Patents by Inventor Jeffrey Alan Ridley

Jeffrey Alan Ridley has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6808956
    Abstract: Methods for making thin silicon layers suspended over recesses in glass wafers or substrates are disclosed. The suspended silicon wafers can be thin and flat, and can be made using methods not requiring heavy doping or wet chemical etching of the silicon. Devices suitable for production using methods according to the invention include tuning forks, combs, beams, inertial devices, and gyroscopes. One embodiment of the present invention includes providing a thin silicon wafer, and a glass wafer or substrate. Recesses are formed in one surface of the glass wafer, and electrodes are formed in the recesses. The silicon wafer is then bonded to the glass wafer over the recesses. The silicon wafer is them etched to impart the desired suspended or silicon wafer structure. In another embodiment of the present invention, the silicon wafer has a patterned metal layer. The silicon wafer is bonded to the glass wafer, with the patterned metal layer positioned adjacent the recesses in the glass wafer.
    Type: Grant
    Filed: December 27, 2000
    Date of Patent: October 26, 2004
    Assignee: Honeywell International Inc.
    Inventors: Cleopatra Cabuz, Jeffrey Alan Ridley
  • Patent number: 6582985
    Abstract: Methods for making thin silicon layers suspended over recesses in glass wafers. One method includes providing a thin silicon-on-insulator (SOI) wafer, and a glass wafer. The SOI wafer can include a silicon oxide layer disposed between a first undoped or substantially undoped silicon layer and a second silicon layer. Recesses can be formed in the glass wafer surface and electrodes may be formed on the glass wafer surface. The first silicon layer of the SOI wafer is then bonded to the glass wafer surface having the recesses, and the second silicon layer is subsequently removed using the silicon oxide layer as an etch stop. Next, the silicon oxide layer is removed. The first silicon layer can then be etched to form the desired structure. In another illustrative embodiment, the first silicon layer has a patterned metal layer thereon. The SOI wafer is bonded to the glass wafer, with the patterned metal layer positioned adjacent the recesses in the glass wafer.
    Type: Grant
    Filed: December 27, 2000
    Date of Patent: June 24, 2003
    Assignee: Honeywell International Inc.
    Inventors: Cleopatra Cabuz, Jeffrey Alan Ridley
  • Publication number: 20020081765
    Abstract: Methods for making thin silicon layers suspended over recesses in glass wafers or substrates are disclosed. The suspended silicon wafers can be thin and flat, and can be made using methods not requiring heavy doping or wet chemical etching of the silicon. Devices suitable for production using methods according to the invention include tuning forks, combs, beams, inertial devices, and gyroscopes. One embodiment of the present invention includes providing a thin silicon wafer, and a glass wafer or substrate. Recesses are formed in one surface of the glass wafer, and electrodes are formed in the recesses. The silicon wafer is then bonded to the glass wafer over the recesses. The silicon wafer is them etched to impart the desired suspended or silicon wafer structure. In another embodiment of the present invention, the silicon wafer has a patterned metal layer. The silicon wafer is bonded to the glass wafer, with the patterned metal layer positioned adjacent the recesses in the glass wafer.
    Type: Application
    Filed: December 27, 2000
    Publication date: June 27, 2002
    Inventors: Cleopatra Cabuz, Jeffrey Alan Ridley
  • Publication number: 20020081821
    Abstract: Methods for making thin silicon layers suspended over recesses in glass wafers. One method includes providing a thin silicon-on-insulator (SOI) wafer, and a glass wafer. The SOI wafer can include a silicon oxide layer disposed between a first undoped or substantially undoped silicon layer and a second silicon layer. Recesses can be formed in the glass wafer surface and electrodes may be formed on the glass wafer surface. The first silicon layer of the SOI wafer is then bonded to the glass wafer surface having the recesses, and the second silicon layer is subsequently removed using the silicon oxide layer as an etch stop. Next, the silicon oxide layer is removed. The first silicon layer can then be etched to form the desired structure. In another illustrative embodiment, the first silicon layer has a patterned metal layer thereon. The SOI wafer is bonded to the glass wafer, with the patterned metal layer positioned adjacent the recesses in the glass wafer.
    Type: Application
    Filed: December 27, 2000
    Publication date: June 27, 2002
    Inventors: Cleopatra Cabuz, Jeffrey Alan Ridley