Patents by Inventor Jim Baldino

Jim Baldino has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8329575
    Abstract: A through-silicon via fabrication method includes etching a plurality of through holes in a silicon plate. An oxide liner is deposited on the surface of the silicon plate and on the sidewalls and bottom wall of the through holes. A metallic conductor is then deposited in the through holes. In another version, which may be used concurrently with the oxide liner, a silicon nitride passivation layer is deposited on the exposed back surface of the silicon plate of the substrate.
    Type: Grant
    Filed: December 22, 2010
    Date of Patent: December 11, 2012
    Assignee: Applied Materials, Inc.
    Inventors: Nagarajan Rajagopalan, Ji Ae Park, Ryan Yamase, Shamik Patel, Thomas Nowak, Li-Qun Xia, Bok Hoen Kim, Ran Ding, Jim Baldino, Mehul Naik, Sesh Ramaswami
  • Patent number: 8283237
    Abstract: A through-silicon via fabrication method comprises forming a substrate by bonding the front surface of a silicon plate to a carrier using an adhesive layer therebetween to expose the back surface of the silicon plate. A silicon nitride passivation layer is deposited on the exposed back surface of the silicon plate of the substrate. A plurality of through holes are etched in the silicon plate, the through holes comprising sidewalls and bottom walls. A metallic conductor is deposited in the through holes to form a plurality of through-silicon vias.
    Type: Grant
    Filed: December 23, 2010
    Date of Patent: October 9, 2012
    Assignee: Applied Materials, Inc.
    Inventors: Nagarajan Rajagopalan, Ji Ae Park, Ryan Yamase, Shamik Patel, Thomas Nowak, Li-Qun Xia, Bok Hoen Kim, Ran Ding, Jim Baldino, Mehul Naik, Sesh Ramaswami
  • Publication number: 20120164827
    Abstract: A through-silicon via fabrication method comprises forming a substrate by bonding the front surface of a silicon plate to a carrier using an adhesive layer therebetween to expose the back surface of the silicon plate. A silicon nitride passivation layer is deposited on the exposed back surface of the silicon plate of the substrate. A plurality of through holes are etched in the silicon plate, the through holes comprising sidewalls and bottom walls. A metallic conductor is deposited in the through holes to form a plurality of through-silicon vias.
    Type: Application
    Filed: December 23, 2010
    Publication date: June 28, 2012
    Applicant: APPLIED MATERIALS, INC.
    Inventors: Nagarajan RAJAGOPALAN, Ji Ae PARK, Ryan YAMASE, Shamik PATEL, Thomas NOWAK, Li-Qun XIA, Bok Hoen KIM, Ran DING, Jim BALDINO, Mehul NAIK, Sesh RAMASWAMI
  • Publication number: 20120164829
    Abstract: A through-silicon via fabrication method includes etching a plurality of through holes in a silicon plate. An oxide liner is deposited on the surface of the silicon plate and on the sidewalls and bottom wall of the through holes. A metallic conductor is then deposited in the through holes. In another version, which may be used concurrently with the oxide liner, a silicon nitride passivation layer is deposited on the exposed back surface of the silicon plate of the substrate.
    Type: Application
    Filed: December 22, 2010
    Publication date: June 28, 2012
    Applicant: APPLIED MATERIALS, INC.
    Inventors: Nagarajan Rajagopalan, Ji Ae Park, Ryan Yamase, Shamik Patel, Thomas Nowak, Li-Qun Xia, Bok Hoen Kim, Ran Ding, Jim Baldino, Mehul Naik, Sesh Ramaswami