Patents by Inventor John Dwinell

John Dwinell has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8139117
    Abstract: A system for the automated analysis of image quality obtained by a camera in a camera tunnel system includes a test pattern on an item for placement in the camera tunnel system and an imaging subsystem configured to capture an image of the item using the camera tunnel system, wherein the image includes an image of the test pattern. The system further includes an image analysis tool configured to automatically identify and analyze the image of the test pattern for generating one or more image quality metrics.
    Type: Grant
    Filed: April 20, 2007
    Date of Patent: March 20, 2012
    Assignee: Sick, Inc.
    Inventors: John Dwinell, Long Xiang Bian
  • Patent number: 8132728
    Abstract: A parcel dimension measurement system includes image sensors oriented to image a parcel, an imaging subsystem configured to stitch together outputs of the image sensors to produce at least one two-dimensional image comprised of a plurality of pixels, and a general dimension subsystem including general parcel dimension information. A fine dimensioning subsystem is configured to determine dimension measurements of the parcel using the at least one two-dimensional image and the general parcel dimension information.
    Type: Grant
    Filed: April 4, 2007
    Date of Patent: March 13, 2012
    Assignee: Sick, Inc.
    Inventors: John Dwinell, Long Xiang Bian
  • Publication number: 20080245873
    Abstract: A parcel dimension measurement system includes image sensors oriented to image a parcel, an imaging subsystem configured to stitch together outputs of the image sensors to produce at least one two-dimensional image comprised of a plurality of pixels, and a general dimension subsystem including general parcel dimension information. A fine dimensioning subsystem is configured to determine dimension measurements of the parcel using the at least one two-dimensional image and the general parcel dimension information.
    Type: Application
    Filed: April 4, 2007
    Publication date: October 9, 2008
    Inventors: John Dwinell, Long Xiang Bian
  • Publication number: 20070285537
    Abstract: A system for the automated analysis of image quality obtained by a camera in a camera tunnel system includes a test pattern on an item for placement in the camera tunnel system and an imaging subsystem configured to capture an image of the item using the camera tunnel system, wherein the image includes an image of the test pattern. The system further includes an image analysis tool configured to automatically identify and analyze the image of the test pattern for generating one or more image quality metrics.
    Type: Application
    Filed: April 20, 2007
    Publication date: December 13, 2007
    Inventors: John Dwinell, Long Bian
  • Publication number: 20070237356
    Abstract: A parcel imaging system includes means for transporting parcels and image sensors oriented to image the parcels. An image construction subsystem is configured to stitch together outputs of the image sensors to produce at least one two-dimensional images of a parcel, and to construct, using the at least one two-dimensional image, at least one displayable three-dimensional image of the parcel.
    Type: Application
    Filed: April 4, 2007
    Publication date: October 11, 2007
    Inventors: John Dwinell, Long Bian
  • Publication number: 20070103581
    Abstract: An imaging system includes a line-scan camera (8) having an image line in an planar imaging beam path and a depth of focus. Line forming optics are arranged between at least two arrays of LEDs (4,6) and the image object so as to form two respective illumination stripes in two planar illumination beam paths (5,7). The planar imaging beam path (9) is located between the two or more planar illumination beam paths (5,7). The planar imaging beam path (9) and the two planar illumination beam paths (5,7) preferably intersect proximate to the far depth of focus of the camera. The image line and illumination stripes are parallel across an image area, which may comprise a transport device, such as a conveyor. The non-coplanar planar illumination beam paths provide maximum overlap at the farthest depth of field where illumination is most needed and diverge closer to the camera.
    Type: Application
    Filed: October 22, 2004
    Publication date: May 10, 2007
    Inventors: John Dwinell, Jeffrey Bernstein