Abstract: Devices and methods that a first gate structure wrapping around a channel layer disposed over the substrate, a second gate structure wrapping around another channel layer disposed over the substrate and a dielectric fin structure formed over a shallow trench isolation (STI) feature and between the first and second gate structures. At least one metallization layer is formed on the first gate structure, the dielectric fin structure, and the second gate structure and contiguously extends from the first gate structure to the second gate structure.

Abstract: A gate-all-around field effect transistor may be provided by forming a sacrificial gate structure and a dielectric gate spacer around a middle portion of a semiconductor plate stack. A source region and a drain region may be formed on end portions of semiconductor plates within the semiconductor plate stack. The sacrificial gate structure and other sacrificial material portions may be replaced with a combination of a gate dielectric layer and a gate electrode. The gate dielectric layer and the gate electrode may be vertically recessed selective to the dielectric gate spacer. A first anisotropic etch process recesses the gate electrode and the gate dielectric layer at about the same etch rate. A second anisotropic etch process with a higher selectivity may be subsequently used. Protruding remaining portions of the gate dielectric layer are minimized to reduce leakage current between adjacent transistors.

Abstract: A gate-all-around field effect transistor may be provided by forming a sacrificial gate structure and a dielectric gate spacer around a middle portion of a semiconductor plate stack. A source region and a drain region may be formed on end portions of semiconductor plates within the semiconductor plate stack. The sacrificial gate structure and other sacrificial material portions may be replaced with a combination of a gate dielectric layer and a gate electrode. The gate dielectric layer and the gate electrode may be vertically recessed selective to the dielectric gate spacer. A first anisotropic etch process recesses the gate electrode and the gate dielectric layer at about the same etch rate. A second anisotropic etch process with a higher selectivity may be subsequently used. Protruding remaining portions of the gate dielectric layer are minimized to reduce leakage current between adjacent transistors.

Abstract: A device includes a substrate, a first metal feature over the substrate, first and second spacers, a first dielectric layer, and a second metal feature. The first and second spacers are on opposite sidewalls of the conductive feature, respectively. The first dielectric layer is in contact with the first spacer, in which a top surface of the protection layer is higher than a top surface of the first spacer. The second metal feature is electrically connected to the first metal structure and in contact with a top surface and a sidewall of the protection layer.

Abstract: A method includes providing a semiconductor structure having metal gate structures (MGs), gate spacers disposed on sidewalls of the MGs, and source/drain (S/D) features disposed adjacent to the gate spacers; forming a first dielectric layer over the MGs and forming S/D contacts (MDs) over the S/D features; forming a second dielectric layer over the first dielectric layer, where portions of the second dielectric layer contact the MDs and the second dielectric layer is different from the first dielectric layer in composition; removing the portions of the second dielectric layer that contact the MDs; forming a conductive layer over the MDs and over the first dielectric layer; and removing portions of the conductive layer to form conductive features over the MDs.

Abstract: A method includes providing a structure having two fins extending from a substrate; an isolation structure isolating bottom portions of the fins; source/drain (S/D) features over each of the fins; a dielectric fin oriented lengthwise parallel to the fins and disposed between the two fins and over the isolation structure; a dummy gate stack over the isolation structure, the fins, and the dielectric fin; and one or more dielectric layers over sidewalls of the dummy gate stack. The method further includes removing the dummy gate stack to result in a gate trench within the one or more dielectric layers, wherein the dielectric fin is exposed in the gate trench; trimming the dielectric fin to reduce a width of the dielectric fin; and after the trimming, forming a high-k metal gate in the gate trench.

Abstract: A semiconductor device structure is provided. The semiconductor device structure includes a gate stack and a contact over a fin structure, a gate spacer layer between the gate stack and the contact, a first mask layer over the gate stack, and a second mask layer over the contact. The first mask layer includes a protruding portion sandwiched between an upper portion of the second mask layer and the gate spacer layer.

Abstract: A method of forming a semiconductor device includes providing a device having a gate stack including a metal gate layer. The device further includes a spacer layer disposed on a sidewall of the gate stack and a source/drain feature adjacent to the gate stack. The method further includes performing a first etch-back process to the metal gate layer to form an etched-back metal gate layer. In some embodiments, the method includes depositing a metal layer over the etched-back metal gate layer. In some cases, a semiconductor layer is formed over both the metal layer and the spacer layer to provide a T-shaped helmet layer over the gate stack and the spacer layer.

Abstract: A semiconductor device comprises a fin disposed on a substrate, a source/drain feature disposed over the fin, a silicide layer disposed over the source/drain feature, a seed metal layer disposed over the silicide layer and wrapping around the source/drain feature, and a metal layer disposed on the silicide layer, where the metal layer contacts the seed metal layer.

