Abstract: An aspect includes a computer program product for implementing a model of an electrical circuit including a first region and a second region, the first region including simulated logic and a simulated latch circuit. The computer program product includes a tangible storage medium readable by a processing circuit for performing a method. The method includes receiving, as simulated logical inputs to the simulated logic a simulated power supply voltage state of the first region, a simulated data input signal and a simulated clock signal. The method also includes generating, based on determining that the simulated power supply voltage state of the first region corresponds to an inactive state of the first region, a pseudo-random number as an output of the simulated latch circuit, the pseudo-random number generated based on the simulated data input signal and the simulated data output signal from the simulated latch circuit.

Abstract: An apparatus for performing temporal checking is disclosed. A signal logger for performing temporal checking includes a group of edge detection modules and a group of counting modules. During testing, the signal logger is coupled to a device under testing (DUT). Each of the edge detection modules is capable of maintaining edge information after a state transition on a signal within the DUT has been detected. Each of the counting modules is associated with one of the edge detection modules. Each of the countering modules is capable of maintaining a clock cycle count information associated with a detected edge. After the testing has been completed, temporal checking information on a signal within the DUT can be obtained by reconstructing the edge information and the associated clock cycle count information of the signal collected during the test.

Abstract: The present invention provides a method and apparatus for efficiently loading values into scan and non-scan memory elements. First, the network used to distribute control signals to the memory elements is cleared. Second, the desired values are loaded into the scan memory elements. Third, the values from the scan memory elements are propagated to the non-scan memory elements.

Abstract: The present invention relates to a system for verifying the proper operation of a digital logic circuit and program product therefore. In order to add a useful alternative in the field of functional, exhaustive simulation and of symbolic simulation, it is proposed to perform the steps of: a) marking a net with an additional property other than a bit value, wherein both said bit value and said additional property are valid at said net at a given time; b) propagating the marking of the net according to a set of predetermined semantic rules, wherein the set of predetermined semantic rules are defined according to a predetermined simulation; and c) generating an output at a predetermined downstream location of the digital logic circuit, said output providing an information, if or if not said property has propagated through the circuit to said predetermined downstream location or not.

Abstract: The present invention provides an apparatus and a computer program product for applying external clock and data patterns for TTP-LBIST. A simulation model for the logic under test is set up in a simulator. Next, a user sets up an external LBIST block, which comprises pre-verified internal clock and data pattern logic, and connects this block to the logic in the simulation model. The internal clock and data pattern logic provides the input patterns used in OPCG modes of LBIST. This internal clock and data pattern logic is already verified through the design effort. Therefore, the internal pattern generators become the external pattern generators in the simulation model. The external LBIST block applies the external clock and data patterns, and subsequently, the user receives and processes these output patterns to determine if the logic operates correctly.

Abstract: The present invention provides a method and apparatus for efficiently loading values into scan and non-scan memory elements. First, the network used to distribute control signals to the memory elements is cleared. Second, the desired values are loaded into the scan memory elements. Third, the values from the scan memory elements are propagated to the non-scan memory elements.

Abstract: An apparatus for performing temporal checking is disclosed. A signal logger for performing temporal checking includes a group of edge detection modules and a group of counting modules. During testing, the signal logger is coupled to a device under testing (DUT). Each of the edge detection modules is capable of maintaining edge information after a state transition on a signal within the DUT has been detected. Each of the counting modules is associated with one of the edge detection modules. Each of the countering modules is capable of maintaining a clock cycle count information associated with a detected edge. After the testing has been completed, temporal checking information on a signal within the DUT can be obtained by reconstructing the edge information and the associated clock cycle count information of the signal collected during the test.

Abstract: The present invention provides a method and apparatus for efficiently loading values into scan and non-scan memory elements. First, the network used to distribute control signals to the memory elements is cleared. Second, the desired values are loaded into the scan memory elements. Third, the values from the scan memory elements are propagated to the non-scan memory elements.

Abstract: The present invention relates to a system for verifying the proper operation of a digital logic circuit and program product therefor. In order to add a useful alternative in the field of functional, exhaustive simulation and of symbolic simulation, it is proposed to perform the steps of: a) marking a net with an additional property other than a bit value, wherein both said bit value and said additional property are valid at said net at a given time; b) propagating the marking of the net according to a set of predetermined semantic rules, wherein the set of predetermined semantic rules are defined according to a predetermined simulation; and c) generating an output at a predetermined downstream location of the digital logic circuit, said output providing an information, if or if not said property has propagated through the circuit to said predetermined downstream location or not.

Abstract: An apparatus for performing temporal checking is disclosed. A signal logger for performing temporal checking includes a group of edge detection modules and a group of counting modules. During testing, the signal logger is coupled to a device under testing (DUT). Each of the edge detection modules is capable of maintaining edge information after a state transition on a signal within the DUT has been detected. Each of the counting modules is associated with one of the edge detection modules. Each of the countering modules is capable of maintaining a clock cycle count information associated with a detected edge. After the testing has been completed, temporal checking information on a signal within the DUT can be obtained by reconstructing the edge information and the associated clock cycle count information of the signal collected during the test.

