Abstract: Method and apparatus are disclosed for measuring the clock offset between a reference latch point and a subject latch point in a system. In the system, an associated latch point is provided on each chip which has a subject latch point, the clock offset to which is to be measured. Test data distribution means is provided for distributing a test data signal from a test data source point to the data input of the reference latch point and to the data input of the associated latch point. Cross-transmission means are also provided for connecting together the data input of the reference latch point and the data input of the associated latch point. A pulse burst generator is connected to the clock source point in the system and a test data signal generator is connected to the test data signal source point.

Abstract: Method and apparatus are disclosed for measuring the clock pulse width as it is received at a subject latch point in a system. In the system, test data distribution means is provided for distributing a test data signal from a test data source point to the data input of the subject latch point. The subject latch point is constructed to hold on its output the signal which was on the data input at selectably either the leading or trailing edge of the clock pulse. By adjusting the presettable delay in a test data signal generator, and observing the steady state output of the subject latch point conveniently after the last clock pulse in a burst reaches the subject latch point, it is possible to determine a delay setting at which the test data signal transition and the selected edge of the last clock pulse in the burst reach the subject latch point at substantially the same time. Using this method, two measurements are taken.

Abstract: Method and apparatus are disclosed for measuring the clock offset between a reference latch point and a subject latch point in a system. In the system, an associated latch point is provided on each chip which has a subject latch point, the clock offset to which is to be measured. Test data distribution means is provided for distributing a test data signal from a test data source point to the data input of the reference latch point and to the data input of the associated latch point. Cross-transmission means are also provided for connecting together the data input of the reference latch point and the data input of the associated latch point. A pulse burst generator is connected to the clock source point in the system and a test data signal generator is connected to the test data signal source point.