Patents by Inventor Jim McKenna

Jim McKenna has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10598722
    Abstract: A mixed signal testing system capable of testing differently configured units under test (UUT) includes a controller, a test station and an interface system that support multiple UUTs. The test station includes independent sets of channels configured to send signals to and receive signals from each UUT being tested and signal processing subsystems that direct stimulus signals to a respective set of channels and receive signals in response thereto. The signal processing subsystems enable simultaneous and independent directing of stimulus signals through the sets of channels to each UUT and reception of signals from each UUT in response to the stimulus signals. Received signals responsive to stimulus signals provided to a fully functional UUT (with and without induced faults) are used to assess presence or absence of faults in the UUT being tested which may be determined to include one or more faults or be fault-free, i.e., fully functional.
    Type: Grant
    Filed: October 16, 2017
    Date of Patent: March 24, 2020
    Assignee: Advanced Testing Technologies, Inc.
    Inventors: Robert Spinner, Eli Levi, Jim McKenna, William Harold Leippe, William Biagiotti, Richard Engel
  • Patent number: 10151791
    Abstract: A mixed signal testing system capable of testing differently configured units under test (UUT) includes a controller, a test station and an interface system that support multiple UUTs. The test station includes independent sets of channels configured to send signals to and receive signals from each UUT being tested and signal processing subsystems that direct stimulus signals to a respective set of channels and receive signals in response thereto. The signal processing subsystems enable simultaneous and independent directing of stimulus signals through the sets of channels to each UUT and reception of signals from each UUT in response to the stimulus signals. Received signals responsive to stimulus signals provided to a fully functional UUT (with and without induced faults) are used to assess presence or absence of faults in the UUT being tested which may be determined to include one or more faults or be fault-free, i.e., fully functional.
    Type: Grant
    Filed: November 24, 2017
    Date of Patent: December 11, 2018
    Assignee: Advanced Testing Technologies, Inc.
    Inventors: Robert Spinner, Eli Levi, Jim McKenna, William Harold Leippe, William Biagiotti, Richard Engel
  • Patent number: 9864003
    Abstract: A mixed signal testing system capable of testing differently configured units under test (UUT) includes a controller, a test station and an interface system that support multiple UUTs. The test station includes independent sets of channels configured to send signals to and receive signals from each UUT being tested and signal processing subsystems that direct stimulus signals to a respective set of channels and receive signals in response thereto. The signal processing subsystems enable simultaneous and independent directing of stimulus signals through the sets of channels to each UUT and reception of signals from each UUT in response to the stimulus signals. Received signals responsive to stimulus signals provided to a fully functional UUT (with and without induced faults) are used to assess presence or absence of faults in the UUT being tested which may be determined to include one or more faults or be fault-free, i.e., fully functional.
    Type: Grant
    Filed: June 12, 2017
    Date of Patent: January 9, 2018
    Assignee: Advanced Testing Technologies, Inc.
    Inventors: Robert Spinner, Eli Levi, Jim McKenna, William Harold Leippe, William Biagiotti, Richard Engel
  • Patent number: 9739827
    Abstract: A mixed signal testing system capable of testing differently configured units under test (UUT) includes a controller, a test station and an interface system that support multiple UUTs. The test station includes independent sets of channels configured to send signals to and receive signals from each UUT being tested and signal processing subsystems that direct stimulus signals to a respective set of channels and receive signals in response thereto. The signal processing subsystems enable simultaneous and independent directing of stimulus signals through the sets of channels to each UUT and reception of signals from each UUT in response to the stimulus signals. Received signals responsive to stimulus signals provided to a fully functional UUT (with and without induced faults) are used to assess presence or absence of faults in the UUT being tested which may be determined to include one or more faults or be fault-free, i.e., fully functional.
    Type: Grant
    Filed: February 2, 2017
    Date of Patent: August 22, 2017
    Assignee: Advanced Testing Technologies, Inc.
    Inventors: Robert Spinner, Eli Levi, Jim McKenna, William Harold Leippe, William Biagiotti, Richard Engel