Patents by Inventor Joachim Matschnigg

Joachim Matschnigg has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for determining deviations between coordinate systems of different technical systems
    Patent number: 9173560
    Abstract: Method for determining deviations between coordinate systems of different technical systems, comprising the steps of determining a coordinate position of a reference feature of a test object in the coordinate system (u,v) of a first of the technical systems, the attachment of at least one test feature to the test object, with the test feature being attached in the coordinate system of a second of the technical systems at a coordinate position that is determined in dependence on the determined coordinate position of the reference feature, the determination of a coordinate position of at least one test feature and/or at least one feature derived from it in the coordinate system (u,v) of the first technical system, and determination of deviations between the coordinate systems of the first and second technical system, at least on the basis of: (a) the determined coordinate position of at least one test feature and/or of at least one feature derived from it in the coordinate system (u,v) of the first technical sy
    Type: Grant
    Filed: February 15, 2010
    Date of Patent: November 3, 2015
    Assignee: Wavelight GmbH
    Inventors: Mario Abraham, Johannes Agethen, Mario Klafke, Joachim Matschnigg
  • METHOD FOR DETERMINING DEVIATIONS BETWEEN COORDINATE SYSTEMS OF DIFFERENT TECHNICAL SYSTEMS
    Publication number: 20120307207
    Abstract: Method for determining deviations between coordinate systems of different technical systems, comprising the steps of determining a coordinate position of a reference feature of a test object in the coordinate system (u,v) of a first of the technical systems, the attachment of at least one test feature to the test object, with the test feature being attached in the coordinate system of a second of the technical systems at a coordinate position that is determined in dependence on the determined coordinate position of the reference feature, the determination of a coordinate position of at least one test feature and/or at least one feature derived from it in the coordinate system (u,v) of the first technical system, and determination of deviations between the coordinate systems of the first and second technical system, at least on the basis of: (a) the determined coordinate position of at least one test feature and/or of at least one feature derived from it in the coordinate system (u,v) of the first technical sy
    Type: Application
    Filed: February 15, 2010
    Publication date: December 6, 2012
    Inventors: Mario Abraham, Johannes Agethen, Mario Klafke, Joachim Matschnigg