Abstract: A volatile memory including volatile memory cells adapted to the performing of data write and read operations. The memory cells are arranged in rows and in columns and, further, are distributed in separate groups of memory cells for each row. The memory includes a first memory cell selection circuit configured to perform write operations and a second memory cell selection circuit, different from the first circuit, configured to perform read operations. The first circuit is capable of selecting, for each row, memory cells from one of the group of memory cells for a write operation. The second circuit is capable of selecting, for each row, memory cells from one of the groups of memory cells for a read operation.

Abstract: At the bottom of a column (COLi) of memory cells (CEL) of the SRAM type with five portless transistors, there is placed an additional cell (CLS), with a structure identical to the cells (CEL), which makes it possible to write and read a datum in a memory cell (CEL) of the column without using a read amplifier.

Abstract: At the bottom of a column (COLi) of memory cells (CEL) of the SRAM type with five portless transistors, there is placed an additional cell (CLS), with a structure identical to the cells (CEL), which makes it possible to write and read a datum in a memory cell (CEL) of the column without using a read amplifier.

Abstract: A memory cell (1), includes a flip-flop (2) that has additional read/write terminals; a 1-bit write line (wb11); a first transistor (T4) switching between the 1-bit write line and the terminal, its gate being connected to a word selection line (W11); a 0-bit write line (wb10); a second transistor (T3) switching between the 0-bit write line and the terminal, its gate being connected to a word selection line (W12); a bit read line (b1r); and read transistors (T1, T2), with one of their gates being connected to a read/write terminal and the other being connected to a word selection line.

Abstract: A memory cell (1), includes: a flip-flop (2) that has additional read/write terminals; a 1-bit write line (wb11); a first transistor (T4) switching between the 1-bit write line and the terminal, its gate being connected to a word selection line (W11); a 0-bit write line (wb10); a second transistor (T3) switching between the 0-bit write line and the terminal, its gate being connected to a word selection line (W12); a bit read line (b1r); and read transistors (T1, T2), with one of their gates being connected to a read/write terminal and the other being connected to a word selection line. The invention particularly allows the surface area and complexity of a memory cell to be reduced.