Patents by Inventor Jimmy Yen

Jimmy Yen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Inspection methods for defects in electrophoretic display and related devices
    Patent number: 7982479
    Abstract: The present invention relates to methods for inspection of defects in an electrophoretic display and related devices. The method may be carried out with one or more testing electrodes. The method comprises applying a voltage difference to two testing electrodes which are in contact with the display panel, or applying a voltage difference to a testing electrode and a electrode layer. The methods may be applied in in-line or off-line inspection of a display panel.
    Type: Grant
    Filed: April 4, 2007
    Date of Patent: July 19, 2011
    Assignee: SiPix Imaging, Inc.
    Inventors: Wanheng Wang, Yi-Shung Chaug, Yajuan Chen, Gary Yih-Ming Kang, Jimmy Yen
  • INSPECTION METHODS FOR DEFECTS IN ELECTROPHORETIC DISPLAY AND RELATED DEVICES
    Publication number: 20080169821
    Abstract: The present invention relates to methods for inspection of defects in an electrophoretic display and related devices. The method may be carried out with one or more testing electrodes. The method comprises applying a voltage difference to two testing electrodes which are in contact with the display panel, or applying a voltage difference to a testing electrode and a electrode layer. The methods may be applied in in-line or off-line inspection of a display panel.
    Type: Application
    Filed: April 4, 2007
    Publication date: July 17, 2008
    Inventors: Wanheng Wang, Yi-Shung Chaug, Yajuan Chen, Gary Yih-Ming Kang, Jimmy Yen