Abstract: A method of determining a local electric field and/or a local magnetic field in a sample and/or the dielectric constant of a material and/or the angle between the input and output surfaces of the sample, comprising illumination of the sample by an electron beam in precession mode using an illumination device, generation of a diffraction pattern, determination of the offset of the disk corresponding to the transmitted beam due to the electric field and/or the magnetic field, by comparison of the diffraction pattern and a reference diffraction pattern, determination of a deflection angle of the transmitted beam, and determination of the value of the local electric field and/or the local magnetic field of the sample and/or determination of the dielectric constant of materials and/or determination of the angle between the input and output surfaces of the sample.

Abstract: Method of determining a local electric field and/or a local magnetic field in a sample and/or the dielectric constant of a material and/or the angle between the input and output surfaces of the sample, comprising the following steps: illumination of the sample by an electron beam in precession mode using an illumination device, generation of a diffraction pattern, determination of the offset of the disk corresponding to the transmitted beam due to the electric field and/or the magnetic field, by comparison of the diffraction pattern and a reference diffraction pattern, determination of a deflection angle of the transmitted beam, determination of the value of the local electric field and/or the local magnetic field of the sample and/or determination of the dielectric constant of materials and/or determination of the angle between the input and output surfaces of the sample.

Abstract: A method to facilitate positioning of diffraction spots in a diffraction pattern. This method comprises the following successive steps: a) obtaining a diffraction pattern by illuminating at least part of a sample comprising at least one periodic zone by an incident radiation beam that can be diffracted by said at least one periodic zone of the sample, and by placing a detector on the path of the beam thus diffracted; b) positioning of diffraction spots present on the diffraction pattern obtained in step a), by determining the spatial coordinates of these spots on the detector. Step b) is facilitated by the use of means in step a) to modify the shape and increase the contour length of diffraction spots forming on said pattern.

Abstract: The invention relates to a method for determining at least one mechanical parameter of at least one material in a composite system comprising at least two distinct phases, characterized in that it comprises: a) the production of at least one specimen comprising a first part of a first phase and a second part of a second phase, the second part consisting of the material to be characterized, the specimen having at least one dimension small enough to allow the strains in said specimen to be relaxed; b) the measurement, on said specimen, of at least one deformation parameter of at least said first phase, in correspondence with a plurality of points lying at different distances from an interface between said first and second phases; and c) the determination, from at least said deformation parameter, of at least one mechanical parameter of said second phase.