Abstract: An apparatus for estimating a physical state of a movable object includes a processor receiving or determining a probability mass function including probabilities for each of a first group of at least two movement classes, wherein the movement models of the first group being determined using sensor data from the inertial measurement unit. The processor receives at least one additional probability mass function associated with a second group of at least two movement classes, wherein the additional probability mass function has been obtained using additional information different from the sensor data.

Abstract: A microscope system includes at least one lens that defines an illumination field and at least one light source that emits an illuminating light beam for illuminating a specimen through the lens. At least one detector is provided for, pixel-by-pixel, detecting a detection light beam coming from the specimen. An electronic circuit is connected downstream from the detector, the electronic circuit including a memory unit for storing a wavelength-dependent brightness distribution of an illumination field of the at least one lens. The electronic circuit employs, pixel-by-pixel, the stored wavelength-dependent brightness distribution so as to form a homogeneously illuminated image field. An actuatable element is provided for controlling, pixel-by-pixel, an intensity of the illuminating light beam as a function of the stored wavelength-dependent brightness distribution so as to homogeneously illuminate the illumination field.

Abstract: A microscope system (4) for the observation of dynamic processes comprises a microscope (50) having at least one detector (19), and a computer (34). A buffer memory (54) precedes a comparator (58) that compares image contents of at least two successive image frames (56k and 56k+1). Depending on the result obtained from the comparator (58), the image frames are stored in different segments of a data structure (66) that is provided.

Abstract: The present invention concerns a method and an arrangement for imaging and measuring microscopic three-dimensional structures. In them, a data set is depicted in three-dimensional form on a display (27) associated with the microscope. At least one arbitrary section position and an arbitrary rotation angle are defined by the user. Rotation of the three-dimensional depiction on the display (27) is performed until a structure contained in the three-dimensional form reproduces on the display (27) a depiction that appears suitable to the user. The corresponding analytical operations are then performed on the structure.

Abstract: A microscope system (4) for the observation of dynamic processes comprises a microscope (50) having at least one detector (19), and a computer (34). A buffer memory (54) precedes a comparator (58) that compares image contents of at least two successive image frames (56k and 56k+1). Depending on the result obtained from the comparator (58), the image frames are stored in different segments of a data structure (66) that is provided.

Abstract: The present invention concerns a method and an arrangement for imaging and measuring microscopic three-dimensional structures. In them, a data set is depicted in three-dimensional form on a display (27) associated with the microscope. At least one arbitrary section position and an arbitrary rotation angle are defined by the user. Rotation of the three-dimensional depiction on the display (27) is performed until a structure contained in the three-dimensional form reproduces on the display (27) a depiction that appears suitable to the user. The corresponding analytical operations are then performed on the structure.