Patents by Inventor Jeff W. Miller

Jeff W. Miller has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6504616
    Abstract: A method for calibrating tunable optical filters, calibrated tunable filters and devices employing such filters. The method is of particular use with fiber Fabry-Perot tunable filters and more particularly for filters which employ piezoelectric transducers as tuning elements. Sets of calibration coefficients are generated which span the wavelength region and operating temperature range of the filter. Calibrated tunable filters are combined with a means for storing the sets of calibration coefficients and means for correcting wavelength measurements using the sets of coefficients in devices which measure wavelengths of light. The sets of calibration coefficients can also be used to tune the filter to pass a selected wavelength of interest.
    Type: Grant
    Filed: August 7, 2000
    Date of Patent: January 7, 2003
    Assignee: Micron Optics, Inc.
    Inventors: Todd Haber, Kevin Hsu, Calvin M. Miller, Jeff W. Miller
  • Patent number: 6449047
    Abstract: Swept-wavelength lasers with accurately calibrated wavelength output which can be very rapidly scanned or swept over a selected wavelength band. The invention provides lasers that generate wavelengths in the 1550 nm range that can be swept over about 50 nm. These swept-wavelength lasers are generally useful as accurately calibrated high power light sources. Calibration is achieved by use of a calibrated reference system. Swept-wavelength lasers are particularly useful as components of sensor interrogator systems which determine wavelengths reflected (or transmitted) by Fiber Bragg Gratings (FBG) in sensor arrays. Swept wavelength lasers of this invention are also generally useful for testing of WDM systems, particularly for their applications to current communication systems. the invention provides lasers, interrogator systems and systems for testing WDM components employing the lasers as a calibrated light source.
    Type: Grant
    Filed: November 12, 1999
    Date of Patent: September 10, 2002
    Assignee: Micron Optics, Inc.
    Inventors: Yufei Bao, David Daugherty, Kevin Hsu, Tom Q. Y. Li, Calvin M. Miller, Jeff W. Miller