Abstract: A method includes instantiating a simulation of an electronic design for a device under test (DUT) in hardware design language responsive to a user selection thereof. A subset of leaf nodes from a plurality of leaf nodes from the electronic design with input/output signaling of more than two values is identified. A hierarchical path for each leaf node of the plurality of leaf nodes of the electronic design for the DUT with respect to a testbench is calculated. A bypass module for the subset of leaf nodes is generated. The bypass module is generated in response to detecting presence of the subset of leaf nodes in the electronic design with input/output signaling of more than two values. The bypass module facilitates communication between the testbench and the subset of leaf nodes. Leaf nodes other than the subset of leaf nodes communicate with the testbench without communicating through the bypass module.

Abstract: An execution circuit inputs a plurality of data units, performs unit operations on the data units, and registers results of the unit operations in response to oscillations of a clock signal. A control circuit controls activation of the unit operations, and outputs a start signal to the execution circuit to activate each unit operation and/or a completion signal to indicate completion of each unit operation. A debug circuit stores breakpoint flags associated with the unit operations. Each breakpoint flag has a state that specifies whether to stop oscillations of the clock signal. The debug circuit further receives the start and/or completion signal and evaluates, while the clock signal oscillates to the execution circuit, a state of the start and/or completion signal and a state of the breakpoint flag associated with the unit operation. Oscillations of the clock signal are stopped in response to the evaluation of the signals.