperature on the ring oscillator. A frequency divider circuit may divide the frequency of the ring oscillator output signal such that two or more cycles of a noise component of supply voltage are averaged, which may reduce the impact that the noise has on the frequency of the ring oscillator output signal. In some embodiments, a regulator may supply a regulated voltage to the ring oscillator. The regulator may reduce the impact of the noise for low frequency components of the noise, while the frequency divider may reduce the impact for high frequency of the noise.

Abstract: Regulator circuitry may include a plurality of output circuits to generate a plurality of regulated output voltages. The regulator circuitry may include a single operational amplifier and a single feedback loop for regulation, which may reduce space and power consumed by the regulator circuitry. A transconductor and current mirror circuitry may be included to generate the plurality of regulated output voltages based a single operational amplifier output voltage generated with the single operational amplifier and feedback loop.

Abstract: A high output voltage VOH level and a low output voltage VOL level parametric test system may include test circuitry coupled to output nodes of input/output (I/O) driver circuits. The test circuitry may source and sink current to the output nodes while the I/O driver circuits are in pull down and pull up states, respectively, in order to generate output voltages on the output nodes. The parametric test system may compare the output voltages with a plurality of high and low reference levels to determine ranges of the output voltages. The ranges may be used to determine whether the I/O driver circuits pass the VOH and VOL test requirements. The VOH/VOL test system may be implemented on-chip with other components of the external device, which may eliminate the need to perform other parametric testing with external test equipment.

Abstract: Regulator circuitry may include a plurality of output circuits to generate a plurality of regulated output voltages. The regulator circuitry may include a single operational amplifier and a single feedback loop for regulation, which may reduce space and power consumed by the regulator circuitry. A transconductor and current mirror circuitry may be included to generate the plurality of regulated output voltages based a single operational amplifier output voltage generated with the single operational amplifier and feedback loop.

Abstract: A phase-locked loop (PLL) circuit may be configured to generate a plurality of oscillating signals based on a single control voltage generated based on a phase difference between an input signal and a feedback signal. One of the plurality of oscillating signals may be used to generate the feedback signal.

Abstract: An electronic device may receive a supply voltage from another external device, and detect when a level of the supply voltage drops below a threshold. In response, a controller of the electronic device may deactivate an interface configured for communication with the other electronic device. The controller may manage time periods and time period counters to determine when the check whether to reactivate the interface or conclude that the other external device is non-compliant.

Abstract: A high output voltage VOH level and a low output voltage VOL level parametric test system may include test circuitry coupled to output nodes of input/output (I/O) driver circuits. The test circuitry may source and sink current to the output nodes while the I/O driver circuits are in pull down and pull up states, respectively, in order to generate output voltages on the output nodes. The parametric test system may compare the output voltages with a plurality of high and low reference levels to determine ranges of the output voltages. The ranges may be used to determine whether the I/O driver circuits pass the VOH and VOL test requirements. The VOH/VOL test system may be implemented on-chip with other components of the external device, which may eliminate the need to perform other parametric testing with external test equipment.

Abstract: An electronic device may receive a supply voltage from another external device, and detect when a level of the supply voltage drops below a threshold. In response, a controller of the electronic device may deactivate an interface configured for communication with the other electronic device. The controller may manage time periods and time period counters to determine when the check whether to reactivate the interface or conclude that the other external device is non-compliant.

Abstract: A temperature identification system may include temperature sensing circuitry and a temperature measurement module. The temperature sensing circuitry may include a ring oscillator that generates a ring oscillator output signal having a frequency that varies depending on an operating temperature on the ring oscillator. A frequency divider circuit may divide the frequency of the ring oscillator output signal such that two or more cycles of a noise component of supply voltage are averaged, which may reduce the impact that the noise has on the frequency of the ring oscillator output signal. In some embodiments, a regulator may supply a regulated voltage to the ring oscillator. The regulator may reduce the impact of the noise for low frequency components of the noise, while the frequency divider may reduce the impact for high frequency of the noise.