Abstract: In some embodiments, provided are AFC circuits and methods for calibrating a second setting of an oscillator while a first setting is controlled by a temperature compensated control.

Abstract: In some embodiments, provided are AFC circuits and methods for calibrating a second setting of an oscillator while a first setting is controlled by a temperature compensated control.

Abstract: In some embodiments, provided are AFC circuits and methods for calibrating a second setting of an oscillator while a first setting is controlled by a temperature compensated control.

Abstract: A circuit has a master latch having an input for receiving an input data signal, and an output. A slave latch has a first input coupled to the output of the master latch, and an output for providing an output data signal. A non-volatile storage element stores a predetermined value. The non-volatile storage element has an output coupled to the first input of the slave latch. The output data signal corresponds to one of either the input data signal or the predetermined value stored by the non-volatile storage element in response to a control signal.

Abstract: A circuit has a master latch having an input for receiving an input data signal, and an output. A slave latch has a first input coupled to the output of the master latch, and an output for providing an output data signal. A non-volatile storage element stores a predetermined value. The non-volatile storage element has an output coupled to the first input of the slave latch. The output data signal corresponds to one of either the input data signal or the predetermined value stored by the non-volatile storage element in response to a control signal.

Abstract: A device having an OTP memory is disclosed. A program state of the OTP device is stored at a fuse that is connected in series between a first node and a latch. During a program mode, the first node is electrically connected to a program voltage. During a read mode, the first node is electrically connected to ground, whereby a first divided voltage is generated at a first node of the latch.

Abstract: A circuit according to some embodiments of the invention includes a first differential to single ended translator having a first output, a second differential to single ended translator having a second output, and a latch coupled to the first output and the second output, where the latch is configured to select the slower of the first output and the second output.

Abstract: An apparatus comprising one or more input/output circuits that may be configured as (i) high voltage tolerant in response to a first state of a control input and (ii) a clamp to a power supply voltage in response to a second state of said control input.

Abstract: A circuit and method comprising a memory, a first latch, a second latch and a control circuit. The memory may be configured to write information in response to (i) an input data signal and (ii) an address signal. The first latch may be configured to hold the address in response to a control signal. The second latch may be configured to hold the data input signal in response to the control signal. The control circuit may be configured to present the control signal in response to (i) an enable signal and (ii) a detect signal.

Abstract: A circuit and method comprising a memory, a first latch, a second latch and a control circuit. The memory may be configured to write information in response to (i) an input data signal and (ii) an address signal. The first latch may be configured to hold the address in response to a control signal. The second latch may be configured to hold the data input signal in response to the control signal. The control circuit may be configured to present the control signal in response to (i) a detect signal and (ii) a transition of the address signal.