Patents by Inventor Jennifer Lynn McKeown

Jennifer Lynn McKeown has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Multiple BIST controllers for testing multiple embedded memory arrays
    Patent number: 5995731
    Abstract: Multiple memory arrays (215, 225) in embedded applications are each tightly coupled to their own Built-In Self-Test (BIST) controller to form BISTed memory cells (210, 220) supporting structural and retention testing. Testing on multiple BISTed memories (210, 220) is initiated by common INVOKE (230), RETENTION (240), and RELEASE (250) signals. DONE and HOLD signals are combined (260, 280) from the multiple BISTed memories (210, 220) and delayed to generate a global "all memory" DONE (265) and HOLD (285) signals. FAIL signals are combined (270) from the multiple BISTed memories (210, 220) to generate a global "any memory" FAIL (275) signal. The BISTed memories can be combined in multiple stages to meet power limitations.
    Type: Grant
    Filed: December 29, 1997
    Date of Patent: November 30, 1999
    Assignee: Motorola, Inc.
    Inventors: Alfred Larry Crouch, Jennifer Lynn McKeown, Clark Gilson Shepard