Abstract: A testing system incorporating a modular primary frame having multiple mounting surfaces and mounted on a conventional probe card testing assembly is disclosed. At least one modular press assembly is attached to the primary frame. The press assembly is height adjustable relative the testing assembly and has a plurality of synchronized force-applying members. At least one conveyor rail pair may be attached to at least one primary frame mounting surface. The rail pair is configured to deliver a printed circuit board to the testing assembly and to withdraw a printed circuit board from the testing assembly. A modular interface assembly comprising a bar code reader, a board marker or other similar devices may be disposed within the primary frame and is height adjustable relative the testing assembly. A modular secondary frame attached to at least one primary frame mounting surface may house the interface.