Patents by Inventor Joachim Wietzorrek

Joachim Wietzorrek has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20200056985
    Abstract: A light source module for use in an analytical instrument for analyzing at least one sample is disclosed. The light source module includes at least one light-emitting diode and at least one light guiding rod adapted to guide and shape light emitted by the light-emitting diode. The light source module further includes at least one memory device. The memory device has stored therein at least one driving parameter set, for driving the light-emitting diode in such a way that desired emission properties of light provided by the light source module are generated.
    Type: Application
    Filed: October 25, 2019
    Publication date: February 20, 2020
    Inventors: Fabian Durrer, Alan Furlan, Joachim Wietzorrek
  • Patent number: 10564102
    Abstract: In one aspect of the present disclosure an optical measurement device includes a sample holder defining a sample plane, wherein the sample holder is configured to arrange a sample carrier including an array of measurement positions in the sample plane, an illumination unit configured to illuminate the sample plane, a detector and an optical imaging system configured to image the sample plane including the array of measurement positions onto the detector, the optical imaging system including two or more curved reflective elements adapted to image the sample plane onto the detector with a magnification of between 2:1 and 1:2 and the detector being configured to take an image of all measurement positions of the array of measurement positions at a time.
    Type: Grant
    Filed: February 21, 2017
    Date of Patent: February 18, 2020
    Assignee: Roche Molecular Systems, Inc.
    Inventor: Joachim Wietzorrek
  • Publication number: 20180172600
    Abstract: The present disclosure relates to a method for characterizing a light source. The method includes providing a light source to be characterized, collecting light emitted from the light source by using imaging optics, the imaging optics generating a pupil of the collected light emitted from the light source, generating an image of a pupil of light emitted only from a first surface area of the light source at a detector using the imaging optics, laterally shifting the light source and the imaging optics relative to each other and after the lateral shift, generating an image of a pupil of light emitted only from a second surface area of the light source at the detector using the imaging optics. The imaging optics includes a field stop between the light source and the detector to select a portion of the light source's surface from which light is imaged at a time.
    Type: Application
    Filed: December 12, 2017
    Publication date: June 21, 2018
    Applicant: Roche Diagnostics Operations, Inc.
    Inventor: Joachim Wietzorrek
  • Publication number: 20170241912
    Abstract: In one aspect of the present disclosure an optical measurement device includes a sample holder defining a sample plane, wherein the sample holder is configured to arrange a sample carrier including an array of measurement positions in the sample plane, an illumination unit configured to illuminate the sample plane, a detector and an optical imaging system configured to image the sample plane including the array of measurement positions onto the detector, the optical imaging system including two or more curved reflective elements adapted to image the sample plane onto the detector with a magnification of between 2:1 and 1:2 and the detector being configured to take an image of all measurement positions of the array of measurement positions at a time.
    Type: Application
    Filed: February 21, 2017
    Publication date: August 24, 2017
    Applicant: Roche Molecular Systems, Inc.
    Inventor: Joachim Wietzorrek
  • Patent number: 9506865
    Abstract: An instrument is disclosed with a lens system including an objective lens system. The objective lens system is disposed between a light source and the plurality of reaction regions. The objective lens system includes a field lens array, and a pupil plane, wherein the pupil plane and the light source are located on opposite sides of the field lens array.
    Type: Grant
    Filed: July 30, 2013
    Date of Patent: November 29, 2016
    Assignee: Roche Molecular Systems, Inc.
    Inventors: Alan Furlan, Joachim Wietzorrek
  • Patent number: 9115395
    Abstract: An apparatus for photometric measurement of biological liquids and a method of simultaneously measuring the presence or quantity of an analyte in a sample region are disclosed. The apparatus includes a plurality of spaced apart sample regions; a light source adapted to emit light including at least one frequency; a lens system including a light coupling system, wherein the light coupling system is disposed between the light source and the plurality of sample regions. A method is also disclosed including illuminating the sample region with a light beam emitted from a light source, wherein said light beam passes a light coupling system, the light coupling system including a telecentric element and a plurality of light mixing rods, wherein the light coupling system is disposed between the light source and the sample region such that the light beam is directed into the sample region.
    Type: Grant
    Filed: August 28, 2014
    Date of Patent: August 25, 2015
    Assignee: ROCHE MOLECULAR SYSTEMS, INC.
    Inventor: Joachim Wietzorrek
  • Publication number: 20150064699
    Abstract: An apparatus for photometric measurement of biological liquids and a method of simultaneously measuring the presence or quantity of an analyte in a sample region are disclosed. The apparatus includes a plurality of spaced apart sample regions; a light source adapted to emit light including at least one frequency; a lens system including a light coupling system, wherein the light coupling system is disposed between the light source and the plurality of sample regions. A method is also disclosed including illuminating the sample region with a light beam emitted from a light source, wherein said light beam passes a light coupling system, the light coupling system including a telecentric element and a plurality of light mixing rods, wherein the light coupling system is disposed between the light source and the sample region such that the light beam is directed into the sample region.
