Patents by Inventor Jeffrey J. Persoff

Jeffrey J. Persoff has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20090125005
    Abstract: The present invention comprises a closed loop system and method for assessing a performance of a refractive surgical system that is capable of correcting lower and higher order aberrations of the eye. In one embodiment, the refractor surgical system comprises a corneal re-shaping laser system and a refractor system that is capable of measuring low and higher order aberrations of the eye. A software application is capable of transforming the measurements of the refractor system to a treatment plan to control and guide the corneal re-shaping laser system. The systems and methods of the present invention may include a lens that is created by the corneal reshaping laser system and can be measured by the refractor system.
    Type: Application
    Filed: January 14, 2009
    Publication date: May 14, 2009
    Applicant: AMO Manufacturing USA, LLC
    Inventors: Dimitri Chernyak, Charles Campbell, Jeffrey J. Persoff
  • Patent number: 7355695
    Abstract: A wavefront sensor enhances calibration of a laser ablation system, such as a laser eye surgery system, by measuring one or more characteristics of an ablated test surface. Typically, light is passed through the ablated test surface, and the light is analyzed to determine the test surface characteristics. In some embodiments, the ablated test surface is positioned along a treatment plane. In some embodiments, light is passed through a wavefront sensor, such as a Hartmann-Shack sensor, to convert the light into electrical signals. A processor then converts the electrical signals into data, such as surface maps showing high-order aberrations and/or artifacts on the test surface, refractive power measurements, shape measurements, and the like. Generated data may then be used to calibrate a laser surgery system.
    Type: Grant
    Filed: March 12, 2004
    Date of Patent: April 8, 2008
    Assignee: AMO Manufacturing USA, LLC
    Inventors: Junzhong Liang, Dimitri Chernyak, Kingman Yee, Seema Somani, Jeffrey J. Persoff, Walter Huff, Charles Campbell, Charles R. Munnerlyn, Brian Bliven
  • Patent number: 7040759
    Abstract: Apparatus and methods can determine positional and rotational offsets between a first and second imaging device. Embodiments may determine the relative offsets between a Hartmann-Shack wavefront sensor and a pupil camera using a calibration apparatus having a rotationally asymmetric aperture. The image obtained by the Hartmann-Shack wavefront sensor way comprise a spot pattern that corresponds to a shape of the aperture. A marker may be superimposed over the images, with a shape of the marker substantially corresponding to the shape of the aperture, and movements of the marker from nominal positions on each image can be compared to determine the offsets.
    Type: Grant
    Filed: February 11, 2003
    Date of Patent: May 9, 2006
    Assignee: VISX, Incorporated
    Inventors: Dimitri Chernyak, Jeffrey J. Persoff
  • Publication number: 20040260275
    Abstract: A wavefront sensor enhances calibration of a laser ablation system, such as a laser eye surgery system, by measuring one or more characteristics of an ablated test surface. Typically, light is passed through the ablated test surface, and the light is analyzed to determine the test surface characteristics. In some embodiments, the ablated test surface is positioned along a treatment plane. In some embodiments, light is passed through a wavefront sensor, such as a Hartmann-Shack sensor, to convert the light into electrical signals. A processor then converts the electrical signals into data, such as surface maps showing high-order aberrations and/or artifacts on the test surface, refractive power measurements, shape measurements, and the like. Generated data may then be used to calibrate a laser surgery system.
    Type: Application
    Filed: March 12, 2004
    Publication date: December 23, 2004
    Applicant: VISX, INCORPORATED
    Inventors: Junzhong Liang, Dimitri Chernyak, Kingman Yee, Seema Somani, Jeffrey J. Persoff, Walter Huff, Charles Campbell, Charles R. Munnerlyn, Brian Bliven
  • Publication number: 20030225399
    Abstract: The present invention comprises a closed loop system and method for assessing a performance of a refractive surgical system that is capable of correcting lower and higher order aberrations of the eye. In one embodiment, the refractor surgical system comprises a corneal re-shaping laser system and a refractor system that is capable of measuring low and higher order aberrations of the eye. A software application is capable of transforming the measurements of the refractor system to a treatment plan to control and guide the corneal re-shaping laser system. The systems and methods of the present invention may include a lens that is created by the corneal reshaping laser system and can be measured by the refractor system.
    Type: Application
    Filed: February 11, 2003
    Publication date: December 4, 2003
    Applicant: VISX, Inc.
    Inventors: Dimitri Chernyak, Charles Campbell, Jeffrey J. Persoff
  • Publication number: 20030151720
    Abstract: The present invention provides an apparatus and method for determining a relative positional and rotational offsets between a first and second imaging device. In exemplary embodiments, the present invention may be used to determine the relative offsets between a Hartmann-Shack wavefront sensor and a pupil camera.
    Type: Application
    Filed: February 11, 2003
    Publication date: August 14, 2003
    Applicant: VISX, Inc.
    Inventors: Dimitri Chernyak, Jeffrey J. Persoff