Patents by Inventor Jeffrey A. Umbach

Jeffrey A. Umbach has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9927404
    Abstract: A computer-implemented method for evaluating echo signals obtained from a phased array experiment on a billet is disclosed. The computer-implemented method may comprise collecting the echo signals from a pulser/receiver unit, correlating the echo signals with a position on a longitudinal axis and a circumferential angle of the billet, computing an amplitude for each of the echo signals, displaying the amplitudes as indications in a c-scan data plot at a computer display unit, and determining the signal-to-noise ratios of indications located in a region-of-interest box relative to noise in surrounding boxes in the c-scan data plot. The computer-implemented method may further comprise classifying each indication as rejectable, reportable, or insignificant based on its amplitude and signal-to-noise ratio. The computer-implemented method may find applications in quality control evaluations in the aircraft industry.
    Type: Grant
    Filed: December 16, 2013
    Date of Patent: March 27, 2018
    Assignee: UNITED TECHNOLOGIES CORPORATION
    Inventors: Wenji Peng, Jeffrey A Umbach, Kevin D Smith
  • Patent number: 9234878
    Abstract: An example component inspection method includes directing a wave from a curved array of transducer elements toward a component. The method forms the wave using focal law calculator software.
    Type: Grant
    Filed: January 19, 2012
    Date of Patent: January 12, 2016
    Assignee: United Technologies Corporation
    Inventors: Anton I. Lavrentyev, Jeffrey A. Umbach
  • Publication number: 20150355145
    Abstract: A computer-implemented method for evaluating echo signals obtained from a phased array experiment on a billet is disclosed. The computer-implemented method may comprise collecting the echo signals from a pulser/receiver unit, correlating the echo signals with a position on a longitudinal axis and a circumferential angle of the billet, computing an amplitude for each of the echo signals, displaying the amplitudes as indications in a c-scan data plot at a computer display unit, and determining the signal-to-noise ratios of indications located in a region-of-interest box relative to noise in surrounding boxes in the c-scan data plot. The computer-implemented method may further comprise classifying each indication as rejectable, reportable, or insignificant based on its amplitude and signal-to-noise ratio. The computer-implemented method may find applications in quality control evaluations in the aircraft industry.
    Type: Application
    Filed: December 16, 2013
    Publication date: December 10, 2015
    Applicant: UNITED TECHNOLOGIES CORPORATION
    Inventors: Wenji Peng, Jeffrey A. Umbach, Kevin D. Smith
  • Patent number: 9038473
    Abstract: A system is provided for inspecting a workpiece that includes a workpiece defect and a workpiece surface. The system includes a laser pointer connected to an ultrasonic inspection system. The ultrasonic inspection system includes an ultrasonic transducer that directs sound waves to the workpiece defect, where the sound waves contact the workpiece surface at a workpiece surface location. The laser pointer directs a laser beam against the workpiece surface to visually annunciate the workpiece surface location.
    Type: Grant
    Filed: December 22, 2011
    Date of Patent: May 26, 2015
    Assignee: United Technologies Corporation
    Inventors: Karl M. Gruca, Jr., Jeffrey A. Umbach
  • Patent number: 8750561
    Abstract: A method includes the steps of producing a first digital x-ray image of a part utilizing a full energy spectrum, producing a second digital x-ray image of the part with a hardened beam correlating to a higher energy portion of the full energy spectrum, subtracting the second x-ray image from the first x-ray image, and using a remainder of the subtracting step to locate the matter.
    Type: Grant
    Filed: February 29, 2012
    Date of Patent: June 10, 2014
    Assignee: United Technologies Corporation
    Inventors: Kevin D. Smith, Jeffrey A. Umbach
  • Publication number: 20130223672
    Abstract: A method includes the steps of producing a first digital x-ray image of a part utilizing a full energy spectrum, producing a second digital x-ray image of the part with a hardened beam correlating to a higher energy portion of the full energy spectrum, subtracting the second x-ray image from the first x-ray image, and using a remainder of the subtracting step to locate the matter.
    Type: Application
    Filed: February 29, 2012
    Publication date: August 29, 2013
    Inventors: Kevin D. Smith, Jeffrey A. Umbach
  • Publication number: 20130191042
    Abstract: An example component inspection method includes directing a wave from a curved array of transducer elements toward a component. The method forms the wave using focal law calculator software.
    Type: Application
    Filed: January 19, 2012
    Publication date: July 25, 2013
    Inventors: Anton I. Lavrentyev, Jeffrey A. Umbach
  • Publication number: 20130160553
    Abstract: A system is provided for inspecting a workpiece that includes a workpiece defect and a workpiece surface. The system includes a laser pointer connected to an ultrasonic inspection system. The ultrasonic inspection system includes an ultrasonic transducer that directs sound waves to the workpiece defect, where the sound waves contact the workpiece surface at a workpiece surface location. The laser pointer directs a laser beam against the workpiece surface to visually annunciate the workpiece surface location.
    Type: Application
    Filed: December 22, 2011
    Publication date: June 27, 2013
    Applicant: UNITED TECHNOLOGIES CORPORATION
    Inventors: Karl M. Gruca, JR., Jeffrey A. Umbach
  • Patent number: 7237438
    Abstract: Systems and methods for determining the velocity of ultrasonic surface skimming longitudinal waves on various materials are described herein. In embodiments, a surface skimming longitudinal wave is generated at a first location on a material, at least a portion of that wave is detected at a second location on the material, the time-of-flight of that wave between the first and second locations is determined, and then the velocity of that wave is determined. One or more crystallographic orientations of the material may then be determined based upon that velocity.
    Type: Grant
    Filed: March 16, 2005
    Date of Patent: July 3, 2007
    Assignee: United Technologies Corporation
    Inventors: Jeffrey A. Umbach, Kevin D. Smith, R. Bruce Thompson