Patents by Inventor Jocelyn Blair

Jocelyn Blair has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • METHOD FOR COMPUTATIONAL METROLOGY AND INSPECTION FOR PATTERNS TO BE MANUFACTURED ON A SUBSTRATE
    Publication number: 20230037918
    Abstract: Methods include generating a scanner aerial image using a neural network, where the scanner aerial image is generated using a mask inspection image that has been generated by a mask inspection machine. Embodiments also include training the neural network with a set of images, such as with a simulated scanner aerial image and another image selected from a simulated mask inspection image, a simulated Critical Dimension Scanning Electron Microscope (CD-SEM) image, a simulated scanner emulator image and a simulated actinic mask inspection image.
    Type: Application
    Filed: August 2, 2022
    Publication date: February 9, 2023
    Applicant: D2S, Inc.
    Inventors: Linyong Pang, Jocelyn Blair, Ajay Baranwal