Abstract: A spectroscopic system that processes spatially dispersed electromagnetic emissions at a number of wavelengths from a test material. The spectroscopic system includes a converter that generates an electrical signal that is proportional to the intensity of electromagnetic radiation received by the converter. An optical delay circuit is coupled to an input of the converter. The optical delay circuit selectively delays application to the converter of electromagnetic emissions from the test material for at least one wavelength of electromagnetic emissions. A data processing circuit is coupled to an output of the converter. The data processing circuit records the value of the electrical signal from the converter over time so as to measure, contemporaneously, the intensity of electromagnetic emissions at each wavelength as a function of time.