Abstract: Apparatus and methods for constructing a tomographic image of a sample are disclosed. The apparatus comprises at least one source configured to emit electromagnetic radiation at a first wavelength, at least one angularly-selective detector configured to detect the electromagnetic radiation at a second wavelength after the electromagnetic radiation has interacted with the sample, and a controller configured to construct a tomographic image of the sample based on information gathered using the at least one detector. The controller obtains information indicative of an intensity of the electromagnetic radiation detected at a second position by the at least one detector while the source is in a first position. Then, the source and detector positions are interchanged, and the controller obtains information indicative of an intensity of the electromagnetic radiation detected at the first position by the at least one detector while the electromagnetic radiation is emitted from the second position.

Abstract: Apparatus and methods for constructing a tomographic image of a sample are disclosed. The apparatus comprises at least one source configured to emit electromagnetic radiation at a first wavelength, at least one angularly-selective detector configured to detect the electromagnetic radiation at a second wavelength after the electromagnetic radiation has interacted with the sample, and a controller configured to construct a tomographic image of the sample based on information gathered using the at least one detector. The controller obtains information indicative of an intensity of the electromagnetic radiation detected at a second position by the at least one detector while the source is in a first position. Then, the source and detector positions are interchanged, and the controller obtains information indicative of an intensity of the electromagnetic radiation detected at the first position by the at least one detector while the electromagnetic radiation is emitted from the second position.

Abstract: A system and method for optically imaging a sample. The method and system uses a controlled scatterer of light positioned in the near field of a sample. The extinguished power from an incident field, which illuminates both the sample and the controlled scatterer, is then measured as a function of the controlled scatterer position and is used to mathematically reconstruct an image of the sample.

Abstract: A system and method for optically imaging a sample. The method and system uses a controlled scatterer of light positioned in the near field of a sample. The extinguished power from an incident field, which illuminates both the sample and the controlled scatterer, is then measured as a function of the controlled scatterer position and is used to mathematically reconstruct an image of the sample.

Abstract: A method and computer program product for imaging an object are disclosed. The object is illuminated with an electromagnetic wave, characterized by a spectrum of illuminating wavevectors. Electromagnetic waves scattered by the object are detected, and are characterized by a spectrum of detected wavevectors. An aperture equal to or smaller than an instantaneous characterizing wavelength of the illuminating electromagnetic wave is disposed between the source and the detector. At least one of the illuminating and detected wavevectors is varied in magnitude to provide information regarding a scattering characteristic of the object. By applying a forward model of the aperture to derive a three-dimensional scattering model, a three-dimensional reconstruction of the object may be obtained by inverting a detected data function in terms of the forward model.

Abstract: An apparatus and methods for nanoscale optical tomography based on back-scattering mode near-field scanning optical microscopy with a volumetric scan of the probe. The back-scattered data collected by a volumetric scan of the probe contains three-dimensional structural information of the sample, which enables reconstruction of the dielectric sample without other mechanical movements of the instrument.

Abstract: An apparatus and methods for nanoscale optical tomography based on back-scattering mode near-field scanning optical microscopy with a volumetric scan of the probe. The back-scattered data collected by a volumetric scan of the probe contains three-dimensional structural information of the sample, which enables reconstruction of the dielectric sample without other mechanical movements of the instrument.

Abstract: A method and computer program product for imaging an object are disclosed. The object is illuminated with an electromagnetic wave, characterized by a spectrum of illuminating wavevectors. Electromagnetic waves scattered by the object are detected, and are characterized by a spectrum of detected wavevectors. An aperture equal to or smaller than an instantaneous characterizing wavelength of the illuminating electromagnetic wave is disposed between the source and the detector. At least one of the illuminating and detected wavevectors is varied in magnitude to provide information regarding a scattering characteristic of the object. By applying a forward model of the aperture to derive a three-dimensional scattering model, a three-dimensional reconstruction of the object may be obtained by inverting a detected data function in terms of the forward model.