Abstract: A test method includes: providing an initialization command to a ZQ calibration module such that the resistance value of a termination resistor is a first extreme value; providing a ZQ calibration command to the ZQ calibration module such that the resistance value of the termination resistor increases or decreases to a second extreme value from the first extreme value, one of the first extreme value and the second extreme value being a maximum value while the other one being a minimum value; acquiring a first time node, the first time node being a transmitting time for the ZQ calibration command; acquiring a second time node; and acquiring the ZQ calibration time based on the second time node and the first time node.

Abstract: A method for testing a memory chip includes: in response to read command for the memory chip, controlling clock signal to be kept in first state within first preset time period and at the same time controlling complementary clock signal to be kept in second state within first preset time period; in response to clock signal kept in the first state and complementary clock signal kept in the second state, keeping data strobe signal in the first state within second preset time period and at the same time keeping complementary data strobe signal in the second state within the second preset time period; and when the data strobe signal and the complementary data strobe signal are kept in first and second states respectively, controlling first and second driving modules connected respectively to data strobe terminal and complementary data strobe terminal to operate and measure first and second resistance values respectively.

Abstract: A method for testing a memory chip includes: in response to read command for the memory chip, controlling clock signal to be kept in first state within first preset time period and at the same time controlling complementary clock signal to be kept in second state within first preset time period; in response to clock signal kept in the first state and complementary clock signal kept in the second state, keeping data strobe signal in the first state within second preset time period and at the same time keeping complementary data strobe signal in the second state within the second preset time period; and when the data strobe signal and the complementary data strobe signal are kept in first and second states respectively, controlling first and second driving modules connected respectively to data strobe terminal and complementary data strobe terminal to operate and measure first and second resistance values respectively.

Abstract: A test method includes: providing an initialization command to a ZQ calibration module such that the resistance value of a termination resistor is a first extreme value; providing a ZQ calibration command to the ZQ calibration module such that the resistance value of the termination resistor increases or decreases to a second extreme value from the first extreme value, one of the first extreme value and the second extreme value being a maximum value while the other one being a minimum value; acquiring a first time node, the first time node being a transmitting time for the ZQ calibration command; acquiring a second time node; and acquiring the ZQ calibration time based on the second time node and the first time node.