Abstract: An apparatus for performing temporal checking is disclosed. A signal logger for performing temporal checking includes a group of edge detection modules and a group of counting modules. During testing, the signal logger is coupled to a device under testing (DUT). Each of the edge detection modules is capable of maintaining edge information after a state transition on a signal within the DUT has been detected. Each of the counting modules is associated with one of the edge detection modules. Each of the countering modules is capable of maintaining a clock cycle count information associated with a detected edge. After the testing has been completed, temporal checking information on a signal within the DUT can be obtained by reconstructing the edge information and the associated clock cycle count information of the signal collected during the test.

Abstract: A system, apparatus and method of isolating a plurality of limiting logical cones in a chip during a logical built-in self test (LBIST) are provided. An LBIST is performed on the chip in order to locate a first latch that fails the test. Particularly, latches on the chip are arranged in a plurality of scan chains wherein each latch holds data for a logical cone. The LBIST is performed on one scan chain at a time. Once the first latch is located, a first limiting cone (i.e., the cone for which the first latch is holding data) may be isolated. After isolating the first limiting cone, the data from the first latch is masked out and the LBIST is repeated on the scan chain. The data is masked out in order to facilitate the identification of any other latch that may fail the test. Again, if another latch fails the test a corresponding limiting cone may be isolated.

Abstract: The present invention relates to a method for verifying the proper operation of a digital logic circuit. In order to add a useful alternative in the field of functional, exhaustive simulation and of symbolic simulation, it is proposed to perform the steps of: a) marking a net with an additional property other than a bit value, wherein both said bit value and said additional property are valid at said net at a given time; b) propagating the marking of the net according to a set of predetermined semantic rules, wherein the set of predetermined semantic rules are defined according to a predetermined simulation aim; and c) generating an output at a predetermined downstream location of the digital logic circuit, said output providing an information, if or if not said property has propagated through the circuit to said predetermined downstream location or not.

Abstract: Methods, apparatus, and products are disclosed for scan verification for a simulated device under test (‘DUT’), the DUT having scan chains, scan inputs, and scan outputs that include verifying correct data entry from the scan inputs of the DUT into the beginning of the scan chain, verifying correct propagation of scan data in the scan chain between the scan inputs and the scan outputs, verifying correct data output from the end of the scan chain to the scan outputs, and leak testing the scan chain with undetermined states for scan cells in the scan chain.

Abstract: A system, apparatus and method of isolating a plurality of limiting logical cones in a chip during a logical built-in self test (LBIST) are provided. An LBIST is performed on the chip in order to locate a first latch that fails the test. Particularly, latches on the chip are arranged in a plurality of scan chains wherein each latch holds data for a logical cone. The LBIST is performed on one scan chain at a time. Once the first latch is located, a first limiting cone (i.e., the cone for which the first latch is holding data) may be isolated. After isolating the first limiting cone, the data from the first latch is masked out and the LBIST is repeated on the scan chain. The data is masked out in order to facilitate the identification of any other latch that may fail the test. Again, if another latch fails the test a corresponding limiting cone may be isolated.

Abstract: The present invention provides a method, an apparatus, and a computer program product for applying external clock and data patterns for TTP-LBIST. A simulation model for the logic under test is set up in a simulator. Next, a user sets up an external LBIST block, which comprises pre-verified internal clock and data pattern logic, and connects this block to the logic in the simulation model. The internal clock and data pattern logic provides the input patterns used in OPCG modes of LBIST. This internal clock and data pattern logic is already verified through the design effort. Therefore, the internal pattern generators become the external pattern generators in the simulation model. The external LBIST block applies the external clock and data patterns, and subsequently, the user receives and processes these output patterns to determine if the logic operates correctly.

Abstract: The present invention generally relates to hardware development and design, and in particular it relates to a method for simulating hardware. A meta model (22) is compiled for integrating a plurality of n different instantiations (12A, . . . 12N) of the same hardware model, and facilities and signals of different instantiations are resolved by instantiation-specific name space specifications in a code switch (24,26). Thus, computing time is saved because by simulating the meta model, the processor resources, for instance, storage spaces, are utilized more efficiently.

Abstract: The present invention provides a method, an apparatus, and a computer program product for applying external clock and data patterns for TTP-LBIST. A simulation model for the logic under test is set up in a simulator. Next, a user sets up an external LBIST block, which comprises pre-verified internal clock and data pattern logic, and connects this block to the logic in the simulation model. The internal clock and data pattern logic provides the input patterns used in OPCG modes of LBIST. This internal clock and data pattern logic is already verified through the design effort. Therefore, the internal pattern generators become the external pattern generators in the simulation model. The external LBIST block applies the external clock and data patterns, and subsequently, the user receives and processes these output patterns to determine if the logic operates correctly.

Abstract: A method, system and computer program product for performing verification is disclosed. A high-level description of a design is created and constrained drivers are synthesized from the high-level description of the design. A testbench is generated from the high-level description of the design and the constrained drivers and a formal equivalence is evaluated on the testbench to perform verification.

Abstract: The present invention relates to the processing of hardware simulator instruction requests. A request broker is processing high-level simulator instruction requests submitted by different drivers. A high-level instruction request comprises multiple simulator instructions. The request broker is receiving and splitting the requests into simulator instructions. The instructions are put in a request queue associated to the driver originating the request. The request broker is then processing the request queues in a round-robin fashion and submits the instructions in a queue to the simulator until a clock instruction needs to be submitted. Then the next queue is processed. When only clock instructions need to be submitted, the minimum number of clock cycles is determined and submitted in a new instruction to the simulator. This minimum number is then subtracted from the clock instructions in the queues, and the drivers are queried for new requests.