Patents by Inventor Jens Reichelt

Jens Reichelt has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20090170024
    Abstract: A photosensitive layer stack, lithographic systems and methods of patterning a substrate are disclosed having a patterning layer and a photochromic layer with an absorption switching from transmissive to absorptive upon exposure.
    Type: Application
    Filed: December 31, 2007
    Publication date: July 2, 2009
    Inventors: Mario Hennig, Rainer Pforr, Jens Reichelt
  • Publication number: 20080304029
    Abstract: In a method of adjusting an optical parameter of an exposure apparatus, a photolithographic projection is performed using an exposure apparatus and using a layout pattern so as to provide measured layout data with different focus settings of the exposure apparatus. An optical model is provided including at least one optical parameter and a simulated image is created by using the optical model and the layout pattern. The optical model is optimized by modifying the optical parameter.
    Type: Application
    Filed: June 8, 2007
    Publication date: December 11, 2008
    Applicant: QIMONDA AG
    Inventors: Rainer Pforr, Thorsten Winkler, Ralf Ziebold, Wolfram Kostler, Jens Reichelt, Stefan Blawid, Sebastian Champigny, Manuel Vorwerk
  • Publication number: 20070287075
    Abstract: A mask arrangement or an optical projection system includes a diffractive optical element. The diffractive optical element includes grid sections having gratings with defined grating parameters and absorbing elements with defined absorption properties, wherein each grid section corresponds to a respective mask section with mask pattern elements. The diffractive optical element may correct dimension deviations of resist pattern elements obtained from the respective mask pattern elements, wherein the deviations are caused by dimension deviations of the mask pattern elements or by local deviations and defects of the projection system.
    Type: Application
    Filed: June 13, 2006
    Publication date: December 13, 2007
    Inventors: Rainer Pforr, Jens Reichelt, Mario Hennig, Thomas Mulders, Karsten Zeiler
  • Publication number: 20070009816
    Abstract: A transparent optical element in a region between a photo mask and a light source of a photolithographic apparatus is provided having a plurality of attenuating elements being arranged in accordance with a first intensity correction function. The first intensity correction function is calculated from variations of characteristic feature size of structural elements of a resist pattern as compared to the nominal values of structural elements of a layout pattern. The variations of the characteristic feature size are divided into a first contribution being associated with the photolithographic apparatus and into a second contribution being associated with the photo mask.
    Type: Application
    Filed: June 16, 2006
    Publication date: January 11, 2007
    Inventors: Rainer Pforr, Mario Hennig, Jens Reichelt, Thomas Muelders