Patents by Inventor Joerg Fober
Joerg Fober has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11092702Abstract: A particle beam system is configured to perform a method which includes: preventing at least one of generation of induced particles and incidence of the induced particles onto a detection area of a detector configured to output a detection signal; generating a residual signal by processing the detection signal outputted during the preventing using a control value; adjusting, based on the residual signal, the control value so that the residual signal takes a value within a predetermined limited residual-signal target range; directing a primary particle beam onto an object while allowing generation of the induced particles due to the primary particle beam and incidence of the induced particles onto the detection area; generating a result signal by processing the detection signal outputted during the directing using the control value.Type: GrantFiled: September 13, 2019Date of Patent: August 17, 2021Assignee: Carl Zeiss Microscopy GmbHInventors: Jörg Fober, Judith Kimling, Wolfgang Berger, Stefan Meyer, Björn Gamm
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Patent number: 10615000Abstract: An electron beam microscope includes an energy-sensitive detector to detect backscattered electrons and a signal processor for processing detection signals of the detector. The signal processor includes an analog amplifier. The signal processor also includes a window comparator having a signal input connected to an output of the analog amplifier. A signal generated at an output of the signal processor is generated based on a signal provided at an output the window comparator. The window comparator is configured to output a predetermined signal only if the amplified signal supplied to its signal input is less than or equal to an upper threshold and greater than or equal to a lower threshold.Type: GrantFiled: March 26, 2019Date of Patent: April 7, 2020Assignee: Carl Zeiss Microscopy GmbHInventors: Luyang Han, Joerg Fober, Stefan Meyer, Wolfgang Berger
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Patent number: 10546717Abstract: The system described herein relates to a high-voltage supply unit for providing an output voltage for a particle beam apparatus, wherein the particle beam apparatus is embodied as, for example, an electron beam apparatus and/or an ion beam apparatus. The system described herein is based on the fact that it was recognized that a bipolar voltage supply unit can be formed by means of a unipolar first current source and a unipolar second current source, said bipolar voltage supply unit enabling a load current in two directions. The high-voltage supply unit according to the system described herein can be operated in the 4-quadrant operation. In the 4-quadrant operation, a first voltage source for supplying the first current source and a second voltage source for supplying the second current source are embodied as different voltage sources.Type: GrantFiled: March 19, 2018Date of Patent: January 28, 2020Assignee: Carl Zeiss Microscopy GmbHInventors: Edgar Fichter, Joerg Fober, Dirk Preikszas, Christian Hendrich, Michael Schnell, Momme Mommsen
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Publication number: 20190304742Abstract: An electron beam microscope includes an energy-sensitive detector to detect backscattered electrons and a signal processor for processing detection signals of the detector. The signal processor includes an analog amplifier. The signal processor also includes a window comparator having a signal input connected to an output of the analog amplifier. A signal generated at an output of the signal processor is generated based on a signal provided at an output the window comparator. The window comparator is configured to output a predetermined signal only if the amplified signal supplied to its signal input is less than or equal to an upper threshold and greater than or equal to a lower threshold.Type: ApplicationFiled: March 26, 2019Publication date: October 3, 2019Inventors: Luyang Han, Joerg Fober, Stefan Meyer, Wolfgang Berger
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Publication number: 20180211815Abstract: The system described herein relates to a high-voltage supply unit for providing an output voltage for a particle beam apparatus, wherein the particle beam apparatus is embodied as, for example, an electron beam apparatus and/or an ion beam apparatus. The system described herein is based on the fact that it was recognized that a bipolar voltage supply unit can be formed by means of a unipolar first current source and a unipolar second current source, said bipolar voltage supply unit enabling a load current in two directions. The high-voltage supply unit according to the system described herein can be operated in the 4-quadrant operation. In the 4-quadrant operation, a first voltage source for supplying the first current source and a second voltage source for supplying the second current source are embodied as different voltage sources.Type: ApplicationFiled: March 19, 2018Publication date: July 26, 2018Inventors: Edgar Fichter, Joerg Fober, Dirk Preikszas, Christian Hendrich, Michael Schnell, Momme Mommsen
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Patent number: 9953804Abstract: The system described herein relates to a high-voltage supply unit for providing an output voltage for a particle beam apparatus, wherein the particle beam apparatus is embodied as, for example, an electron beam apparatus and/or an ion beam apparatus. The system described herein is based on the fact that it was recognized that a bipolar voltage supply unit can be formed by means of a unipolar first current source and a unipolar second current source, said bipolar voltage supply unit enabling a load current in two directions. The high-voltage supply unit according to the system described herein can be operated in the 4-quadrant operation. In the 4-quadrant operation, a first voltage source for supplying the first current source and a second voltage source for supplying the second current source are embodied as different voltage sources.Type: GrantFiled: April 22, 2016Date of Patent: April 24, 2018Assignee: Carl Zeiss Microscopy GmbHInventors: Edgar Fichter, Joerg Fober, Dirk Preikszas, Christian Hendrich, Michael Schnell, Momme Mommsen
