Abstract: A portable near-field measurement system for mapping radio frequency characteristics spherically about a test object is presented. The system includes an anechoic chamber, a rotatable annular platter, a rotatable platter, a stationary platform, and frequency converters. The chamber is an enclosure with an absorber material fastened to the interior thereof. The annular platter is disposed horizontally within the chamber and fastened to an azimuth positioner that rotates the annular platter about an azimuth rotation axis. The rotatable platter is disposed vertically within the chamber and rotatable about an elevation rotation axis via an elevation positioner. Azimuth and elevation axes intersect perpendicularly. A gantry arm with probe is fastened to and extends from the rotatable platter. A vertical arm is fastened between the annular platter and elevation positioner. Platters have front and back surfaces. A stationary platform is centered within the annular platter and attachable to a test column.

Abstract: A portable near-field measurement system for mapping radio frequency characteristics spherically about a test object is presented. The system includes an anechoic chamber, a rotatable annular platter, a rotatable platter, a stationary platform, and frequency converters. The chamber is an enclosure with an absorber material fastened to the interior thereof. The annular platter is disposed horizontally within the chamber and fastened to an azimuth positioner that rotates the annular platter about an azimuth rotation axis. The rotatable platter is disposed vertically within the chamber and rotatable about an elevation rotation axis via an elevation positioner. Azimuth and elevation axes intersect perpendicularly. A gantry arm with probe is fastened to and extends from the rotatable platter. A vertical arm is fastened between the annular platter and elevation positioner. Platters have front and back surfaces. A stationary platform is centered within the annular platter and attachable to a test column.

Abstract: An electromagnetic absorber assembly capable of minimizing reflectivity caused by reflected and diffracted waves within a test chamber is presented. The absorber assembly includes a plurality of first wedges and a plurality of second wedges disposed in a symmetrical arrangement so as to form a continuous and smoothly changing v-shaped pattern along one or more walls of an anechoic test chamber. Each wedge has a triangular-shaped first end and second end formed by a pair of side walls and a base wall. One second end of each first wedge contacts and covers one first end of each second wedge along a contact plane. First and second wedges are disposed at a first angle and a second angle, respectively, about the contact plane in a symmetrical arrangement. The assemblies described could be installed on a flat or shaped absorber base or wall to divert reflected and refracted fields away from a quiet zone.

Abstract: An electromagnetic absorber assembly (10) capable of minimizing reflectivity caused by reflected and diffracted waves within a test chamber (1) is presented. The absorber assembly (1) includes a plurality of first wedges (11) and a plurality of second wedges (11) disposed in a symmetrical arrangement so as to form a continuous and smoothly changing v-shaped pattern along one or more walls (5-7) of an anechoic test chamber (1). Each wedge (11) has a triangular-shaped first end (26) and second end (27) formed by a pair of side walls (16, 18, or 19) and a base wall (17). One second end (27) of each first wedge (11) contacts and covers one first end (26) of each second wedge (11) along a contact plane (15). First and second wedges (11) are disposed at a first angle (46) and a second angle (47), respectively, about the contact plane (15) in a symmetrical arrangement.