Abstract: A global shutter image sensor with improved pixel failure coverage detects failures caused by the pixel chip of the image sensor. The global shutter image sensor includes a pixel chip including an array of photodiodes and associated logic, and a logic chip, bonded to the pixel chip, including an array of logic blocks for processing the images detected by the photodiodes. A failure detection circuit coupled to a reference voltage node of the image sensor detects a failure in the pixel chip by capturing a first level of pixel bias current and a second level of pixel bias current wherein a difference between the first level and the second level drives an output of the failure detection circuit either as logic high or as logic low.

Abstract: A set of image-space data is reconstructed from a set of k-space data. The set of image-space data is generated by minimizing a cost functional by an iterative non-linear conjugate gradient process. The iterative process may be accelerated by introducing k-space weighting to the cost functional. With proper choice of k-space weighting, a block-Toeplitz matrix is generated which permits use of Fast Fourier Transform techniques. An image is rendered from the set of image-space data.

Abstract: A set of image-space data is reconstructed from a set of k-space data. The set of image-space data is generated by minimizing a cost functional by an iterative non-linear conjugate gradient process. The iterative process may be accelerated by introducing k-space weighting to the cost functional. With proper choice of k-space weighting, a block-Toeplitz matrix is generated which permits use of Fast Fourier Transform techniques. An image is rendered from the set of image-space data.