Abstract: A probe includes a self-aligning connector set, a moveable probe tip, a cable, a housing, and a spring. When the probe tip is pressed to a test point on a device-under-test, the probe tip moves within the housing to cause a first connector and a second connector of the self-aligning connector set to be connected through an adapter of the self-aligning connector set, thereby establishing a signal path through the probe. The first connector, second connector, and adapter are structured so that their respective ground conductors become connected prior to their respective signal conductors becoming connected. Electro-static charge present at the test point is safely discharged through a resistor to ground before the signal path through the probe is established, thereby preventing damage to the probe and connected host instrument. When the probe tip is removed from the device-under-test, the spring forces a disconnection of the first and second connectors.

Abstract: A probe includes a self-aligning connector set, a moveable probe tip, a cable, a housing, and a spring. When the probe tip is pressed to a test point on a device-under-test, the probe tip moves within the housing to cause a first connector and a second connector of the self-aligning connector set to be connected through an adapter of the self-aligning connector set, thereby establishing a signal path through the probe. The first connector, second connector, and adapter are structured so that their respective ground conductors become connected prior to their respective signal conductors becoming connected. Electro-static charge present at the test point is safely discharged through a resistor to ground before the signal path through the probe is established, thereby preventing damage to the probe and connected host instrument. When the probe tip is removed from the device-under-test, the spring forces a disconnection of the first and second connectors.

Abstract: A time shifting signal acquisition probe system has a signal acquisition probe having a memory containing a time delay constant representative of the propagation time delay of an electrical signal passing through the signal acquisition probe. A measurement test instrument receives the electrical signal from the signal acquisition probe and generating digital samples of the electrical signal in an acquisition system in response to a trigger signal and producing a waveform record. A communications bus coupled between the signal acquisition probe and the measurement test instrument couples the signal acquisition probe time delay constant from the signal acquisition probe to the measurement test instrument wherein processing circuitry in the measurement test instrument time shifts the waveform record of the electrical signal relative to the trigger signal by the amount of the signal acquisition probe time delay constant.

Abstract: A time shifting signal acquisition probe system has a signal acquisition probe having a memory containing a time delay constant representative of the propagation time delay of an electrical signal passing through the signal acquisition probe. A measurement test instrument receives the electrical signal from the signal acquisition probe and generating digital samples of the electrical signal in an acquisition system in response to a trigger signal and producing a waveform record. A communications bus coupled between the signal acquisition probe and the measurement test instrument couples the signal acquisition probe time delay constant from the signal acquisition probe to the measurement test instrument wherein processing circuitry in the measurement test instrument time shifts the waveform record of the electrical signal relative to the trigger signal by the amount of the signal acquisition probe time delay constant.

Abstract: An electronic accessory assembly to be used with a host electronic instrument provides previously recorded data from a non-volatile memory as to the accessory's operational capabilities. This memory is accessed by a host device either when the host device is powered up, or when an new accessory is connected to the host device. The host device then uses this information along with the operational requirements of the user to set the operational parameters of the accessory/host combination to optimally perform the functions required by the user.

Abstract: A step generator for producing steps having constant edge parameters while driving varying loads includes a pair of DC coupled low speed diode switches for slowly switching the output load current. A pair of capacitors provide an AC coupled high speed input for rapidly, but temporarily, switching the output load current until the sustaining action of the low speed diode switch has occurred. A pair of resistor divider circuits in each of the low speed diode switches maintains a relatively constant reverse bias voltage across the diodes coupled to the capacitors. The high speed switching threshold is maintained at a relatively constant level which produces an output voltage step with constant edge parameters and no overshoot.

Abstract: A dual channel time domain reflectometer includes a pair of input lines connected at respective nodes to a reference flat current pulse generator and a traveling wave sampling gate, respectively. The sampling gates are actuated by a balanced strobe generator which includes a waveguide coupler for coupling a high amplitude fast rise time pulse to each of the gates simultaneously. Pulses of requisite amplitude and shape are generated by a circuit responsive to a strobe trigger input which drives a step recovery diode.