Abstract: An equalizer circuit includes: a main stage circuit including: a main stage differential pair; and a main stage degeneration resistance; a replica stage circuit including: a replica stage differential pair matching the main stage differential pair; and a replica stage degeneration resistance matching the main stage degeneration resistance and disconnected from the replica stage differential pair; equalizer inputs connected to: gate electrodes of the main stage differential pair; and gate electrodes of the replica stage differential pair; and equalizer outputs connected to: a main stage positive output and a main stage negative output connected to drain electrodes of the main stage differential pair; and a replica stage positive output and a replica stage negative output connected to drain electrodes of the replica stage differential pair, the replica stage positive output connected to the main stage negative output and the replica stage negative output connected to the main stage positive output.

Abstract: An inductor structure includes a first inductor and a second inductor. A first portion of the first inductor is disposed on a first layer and a second portion of the first inductor is disposed on a second layer. A first portion of the second inductor is disposed on the first layer and a second portion of the second inductor is disposed on the second layer. The first portion of the first inductor and the second portion of the second inductor at least partially overlap. The second portion of the first inductor and the first portion of the second inductor at least partially overlap.

Abstract: A clock and data recovery (CDR) circuit includes first through ninth samplers, a clock recovery circuit, a level finding circuit, an offset voltage generator, and a data recovery circuit. Each of the first through ninth samplers samples a data signal based on one of first through ninth reference offset voltage levels to generate first through ninth intermediate signals, respectively. The clock recovery circuit generates the first through fourth clock signals based on the first, second, fifth, and eighth intermediate signals. The level finding circuit generates a band level signal by varying the third intermediate signal. The offset voltage generator generates one of: the fourth and seventh reference offset voltage levels, the fifth and eighth reference offset voltage levels, and the sixth and ninth reference offset voltage levels based on the band level signal. The data recovery circuit detects an output data signal based on the fourth through ninth intermediate signals.

Abstract: A high gain differential amplifier includes first through eighth transistors, first through third degeneration resistors, and first through third current sources. The fourth and fifth transistors form a p-type metal-oxide-semiconductor (PMOS) transistor pair. Further, the second and eighth transistors form a current mirror circuit. The PMOS transistor pair and the current mirror circuit form a common mode feedback circuit. The high gain differential amplifier controls the common-mode output voltage with the common mode feedback circuit and a reference voltage.

Abstract: A duty cycle correction (DCC) circuit includes first and second pluralities of logic gates, a low pass filter, an error amplifier, and a differential amplifier. The DCC circuit receives first and second clock signals from the VCO. The first and second pluralities of logic gates receive first and second superimposed clock signals and generate first and second output clock signals, respectively. The error amplifier rectifies a common error of the first and second output clock signals, and generates a common mode error voltage signal. The differential amplifier generates first and second error signals based on the common mode error voltage signal. The first and second error signals converge the duty cycles of the first and second output clock signals to a 50% duty cycle.

Abstract: A high gain differential amplifier includes first through eighth transistors, first through third degeneration resistors, and first through third current sources. The fourth and fifth transistors form a p-type metal-oxide-semiconductor (PMOS) transistor pair. Further, the second and eighth transistors form a current mirror circuit. The PMOS transistor pair and the current mirror circuit form a common mode feedback circuit. The high gain differential amplifier controls the common-mode output voltage with the common mode feedback circuit and a reference voltage.

Abstract: A clock and data recovery (CDR) circuit includes first through ninth samplers, a clock recovery circuit, a level finding circuit, an offset voltage generator, and a data recovery circuit. Each of the first through ninth samplers samples a data signal based on one of first through ninth reference offset voltage levels to generate first through ninth intermediate signals, respectively. The clock recovery circuit generates the first through fourth clock signals based on the first, second, fifth, and eighth intermediate signals. The level finding circuit generates a band level signal by varying the third intermediate signal. The offset voltage generator generates one of: the fourth and seventh reference offset voltage levels, the fifth and eighth reference offset voltage levels, and the sixth and ninth reference offset voltage levels based on the band level signal. The data recovery circuit detects an output data signal based on the fourth through ninth intermediate signals.

Abstract: A thin-oxide current clamp includes a clamp transistor in current-conducting relation between a voltage-sensitive circuit and a common return of a power supply, the clamp transistor responsive to a sense output signal to provide a low-resistance current flow path from the voltage-sensitive circuit to the common return and thereby clamp a voltage in the voltage-sensitive circuit. The thin-oxide current clamp also includes a current source and a reference current mirror, the reference current mirror providing a reference current. Further, the thin-oxide current clamp includes a sense current mirror providing a sense current. Further, the thin-oxide current clamp also includes an output transistor that receives the sense current and provides a current flow to a gate of the clamp transistors if the sense current exceeds the reference current.

Abstract: A thin-oxide current clamp includes a clamp transistor in current-conducting relation between a voltage-sensitive circuit and a common return of a power supply, the clamp transistor responsive to a sense output signal to provide a low-resistance current flow path from the voltage-sensitive circuit to the common return and thereby clamp a voltage in the voltage-sensitive circuit. The thin-oxide current clamp also includes a current source and a reference current minor, the reference current minor providing a reference current. Further, the thin-oxide current clamp includes a sense current mirror providing a sense current. Further, the thin-oxide current clamp also includes an output transistor that receives the sense current and provides a current flow to a gate of the clamp transistors if the sense current exceeds the reference current.