Abstract: A light-emitting device includes a lead frame having a first surface on which a patterned conductive layer is provided, and a light-emitting element. The light-emitting element includes an insulating substrate formed on the first surface, a plurality of light-emitting units formed on the insulating substrate, at least one first electrode, at least one second electrode and at least a pair of bonding wires. The first and second electrodes are respectively placed in electrical connection with a first one and a second one of the light-emitting units, and are disposed outward of the light-emitting units. Each of the pair of bonding wires is disposed to electrically connect a respective one of the first and second electrodes to the patterned conductive layer.

Abstract: A computer-implemented method for defect analysis is provided. The computer-implemented method includes obtaining a plurality of sets of defect point coordinates, a respective set of the plurality of sets of detect point coordinates including coordinates of defect points in a respective substrate of a plurality of substrates, the coordinates of defect points in the respective substrate being coordinates in an image coordinate system; combining the plurality of sets of defect point coordinates according to the image coordinate system into a composite set of coordinates to generate a composite image; and performing a clustering analysis to classify defect points in the composite set in the composite image into a plurality of clusters.

Abstract: The present disclosure provides a method for processing defect information of a product, which includes the following steps of: acquiring defect information on a current film layer and defect information on historical film layers; determining whether defect information exists at a target location of the historical film layer if defect information exists at a target location of the current film layer; if defect information exists for a corresponding location to the target location in at least one of the historical film layers, deleting the defect information detected at the target location in the current film layer; and if no defect information exists for the target location in any of the historical film layers, retaining the defect information detected at the target location in the current film layer.

Abstract: A method for querying a product history is disclosed. The method includes receiving a product query request including at least one product query parameter for a target product to a product graph database that stores a relational map constructed based on a manufacturing process of the target product and describing entities including product entities and manufacturing entities and entity relations therebetween involved in the manufacturing process, querying the product graph database according to the product query parameter to obtain product history data of the target product by searching for a product entity corresponding to the target product as a target product entity in the relational map according to the parameter, searching for associated manufacturing entities of the target product entity according to the entity relations, obtaining the product history data based on the associated manufacturing entities, and sending a notification message to notify obtained product history data.

Abstract: A computer-implemented method for defect analysis is provided. The computer-implemented method includes obtaining a plurality of sets of defect point coordinates, a respective set of the plurality of sets of detect point coordinates including coordinates of defect points in a respective substrate of a plurality of substrates, the coordinates of defect points in the respective substrate being coordinates in an image coordinate system; combining the plurality of sets of defect point coordinates according to the image coordinate system into a composite set of coordinates to generate a composite image; and performing a clustering analysis to classify defect points in the composite set in the composite image into a plurality of clusters.

Abstract: A method for querying a product history is disclosed. The method includes receiving a product query request including at least one product query parameter for a target product to a product graph database that stores a relational map constructed based on a manufacturing process of the target product and describing entities including product entities and manufacturing entities and entity relations therebetween involved in the manufacturing process, querying the product graph database according to the product query parameter to obtain product history data of the target product by searching for a product entity corresponding to the target product as a target product entity in the relational map according to the parameter, searching for associated manufacturing entities of the target product entity according to the entity relations, obtaining the product history data based on the associated manufacturing entities, and sending a notification message to notify obtained product history data.