    Type: Application
    Filed: August 28, 2014
    Publication date: March 5, 2015
    Inventor: Joachim Wietzorrek
  • Publication number: 20140093948
    Abstract: A light source module for use in an analytical instrument for analyzing at least one sample is disclosed. The light source module includes at least one light-emitting diode and at least one light guiding rod adapted to guide and shape light emitted by the light-emitting diode. The light source module further includes at least one memory device. The memory device has stored therein at least one driving parameter set, for driving the light-emitting diode in such a way that desired emission properties of light provided by the light source module are generated.
    Type: Application
    Filed: September 30, 2013
    Publication date: April 3, 2014
    Applicant: Roche Molecular Systems, Inc.
    Inventors: Fabian Durrer, Alan Furlan, Joachim Wietzorrek
  • Publication number: 20140038190
    Abstract: An instrument is disclosed with a lens system including an objective lens system. The objective lens system is disposed between a light source and the plurality of reaction regions. The objective lens system includes a field lens array, and a pupil plane, wherein the pupil plane and the light source are located on opposite sides of the field lens array.
    Type: Application
    Filed: July 30, 2013
    Publication date: February 6, 2014
    Inventors: Alan Furlan, Joachim Wietzorrek
  • Patent number: 7911584
    Abstract: The present invention relates to an illumination system for microlithography, especially for wavelengths ?193 nm, especially preferably for EUV lithography for illuminating a field in a field plane with at least one optical integrator which splits up a light bundle emitted by a light source into a plurality of light channels each having a light intensity, characterized in that a filter is provided in the light path from the light source to the field plane, with the filter comprising filter elements which are configured in such a way that the light intensity of at least one light channel is reduced in the light path after the filter element.
    Type: Grant
    Filed: April 13, 2004
    Date of Patent: March 22, 2011
    Assignee: Carl Zeiss SMT GmbH
    Inventors: Wolfgang Singer, Joachim Wietzorrek, Joachim Hainz, Gabriele Weirauch, Manfred Maul
  • Patent number: 7906767
    Abstract: The invention concerns an optical instrument for imaging fluorescence signals from an arrangement of a plurality of individual detection sites, for example the wells of a microtitre plate. In order to improve the light yield of the fluorescence excitation with excitation light as well as the light yield of the detection of the fluorescence signals, an objective array is provided which is arranged in the beam path between the field lens and the detection sites and comprises a field lens array with field lens array elements and a pupil lens array with pupil lens array elements. In order to improve the channel separation and suppress interfering light the objective array can comprise a diaphragm array with in each case two diaphragm openings per detection site.
    Type: Grant
    Filed: July 21, 2009
    Date of Patent: March 15, 2011
    Assignee: Roche Molecular Systems, Inc.
    Inventors: Alan Furlan, Joachim Wietzorrek
  • Publication number: 20100019157
    Abstract: The invention concerns an optical instrument for imaging fluorescence signals from an arrangement of a plurality of individual detection sites, for example the wells of a microtitre plate. In order to improve the light yield of the fluorescence excitation with excitation light as well as the light yield of the detection of the fluorescence signals, an objective array is provided which is arranged in the beam path between the field lens and the detection sites and comprises a field lens array with field lens array elements and a pupil lens array with pupil lens array elements. In order to improve the channel separation and suppress interfering light the objective array can comprise a diaphragm array with in each case two diaphragm openings per detection site.
    Type: Application
    Filed: July 21, 2009
    Publication date: January 28, 2010
    Applicant: ROCHE MOLECULAR SYSTEMS, INC.
    Inventors: Alan Furlan, Joachim Wietzorrek
  • Patent number: 7551361
    Abstract: An optical imaging system for a microlithography projection exposure system is used for imaging an object field arranged in an object plane of the imaging system into an image field arranged in an image plane of the imaging system. A projection objective or a relay objective to be used in the illumination system can be involved, in particular. The imaging system has a plurality of lenses that are arranged between the object plane and the image plane and in each case have a first lens surface and a second lens surface. At least one of the lenses is a double aspheric lens where the first lens surface and the second lens surface is an aspheric surface. Lenses of good quality that have the action of an asphere with very strong deformation can be produced in the case of double aspheric lenses with an acceptable outlay as regards the surface processing and testing of the lens surfaces.
    Type: Grant
    Filed: July 14, 2004
    Date of Patent: June 23, 2009
    Assignee: Carl Zeiss SMT AG
    Inventors: Hans-Juergen Rostalski, Alexander Epple, Aurelian Dodoc, Johannes Wangler, Karl-Heinz Schuster, Joerg Schultz, Franz-Josef Stickel, Wolfgang Singer, Joachim Wietzorrek
  • Publication number: 20090015812
    Abstract: There is provided an illumination system for scannertype microlithography along a scanning direction with a light source emitting a wavelength ?193 nm. The illumination system includes a plurality of raster elements. The plurality of raster elements is imaged into an image plane of the illumination system to produce a plurality of images being partially superimposed on a field in the image plane. The field defines a non-rectangular intensity profile in the scanning direction.
