Patents by Inventor Jiaxiang Zhou
Jiaxiang Zhou has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240109990Abstract: Aqueous dispersions and uses for the same. The aqueous dispersion includes a component (a) of one or more ethylene-vinyl ester copolymers and a component (b) of one or more protective colloids. The aqueous dispersion may optionally a component (c1) of one or more nonionic surfactants and/or a component (c2) of one or more ionic surfactants. Where a total amount of the component (b) is less than or equal to 2.2 pphm, preferably between 1-2.2 pphm, or more preferably 1.8 pphm. Additionally, where a total amount of the component (c1) and the component (c2) is less than 0.1 pphm, preferably less than or equal to 0.01 pphm.Type: ApplicationFiled: December 30, 2020Publication date: April 4, 2024Applicant: Wacker Chemie AGInventors: Jin Zheng, Qian Chen, Yipeng Wei, Jiaxiang Zhou
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Publication number: 20240110047Abstract: Aqueous dispersions and uses for the same. The aqueous dispersion includes a component (a) of one or more ethylene-vinyl ester copolymers, a component (b) of one or more protective colloids, a component (el) of one or more nonionic surfactants, and a component (d) of one or more dispersants, selected from polycarboxylates. Where an amount of the component (b) and the component (c1) is less than or equal to 3.4 pphm, preferably between 1-3.4 pphm, more preferably between 2-3.1 pphm. Where the weight ratio of an amount of the component (b) to the component (el) is between 1.01-2 and an amount of the component (d) is less than or equal to 1 pphm. The component (b) is polyvinyl alcohol (PVOH).Type: ApplicationFiled: December 30, 2020Publication date: April 4, 2024Applicant: Wacker Chemie AGInventors: Jin Zheng, Qian Chen, Jie Xu, Jiaxiang Zhou
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Patent number: 7544512Abstract: The present invention discloses a method of producing polypeptides, including insulinotropic GLP-1 (7-36) polypeptide and/or GLP-1 analogs, by ligating genes in a tandem way. Also disclosed are the recombinant polypeptides produced by such a method. Using the method of this invention, 1 to 32 copies of GLP-1 (7-36) and/or GLP-1 analog genes may be expressed in tandem and the desired polypeptide can be obtained after cleavage of a fusion protein and further processes of separation and purification thus making possible the production of recombinant polypeptides, including recombinant GLP-1 (7-36) and/or GLP-1 analogs on a large scale, at a significantly reduced production cost.Type: GrantFiled: January 20, 2004Date of Patent: June 9, 2009Assignee: Shanhai Hua Yi Bio-Tech LabInventors: Yukun Sun, Dengxi Wu, Aizhen Wu, Zhiyong Zhu, Gang Yu, Jiaxiang Zhou, Shaoling Zhao
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Publication number: 20040146985Abstract: The present invention discloses a method of producing polypeptides, including insulinotropic GLP-1 (7-36) polypeptide and/or GLP-1 analogs, by ligating genes in a tandem way. Also disclosed are the recombinant polypeptides produced by such a method. Using the method of this invention, 1 to 32 copies of GLP-1(7-36) and/or GLP-1 analog genes may be expressed in tandem and the desired polypeptide can be obtained after cleavage of a fusion protein and further processes of separation and purification thus making possible the production of recombinant polypeptides, including recombinant GLP-1(7-36) and/or GLP-1 analogs on a large scale, at a significantly reduced production cost.Type: ApplicationFiled: January 20, 2004Publication date: July 29, 2004Applicant: Shanghai Hua-Yi Bio-Tech LabInventors: Yukun Sun, Dengxi Wu, Aizhen Wu, Zhiyong Zhu, Gang Yu, Jiaxiang Zhou, Shaoling Zhao
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Patent number: 6349589Abstract: A quick set of procedures for diagnosing the cause of a failure in a vacuum system having a pump and a chamber is disclosed. If the base pressure of the system has failed, but the rate of rise has not, then the most likely cause of the failure may be in the pump. If the rate of rise has failed, but the base pressure has not, then the most likely cause of the failure may be in the chamber. If the base pressure and rate of rise have both failed, then the most likely cause of the failure is in the chamber, but there is a slight chance of a failure in the pump. Measurements of the partial pressures of certain residual gases in the system may indicate a leak in the system. Measurements of the partial pressures of certain residual gases while turning off and on the lamps in the system may indicate a leak in the lamps. Measurements of the partial pressure of helium or other relevant gas, while moving a source of helium around the outside surface of the system, may determine the location of a leak.Type: GrantFiled: August 13, 1999Date of Patent: February 26, 2002Assignee: Applied Materials, Inc.Inventor: Jiaxiang Zhou
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Patent number: 6054862Abstract: A method for performing a bakeout test on a vacuum chamber without causing the ion gauge to fail turns the ion gauge off when it is not needed, even during part of the time that the chamber is held at a high vacuum, so as to minimize the opportunity for contaminants to react with and damage the ion gauge filament. Specifically, the method turns the gauge off when any heating elements in the chamber are turned on, so the added heat does not exacerbate the problems with reactions with the filament. Thus, the method turns the gauge off when the chamber is too hot. In one embodiment, the method employs a heating jacket to keep the gauge and its adapter from forming a cold spot at which water vapor can condense during part of the test.Type: GrantFiled: September 2, 1997Date of Patent: April 25, 2000Assignee: Applied Materials, Inc.Inventor: Jiaxiang Zhou
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Patent number: 5979225Abstract: A quick set of procedures for diagnosing the cause of a failure in a vacuum system having a pump and a chamber is disclosed. If the base pressure of the system has failed, but the rate of rise has not, then the most likely cause of the failure may be in the pump. If the rate of rise has failed, but the base pressure has not, then the most likely cause of the failure may be in the chamber. If the base pressure and rate of rise have both failed, then the most likely cause of the failure is in the chamber, but there is a slight chance of a failure in the pump. Measurements of the partial pressures of certain residual gases in the system may indicate a leak in the system. Measurements of the partial pressures of certain residual gases while tuning off and on the lamps in the system may indicate a leak in the lamps. Measurements of the partial pressure of helium or other relevant gas, while moving a source of helium around the outside surface of the system, may determine the location of a leak.Type: GrantFiled: August 26, 1997Date of Patent: November 9, 1999Assignee: Applied Materials, Inc.Inventor: Jiaxiang Zhou
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Patent number: 5879467Abstract: A vacuum system bakeout process is performed by cycling the system between two pressures, pumping the system down to a lower pressure, and holding the system at that lower pressure for a period of time. A gas, such as argon gas, is introduced into the system. This gas introduction is done while cycling between the two pressures. The pump is used to lower the pressure during cycling, and the gas flow is used to raise the pressure. A rough pump performs the cycling between pressures, and then a high vacuum pump evacuates the system to the lower pressure.Type: GrantFiled: September 2, 1997Date of Patent: March 9, 1999Assignee: Applied Materials, Inc.Inventors: Jiaxiang Zhou, Stephen D. Dasso