Patents by Inventor John C. Holecek

John C. Holecek has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Time-of-flight SIMS/MSRI reflectron mass analyzer and method
    Patent number: 6008491
    Abstract: A method and apparatus for analyzing the surface characteristics of a sample by Secondary Ion Mass Spectroscopy (SIMS) and Mass Spectroscopy of Recoiled Ions (MSRI) is provided. The method includes detecting back scattered primary ions, low energy ejected species, and high energy ejected species by ion beam surface analysis techniques comprising positioning a ToF SIMS/MSRI mass analyzer at a predetermined angle .theta., where .theta. is the angle between the horizontal axis of the mass analyzer and the undeflected primary ion beam line, and applying a specific voltage to the back ring of the analyzer. Preferably, .theta. is less than or equal to about 120.degree. and, more preferably, equal to 74.degree.. For positive ion analysis, the extractor, lens, and front ring of the reflectron are set at negative high voltages (-HV). The back ring of the reflectron is set at greater than about +700V for MSRI measurements and between the range of about +15 V and about +50V for SIMS measurements.
    Type: Grant
    Filed: October 15, 1997
    Date of Patent: December 28, 1999
    Assignee: The United States of America as represented by the United States Department of Energy
    Inventors: Vincent S. Smentkowski, Dieter M. Gruen, Alan R. Krauss, J. Albert Schultz, John C. Holecek