Abstract: Methods and systems for circuit design are described. A tool may detect a timing violation on a signal path connected to a local clock buffer in a circuit model. The local clock buffer may be configured to generate a first clock signal having a first pulse width. The tool may determine a first metric associated with a first type of timing violation, and may determine a second metric associated with a second type of timing violation different from the first type of timing violation. The detected timing violation may be one of the first type and second type of timing violations. The tool may, based on the first metric and the second metric, determine whether to retain the generation of the first clock signal or to configure the local clock buffer to generate a second clock signal having a second pulse width different from the first pulse width.

Abstract: Methods and systems for circuit design are described. A tool may detect a timing violation on a signal path connected to a local clock buffer in a circuit model. The local clock buffer may be configured to generate a first clock signal having a first pulse width. The tool may determine a first metric associated with a first type of timing violation, and may determine a second metric associated with a second type of timing violation different from the first type of timing violation. The detected timing violation may be one of the first type and second type of timing violations. The tool may, based on the first metric and the second metric, determine whether to retain the generation of the first clock signal or to configure the local clock buffer to generate a second clock signal having a second pulse width different from the first pulse width.

Abstract: Aspects include performing integrated circuit design. A processor identifies a child block of an integrated circuit for placement of a buffer-bay to insert a buffer in a portion of the integrated circuit reserved for the child block. The buffer-bay is divided into a plurality of buffer-bay segments. Parent-level routing information and one or more boundary conditions are analyzed to determine a plurality of placement options for the buffer-bay segments. A best possible placement is selected from the plurality of placement options for the buffer-bay segments as a planned buffer-bay layout. A routing of the integrated circuit is performed based on the planned buffer-bay layout.

Abstract: Aspects include performing integrated circuit design. A processor identifies a child block of an integrated circuit for placement of a buffer-bay to insert a buffer in a portion of the integrated circuit reserved for the child block. The buffer-bay is divided into a plurality of buffer-bay segments. Parent-level routing information and one or more boundary conditions are analyzed to determine a plurality of placement options for the buffer-bay segments. A best possible placement is selected from the plurality of placement options for the buffer-bay segments as a planned buffer-bay layout. A routing of the integrated circuit is performed based on the planned buffer-bay layout.

Abstract: A method includes receiving a register-transfer-level description and a gate-level description for an integrated circuit design. The gate-level description includes one or more spare latches implemented as reconfigurable latch filler cells. The method further includes receiving an engineering change order, and, responsive to the engineering change order, adding the at least one additional latch to the register-transfer-level description and, for at least one of the at least one additional latch, selecting one of the one or more spare latches in the register-transfer-level description to yield a selected spare latch. The method further includes, for the selected spare latch, identifying a selected reconfigurable latch filler cell in the gate-level description and replacing the selected reconfigurable latch filler cell with an operational latch in the gate-level description. The method further includes finalizing the integrated circuit design.

Abstract: A method includes receiving a register-transfer-level description and a gate-level description for an integrated circuit design. The gate-level description includes one or more spare latches implemented as reconfigurable latch filler cells. The method further includes receiving an engineering change order, and, responsive to the engineering change order, adding the at least one additional latch to the register-transfer-level description and, for at least one of the at least one additional latch, selecting one of the one or more spare latches in the register-transfer-level description to yield a selected spare latch. The method further includes, for the selected spare latch, identifying a selected reconfigurable latch filler cell in the gate-level description and replacing the selected reconfigurable latch filler cell with an operational latch in the gate-level description. The method further includes finalizing the integrated circuit design.

Abstract: A method includes receiving a register-transfer-level description and a gate-level description for an integrated circuit design. The gate-level description includes one or more spare latches implemented as reconfigurable latch filler cells. The method further includes receiving an engineering change order, and, responsive to the engineering change order, adding the at least one additional latch to the register-transfer-level description and, for at least one of the at least one additional latch, selecting one of the one or more spare latches in the register-transfer-level description to yield a selected spare latch. The method further includes, for the selected spare latch, identifying a selected reconfigurable latch filler cell in the gate-level description and replacing the selected reconfigurable latch filler cell with an operational latch in the gate-level description. The method further includes finalizing the integrated circuit design.

Abstract: A computer-implemented method includes identifying an in initial register-transfer-level description for an integrated circuit design and adding one or more spare latches to the initial register-transfer-level description to yield a modified register-transfer-level description for the integrated circuit design. The computer-implemented method further includes performing placement and routing for the modified register-transfer-level description to yield a gate-level description for the integrated circuit design. The one or more spare latches exist in said gate-level description. The computer-implemented method further includes converting at least one of the one or more spare latches in the gate-level description into a reconfigurable latch filler cell to yield a modified gate-level description for the integrated circuit design and finalizing the integrated circuit design. A corresponding computer program product and computer system are also disclosed.

Abstract: A computer-implemented method includes identifying an in initial register-transfer-level description for an integrated circuit design and adding one or more spare latches to the initial register-transfer-level description to yield a modified register-transfer-level description for the integrated circuit design. The computer-implemented method further includes performing placement and routing for the modified register-transfer-level description to yield a gate-level description for the integrated circuit design. The one or more spare latches exist in said gate-level description. The computer-implemented method further includes converting at least one of the one or more spare latches in the gate-level description into a reconfigurable latch filler cell to yield a modified gate-level description for the integrated circuit design and finalizing the integrated circuit design. A corresponding computer program product and computer system are also disclosed.

Abstract: A method includes receiving a register-transfer-level description and a gate-level description for an integrated circuit design. The gate-level description includes one or more spare latches implemented as reconfigurable latch filler cells. The method further includes receiving an engineering change order, and, responsive to the engineering change order, adding the at least one additional latch to the register-transfer-level description and, for at least one of the at least one additional latch, selecting one of the one or more spare latches in the register-transfer-level description to yield a selected spare latch. The method further includes, for the selected spare latch, identifying a selected reconfigurable latch filler cell in the gate-level description and replacing the selected reconfigurable latch filler cell with an operational latch in the gate-level description. The method further includes finalizing the integrated circuit design.