    Type: Application
    Filed: September 18, 2008
    Publication date: January 15, 2009
    Applicant: Carl Zeiss SMT AG
    Inventors: Joerg Schultz, Johannes Wangler, Karl-Heinz Schuster, Udo Dinger, Wolfgang Singer, Martin Antoni, Joachim Wietzorrek, Joachim Hainz
  • Patent number: 7443948
    Abstract: There is provided an illumination system. the illumination system includes (a) a source of light having a wavelength of less than or equal to 193 nm, and (b) an optical element in a path of the light, having a first raster element, a second raster element, a third raster element and a fourth raster element situated thereon. The second raster element is adjacent to the first raster element, and located a first distance from the first raster element. The fourth raster element is adjacent to the third raster element, and located a second distance from the third raster element. The second distance is different from the first distance.
    Type: Grant
    Filed: February 2, 2006
    Date of Patent: October 28, 2008
    Assignee: Carl Zeiss SMT AG
    Inventors: Jörg Schultz, Johannes Wangler, Karl-Heinz Schuster, Udo Dinger, Wolfgang Singer, Martin Antoni, Joachim Wietzorrek, Joachim Hainz
  • Patent number: 7362414
    Abstract: There is provided an optical system including an optical element having a first used area and a second used area on which impinge rays of a light bundle, and a device for moving the optical element between a first position and a second position. The light bundle impinges on the first used area when the optical element is in the first position, and light bundle impinges on the second used area when the optical element is in the second position.
    Type: Grant
    Filed: February 24, 2005
    Date of Patent: April 22, 2008
    Assignee: Carl Zeiss SMT AG
    Inventors: Wolfgang Singer, Joachim Hainz, Joachim Wietzorrek, Markus Weiss
  • Publication number: 20080042079
    Abstract: There is provided a system that includes a first optical sub-system contained in a first space, and a second optical sub-system contained in a second space. The first and said second spaces are separated by a structure selected from the group consisting of a diaphragm and a valve.
    Type: Application
    Filed: October 16, 2007
    Publication date: February 21, 2008
    Applicant: Carl Zeiss SMT
    Inventors: Wolfgang Singer, Wilhelm Egle, Markus Weiss, Joachim Hainz, Joachim Wietzorrek, Johannes Wangler, Frank Melzer, Bernhard Gellrich, Bernhard Geuppert, Erich Schubert, Martin Antoni
  • Patent number: 7321126
    Abstract: There is provided a projection exposure system operable in a scanning mode along a scanning direction. The projection exposure system includes a collector that receives light having a wavelength ?193 nm and illuminates a region in a plane. The plane is defined by a local coordinate system having a y-direction parallel to the scanning direction and an x-direction perpendicular to the scanning direction. The collector includes (a) a first mirror shell, (b) a second mirror shell within the first mirror shell, and (c) a fastening device for fastening the first and second mirror shells. The mirror shells are substantially rotational symmetric about a common rotational axis. The fastening device has a support spoke that extends in a radial direction of the mirror shells, and the support spoke, when projected into the plane, yields a projection that is non-parallel to the y-direction.
    Type: Grant
    Filed: May 2, 2006
    Date of Patent: January 22, 2008
    Assignee: Carl Zeiss SMT AG
    Inventors: Wolfgang Singer, Wilhelm Egle, Markus Weiss, Joachim Hainz, Joachim Wietzorrek, Johannes Wangler, Frank Melzer, Bernhard Gellrich, Bernhard Geuppert, Erich Schubert, Martin Antoni
  • Publication number: 20070285644
    Abstract: An illumination system for a microlithographic projection exposure apparatus comprises a masking device and a masking objective which projects the masking device onto an image plane. The illumination system further includes an optical correction element having a surface that is either aspherically shaped or supports diffractive structures that have at least substantially the effect of an aspherical surface. This surface is arranged at least approximately in a field plane which precedes the image plane of the masking objective The aspherically acting surface is designed such that a principal ray distribution generated by the illumination system in the image plane matches a principal ray distribution required by a projection objective.
    Type: Application
    Filed: September 13, 2005
    Publication date: December 13, 2007
    Applicant: CARL ZEISS SMT AG
    Inventors: Markus Brotsack, Markus Deguenther, Wilhelm Ulrich, Joachim Wietzorrek, Johannes Wangler, Heiko Feldmann, Andreas Zeiler
  • Publication number: 20070283591
    Abstract: There is provided, a system that includes (a) a source of light having a wavelength of less than or equal to about 193 nm, (b) an optical element having a region for directing the light, (c) an arrangement for cleaning the region, and (d) a chamber to accommodate the region during the cleaning.
    Type: Application
    Filed: April 27, 2007
    Publication date: December 13, 2007
    Applicant: Carl-Zeiss SMT AG
    Inventors: Wolfgang Singer, Joachim Hainz, Joachim Wietzorrek, Markus Weiss