Patents by Inventor Jing Mei Tao

Jing Mei Tao has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Integrated emission microscope for panchromatic imaging, continuous wavelength spectroscopy and selective area spectroscopic mapping
    Patent number: 5724131
    Abstract: An integrated emission microscope with an emitted radiation detection system for collecting and analyzing radiation from a device under test. A semi-ellipsoidal mirror of high ellipticity directs emitted radiation from the device under test through an aperture to a radiation guide, Which transmits the radiation to spectral analyzer. The device under test may be mounted on a scanning stage. The system permits high spatial resolution selected area spectroscopic analysis, panchromatic imaging, and spectroscopic mapping of the emitted radiation from the device under test.
    Type: Grant
    Filed: August 4, 1995
    Date of Patent: March 3, 1998
    Assignee: The National University of Singapore
    Inventors: Wai Kin Chim, Daniel Siu Hung Chan, Jacob Chee Hong Phang, Jing Mei Tao, Yong Yu Liu