Abstract: A system for supporting and spatially orienting an optical element within an analytical instrument, the instrument being of the type having a source of analytical radiation and optical elements for directing the radiation through the instrument. A planar base is secured within the instrument while a support plate carries an optical element to be supported within the instrument. A member spaces one support plate portion from the base while allowing a spatial reorientation of the support plate around the spaced support plate portion. First and second point contact systems adjustably space different support plate portions from the base. The support plate is resiliently biased toward the base with the adjustable point contacts establishing the spacial orientation of the support plate, and thus the optical element, relative to the base.

Abstract: An analytical instrument including a source of analytical radiation, a support for a sample to be analyzed, an analytical radiation detector and optical elements for directing the analytical radiation within the instrument including a beam condenser system having elements for focusing the radiation relative to the sample support and the detector and elements for collimating radiation focused relative to the sample support and deflecting it for focusing on the detector. The collimating and deflecting elements are supported for common movement in a first direction with the collimating element being supported for movement, independently of the deflecting element, in a second direction orthogonal to the first direction. The collimating and deflecting elements may each be reflecting elements or the collimating element may be a refracting element.