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Publication number: 20160314931Abstract: The system described herein relates to a high-voltage supply unit for providing an output voltage for a particle beam apparatus, wherein the particle beam apparatus is embodied as, for example, an electron beam apparatus and/or an ion beam apparatus. The system described herein is based on the fact that it was recognized that a bipolar voltage supply unit can be formed by means of a unipolar first current source and a unipolar second current source, said bipolar voltage supply unit enabling a load current in two directions. The high-voltage supply unit according to the system described herein can be operated in the 4-quadrant operation. In the 4-quadrant operation, a first voltage source for supplying the first current source and a second voltage source for supplying the second current source are embodied as different voltage sources.Type: ApplicationFiled: April 22, 2016Publication date: October 27, 2016Inventors: Edgar Fichter, Joerg Fober, Dirk Preikszas, Christian Hendrich, Michael Schnell, Momme Mommsen
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Patent number: 9312093Abstract: A particle beam device comprises a beam generator for generating a particle beam having charged particles and an electrode unit having a first electrode and a second electrode, wherein the first electrode interacts with the second electrode, in particular for guiding, shaping, aligning or correcting the particle beam. Moreover, the particle beam device comprises a low-pass filter being connected with at least one of: the first electrode and the second electrode, using an electrical connection. Additionally, the particle beam device comprises a mounting unit having an opening for the passage of the particle beam, wherein the at least one low-pass filter, the first electrode and the second electrode are arranged at the mounting unit. The electrode unit may comprise more than two electrodes, for example up to 16 electrodes.Type: GrantFiled: July 2, 2014Date of Patent: April 12, 2016Assignee: Carl Zeiss Microscopy GmbHInventors: Joerg Fober, Edgar Fichter, Kai Schubert, Dirk Preikszas, Christian Hendrich, Momme Mommsen, Michael Schnell, Lorenz Lechner
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Patent number: 8759800Abstract: A high-voltage supply unit is provided for a particle beam device. The high-voltage supply unit includes at least one high-voltage cable for feeding a high voltage, and at least one measuring device for measuring the high voltage. The measuring device has at least one first capacitor, and the first capacitor is formed by at least one first section of the high-voltage cable.Type: GrantFiled: June 14, 2012Date of Patent: June 24, 2014Assignee: Carl Zeiss Microscopy GmbHInventors: Joerg Fober, Martin Hugelmann
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Patent number: 8642956Abstract: A transmission electron microscope comprises a high-voltage source for outputting a high voltage at two high-voltage outputs and outputting a control signal at a controller output; a focusing lens for focusing a beam; a monochromator which allows only those particles of the particle beam to pass whose kinetic energy is within an adjustable energy interval; an energy-dispersive component which deflects particles of different kinetic energies differently; a detector; and a controller connected to the controller output, which controls a beam deflector, arranged between the energy-dispersive component and the detector, the monochromator, or the energy-dispersive component in dependence on the control signal, or superposes plural of intensity distributions detected by the detector with an offset relative to one another, which offset is set in dependence on the control signal.Type: GrantFiled: December 23, 2011Date of Patent: February 4, 2014Assignee: Carl Zeiss Microscopy GmbHInventor: Joerg Fober
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Publication number: 20130092836Abstract: A transmission electron microscope comprises a high-voltage source for outputting a high voltage at two high-voltage outputs and outputting a control signal at a controller output; a focusing lens for focusing a beam; a monochromator which allows only those particles of the particle beam to pass whose kinetic energy is within an adjustable energy interval; an energy-dispersive component which deflects particles of different kinetic energies differently; a detector; and a controller connected to the controller output, which controls a beam deflector, arranged between the energy-dispersive component and the detector, the monochromator, or the energy-dispersive component in dependence on the control signal, or superposes plural of intensity distributions detected by the detector with an offset relative to one another, which offset is set in dependence on the control signal.Type: ApplicationFiled: December 23, 2011Publication date: April 18, 2013Applicant: CARL ZEISS NTS GMBHInventor: Joerg Fober
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Publication number: 20120318975Abstract: A high-voltage supply unit is provided for a particle beam device. The high-voltage supply unit includes at least one high-voltage cable for feeding a high voltage, and at least one measuring device for measuring the high voltage. The measuring device has at least one first capacitor, and the first capacitor is formed by at least one first section of the high-voltage cable.Type: ApplicationFiled: June 14, 2012Publication date: December 20, 2012Inventors: Joerg Fober, Martin Hugelmann