Abstract: A method for testing a sensor of a device includes: displaying a test pattern on a display of the device; reflecting, by a reflector disposed over the display, at least a portion of the displayed test pattern; and capturing, by the sensor, a test pattern frame using the displayed test pattern and the reflector.

Abstract: A method for testing a sensor of a device includes: displaying a test pattern on a display of the device; reflecting, by a reflector disposed over the display, at least a portion of the displayed test pattern; and capturing, by the sensor, a test pattern frame using the displayed test pattern and the reflector.

Abstract: A switch comprising one or more keys mounted on a mat is disclosed. Each of the one or more keys includes a top section, a bottom section and an undercut region formed between the top section, the bottom section and the mat. Each of the one or more keys having a conductive surface mounted on an underside of the one or more keys. The switch also includes a substrate having one or more switch circuits corresponding to each of the one or more keys. Each of the one or more keys is mounted over each of the switch circuits and wherein when each of the keys is depressed the conductive surface contacts the switch circuit and completes the circuit. The switch further includes a bezel having one or more openings corresponding to the one or more keys. Each of the one or more keys is mounted through the one or more openings such that the top section of each of the one or more keys is on a top surface of the bezel and the bezel is in the undercut region.