Abstract: Mass spectrometry is performed utilizing an electron ionization (EI) source. The EI source ionizes a sample at different electron energies, including below and above 70 eV. The EI source may be utilized for soft ionization as well as hard ionization. The value of the electron energy may be selected so as to favor the formation of molecular ions or other ions of high analytical value. The ion source may be an axial ion source.

Abstract: An ion source is configured for electron ionization and produces coaxial electron and ion beams. The ion source includes an ionization chamber along an axis, a magnet assembly configured for generating an axial magnetic field in the ionization chamber, an electron source, and a lens assembly configured for directing the ion beam out from the ionization chamber along the axis, reflecting the electron beam back toward the electron source, and transmitting higher energy ions out from the ion source while reflecting lower energy ions toward a lens element for neutralization.

Abstract: An ion source is configured for electron ionization and produces coaxial electron and ion beams. The ion source includes an ionization chamber along an axis, a magnet assembly configured for generating an axial magnetic field in the ionization chamber, an electron source, and a lens assembly configured for directing the ion beam out from the ionization chamber along the axis, reflecting the electron beam back toward the electron source, and transmitting higher energy ions out from the ion source while reflecting lower energy ions toward a lens element for neutralization.

Abstract: Mass spectrometry is performed utilizing an electron ionization (EI) source. The EI source ionizes a sample at different electron energies, including below and above 70 eV. The EI source may be utilized for soft ionization as well as hard ionization. The value of the electron energy may be selected so as to favor the formation of molecular ions or other ions of high analytical value. The ion source may be an axial ion source.

Abstract: The invention pertains to methods and apparatus for performing mass spectrometry with reduced noise. In some embodiments, an additional amount of a carrier gas is introduced into a mass spectrometer to reduce the noise.

Abstract: A system includes a vacuum manifold for a mass spectrometer. The vacuum manifold defines an orifice. A vacuum valve is joined to the manifold at the orifice. A load-lock adapter is joined to the vacuum valve. A transfer line may be introduced to the mass spectrometer and withdrawn therefrom via the vacuum valve and load-lock adapter without substantially disturbing the operating environment of the mass spectrometer.

Abstract: A device for manipulating ions which includes a perforated folder of electrically conductive material, a first electrode fixed to the holder and a second electrode extending parallel to the first electrode and spaced from the first electrode and holder. The second electrode is connected to the holder through a rigid support of electrically insulated material.

Abstract: A device for manipulating ions which includes a perforated folder of electrically conducted material, a first electrode fixed to the holder and a second electrode extending parallel to the first electrode and spaced from the first electrode and holder. The second electrode is connected to the holder through a rigid support of electrically insulated material.

Abstract: A device for manipulating ions which includes a perforated folder of electrically conducted material, a first electrode fixed to the holder and a second electrode extending parallel to the first electrode and spaced from the first electrode and holder. The second electrode is connected to the holder through a rigid support of electrically insulated material.

Abstract: An apparatus and method for removing neutral noise from a quadrupole mass filter ion beam. A mask plate has a lobed aperture centered on a longitudinal axis and positioned between a quadrupole mass filter exit end and an ion detector. The mask plate operates to remove neutral atoms from the ion beam that may interfere with instrument sensitivities. The lobed aperture passes the ion beam with little loss of the ion beam intensity. The invention substantially maintains signal intensity and removes unwanted noise from a mass spectrometer.

Abstract: A device for manipulating ions which includes a perforated folder of electrically conducted material, a first electrode fixed to the holder and a second electrode extending parallel to the first electrode and spaced from the first electrode and holder. The second electrode is connected to the holder through a rigid support of electrically insulated material.

Abstract: The present invention relates to a mass spectrometer that includes an ionization source having a chamber for ionizing a fluid sample. The ionization chamber has surfaces to reduce the overall interaction with reactive samples. The inner surface walls of the ionization chamber may be formed from an inorganic conductive nitride or disulfide material or may be applied to a substrate as a coating. The invention also includes a method for reducing the interaction of a reactive analyte with the inner wall of the chamber by application or coating the inner wall of the chamber with an inert conductive material.

Abstract: An apparatus and method for removing neutral noise from a quadrupole mass filter ion beam. A mask plate has a lobed aperture centered on a longitudinal axis and positioned between a quadrupole mass filter exit end and an ion detector. The mask plate operates to remove neutral atoms from the ion beam that may interfere with instrument sensitivities. The lobed aperture passes the ion beam with little loss of the ion beam intensity. The invention substantially maintains signal intensity and removes unwanted noise from a mass spectrometer.

Abstract: An apparatus and method for removing neutral noise from a quadrupole mass filter ion beam. A mask plate has a lobed aperture centered on a longitudinal axis and positioned between a quadrupole mass filter exit end and an ion detector. The mask plate operates to remove neutral atoms from the ion beam that may interfere with instrument sensitivities. The lobed aperture passes the ion beam with little loss of the ion beam intensity. The invention substantially maintains signal intensity and removes unwanted noise from a mass spectrometer.

Abstract: A quadrupole electrode assembly for a mass spectrometer and a method for forming the electrode assembly are provided. The quadrupole electrode assembly is comprised of an elongate outer tube, having an internal surface and an external surface wherein the outer tube is the outermost structure of the electrode assembly and supports a vacuum, and an electrode structure fused to the internal surface of the outer tube. Typically, there are four electrodes where each electrode includes an arced region having a conductive surface. The arced regions of the electrodes are aligned in parallel opposing pairs equidistant from a central axis. The four electrode structures can be four cylindrical glass tubes where the curvature of the arced region approximates a hyperbola. At least a portion of the surface of the arced region is a conductive region typically formed by applying a metal coating to the surface of the glass tube.

Abstract: The present invention provides a method and apparatus for formation of a quadrupole electrode assembly for a mass spectrometer. The quadrupole electrode assembly is comprised of an outer elongate tube having an internal and external surface where the outer elongate tube as the outermost structure may be used for supporting a vacuum and an electrode structure fused to the internal surface of the outer elongate tube. Typically there are four electrodes where each electrode includes an arced region having a conductive surface where the arcs are aligned in parallel opposing pairs equidistant from a central axis. In the preferred embodiment, the four electrode structures are four cylindrical glass tubes where the curvature of the arc approximates a hyperbola. At least a portion of the surface of the arc is a conductive region typically formed by applying a metal coating to the surface of the glass tube.

Abstract: Multipole technology is used generally for charged particle optics which includes separating, focusing, or collimating "charged particles" (i.e., ions, electrons, etc.). A primary application of multipole technology is mass filters and particularly quadrupole mass filters. A quadrupole mass filter has a quadrupole substrate having four poles, each having a generally hyperbolic cross section, and interconnected by bridges. The bridges have apertures that facilitate the construction of poles inside the quadrupole substrate and prevent the build-up of unwanted charge. A plating substrate for electroplating is bonded to each pole substrate with a thin-film adhesion layer. Poles are electroplated upon these plating substrates. A diffusion barrier layer prevents the portions of the plating substrates from migrating to the quadrupole substrate where they would undermine the thin-film adhesion layer.