Abstract: A device may include a control circuit configured to place, after a normal mode operation of N flip-flops, the N flip-flops in a test mode in which the test input of the first flip-flop of the chain is intended to receive a first sequence of test bits A memory may be configured to store a sequence of N values delivered by the test output of the last flip-flop of the chain. The control circuit may be configured to deliver, at the test input of the first flip-flop of the chain, the sequence of N stored values to restore the state of the N flip-flops before their placement in the test mode.

Abstract: A device may include a control circuit configured to place, after a normal mode operation of N flip-flops, the N flip-flops in a test mode in which the test input of the first flip-flop of the chain is intended to receive a first sequence of test bits. A memory may be configured to store a sequence of N values delivered by the test output of the last flip-flop of the chain. The control circuit may be configured to deliver, at the test input of the first flip-flop of the chain, the sequence of N stored values to restore the state of the N flip-flops before their placement in the test mode.

Abstract: A method for managing operation of a logic component is provided, with the logic component including a majority vote circuit and an odd number of flip-flops equal to at least three. The method includes, following a normal operating mode of the logic component, placing a flip-flop in a test mode, and injecting a test signal into a test input of the flip-flop being tested while a logic state of the other flip-flops is frozen. A test signal output is analyzed. At the end of the test, the logic component is placed back in the normal operating mode. The majority vote circuit restores a value of the output signal from the logic component that existed prior to initiation of the test.

Abstract: A method for managing operation of a logic component is provided, with the logic component including a majority vote circuit and an odd number of flip-flops equal to at least three. The method includes, following a normal operating mode of the logic component, placing a flip-flop in a test mode, and injecting a test signal into a test input of the flip-flop being tested while a logic state of the other flip-flops is frozen. A test signal output is analyzed. At the end of the test, the logic component is placed back in the normal operating mode. The majority vote circuit restores a value of the output signal from the logic component that existed prior to initiation of the test.

Abstract: The determination of a reliability guideline of an electronic circuit having a nodal network of components including at least one reconvergence path between a correlation source and a sink, involves at the level of each component of the path, a computation of a conditional probability matrix whose conditioning is related to at least one node of the path situated upstream of the component.

Abstract: A digital signal processor is designed to execute variable-sized instructions that may include up to N elementary instruction codes. The processor comprises a memory program comprising I individually addressable, parallel-connected memory banks in which the codes of a program are recorded in an interlaced fashion, and a circuit for reading the program memory arranged to read a code in each of the I memory banks during a cycle for reading an instruction. A cycle for reading an instruction in the program memory includes reading a sequence of codes that includes the instruction code or codes to be read and can also include codes, belonging to a following instruction, that are filtered before the instruction is applied to execution units. The program memory of the digital signal processor does not include any no-operation type codes.

Abstract: A digital signal processor is designed to execute variable-sized instructions that may include up to N elementary instruction codes. The processor comprises a memory program comprising I individually addressable, parallel-connected memory banks in which the codes of a program are recorded in an interlaced fashion, and a circuit for reading the program memory arranged to read a code in each of the I memory banks during a cycle for reading an instruction. A cycle for reading an instruction in the program memory includes reading a sequence of codes that includes the instruction code or codes to be read and can also include codes, belonging to a following instruction, that are filtered before the instruction is applied to execution units. The program memory of the digital signal processor does not include any no-operation type codes.