Abstract: Semiconductor devices and methods of forming the same are provided. In one embodiment, a semiconductor device includes a fin extending from a substrate, a gate structure over a channel region of the fin, a source/drain contact over a source/drain region of the fin, a spacer extending along a sidewall of the gate structure, a liner extending along a sidewall of the source/drain contact, a gate contact via over and electrically coupled to the gate structure, and a source/drain contact via over and electrically coupled to the source/drain contact. The gate contact via extends through a first dielectric layer such that a portion of the first dielectric layer interposes between the gate contact via and the spacer. The source/drain contact via extends through a second dielectric layer such that a portion of the second dielectric layer interposes between the source/drain contact via and the liner.

Abstract: A semiconductor structure includes a plurality of fin structures extending along a first direction, a plurality of gate structure segments positioned along a line extending in a second direction, the second direction being orthogonal to the first direction, wherein the gate structure segments are separated by dummy fin structures. The semiconductor structure further includes a conductive layer disposed over both the gate structure segments and the dummy fin structures to electrically connect at least some of the gate structure segments, and a cut feature aligned with one of the dummy fin structures and positioned to electrically isolate gate structure segments on both sides of the one of the dummy fin structures.

Abstract: A method includes providing a semiconductor structure having metal gate structures (MGs), gate spacers disposed on sidewalls of the MGs, and source/drain (S/D) features disposed adjacent to the gate spacers; forming a first dielectric layer over the MGs and forming S/D contacts (MDs) over the S/D features; forming a second dielectric layer over the first dielectric layer, where portions of the second dielectric layer contact the MDs and the second dielectric layer is different from the first dielectric layer in composition; removing the portions of the second dielectric layer that contact the MDs; forming a conductive layer over the MDs and over the first dielectric layer; and removing portions of the conductive layer to form conductive features over the MDs.

Abstract: A FinFET device structure is provided. The FinFET device structure includes a first gate structure formed over a fin structure and a first spacer layer formed on the first gate structure. The FinFET device structure includes a first insulation layer formed over the fin structure, and the first insulating layer is adjacent to and separated from the first spacer layer. The FinFET device structure includes a conductive plug formed over the first gate structure, and the conductive plug is formed over the first spacer layer and the first insulation layer.

Abstract: The present disclosure describes a semiconductor structure and a method for forming the same. The semiconductor structure can include a substrate, a first vertical structure and a second vertical structure formed over the substrate, and an isolation structure between the first and second vertical structures. The isolation structure can include a center region and footing regions formed on opposite sides of the center region. Each of the footing regions can be tapered towards the center region from a first end of the each footing region to a second end of the each footing region.

Abstract: A semiconductor structure includes a metal gate structure disposed over a semiconductor substrate, a gate spacer disposed on a sidewall of the metal gate structure, an source/drain contact disposed over the semiconductor substrate and separated from the metal gate structure by the gate spacer, and a contact feature coupling the metal gate structure to the source/drain contact. The contact feature may be configured to include a dielectric layer disposed on a metal layer, where the dielectric layer and the metal layer are defined by continuous sidewalls.

Abstract: A method for forming a semiconductor device structure is provided. The method for forming the semiconductor device structure includes forming a first mask layer covering the gate stack, forming a contact alongside the gate stack and the first mask layer, recessing the contact, etching the first mask layer, and forming a second mask layer covering the contact and a portion of the first mask layer.

Abstract: A method comprises forming a gate structure over a substrate; forming a gate helmet to cap the gate structure; forming a source/drain contact on the substrate; depositing a contact etch stop layer (CESL) over the gate helmet and the source/drain contacts, and an interlayer dielectric (ILD) layer over the CESL; performing a first etching process to form a gate contact opening extending through the ILD layer, the CESL and the gate helmet to the gate structure; forming a metal cap in the gate contact opening; with the metal cap in the gate contact opening, performing a second etching process to form a source/drain via opening extending through the ILD layer, the CESL to the source/drain contact; and after forming the source/drain via opening, forming a gate contact over the metal cap and a source/drain via over the source/drain contact.

Abstract: Semiconductor devices and methods of forming the same are provided. In one embodiment, a semiconductor device includes a fin extending from a substrate, a gate structure over a channel region of the fin, a source/drain contact over a source/drain region of the fin, a spacer extending along a sidewall of the gate structure, a liner extending along a sidewall of the source/drain contact, a gate contact via over and electrically coupled to the gate structure, and a source/drain contact via over and electrically coupled to the source/drain contact. The gate contact via extends through a first dielectric layer such that a portion of the first dielectric layer interposes between the gate contact via and the spacer. The source/drain contact via extends through a second dielectric layer such that a portion of the second dielectric layer interposes between the source/drain contact via and the liner.

Abstract: The present disclosure provides a method for semiconductor fabrication. The method includes epitaxially growing source/drain feature on a fin; forming a silicide layer over the epitaxial source/drain feature; forming a seed metal layer on the silicide layer; forming a contact metal layer over the seed metal layer using a bottom-up growth approach; and depositing a fill metal layer over the contact metal layer.

Abstract: A method for manufacturing a semiconductor device includes forming a semiconductor fin on a substrate. A dummy gate structure is formed crossing the semiconductor fin. The dummy gate structure is replaced with a metal gate structure. An epitaxial structure is formed in the semiconductor fin after replacing the dummy gate structure with the metal gate structure.