Patents by Inventor John F. Rowe

John F. Rowe has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Debugging in a semiconductor device test environment
    Patent number: 9959186
    Abstract: A test system that enables real-time interactive debugging of a device under test (DUT) using native customer code. A translation module may format, in real time, debug commands, corresponding to a user input, into a format recognizable by instruments in a tester. The user input may be a test program or test instructions written in a high-level programming language. The translation module may translate the user's debug commands into lower-level test instrument commands, based on which the tester may apply control signals to a processor in the DUT to test subsystems of the DUT. A result of the test may be provided to the translation module, which may, in real time, format another debug command, or provide an indication of the result to the user. The translation module may thus enable a user to step-through and modify native customer code in an interactive manner to debug a DUT.
    Type: Grant
    Filed: November 19, 2012
    Date of Patent: May 1, 2018
    Assignee: Teradyne, Inc.
    Inventors: Marc Reuben Hutner, John F. Rowe
  • DEBUGGING IN A SEMICONDUCTOR DEVICE TEST ENVIRONMENT
    Publication number: 20140143600
    Abstract: A test system that enables real-time interactive debugging of a device under test (DUT) using native customer code. A translation module may format, in real time, debug commands, corresponding to a user input, into a format recognizable by instruments in a tester. The user input may be a test program or test instructions written in a high-level programming language. The translation module may translate the user's debug commands into lower-level test instrument commands, based on which the tester may apply control signals to a processor in the DUT to test subsystems of the DUT. A result of the test may be provided to the translation module, which may, in real time, format another debug command, or provide an indication of the result to the user. The translation module may thus enable a user to step-through and modify native customer code in an interactive manner to debug a DUT.
    Type: Application
    Filed: November 19, 2012
    Publication date: May 22, 2014
    Applicant: Teradyne, Inc.
    Inventors: Marc Reuben Hutner, John F. Rowe
  • Beehive projectile
    Patent number: 3956990
    Abstract: 1.
    Type: Grant
    Filed: July 31, 1964
    Date of Patent: May 18, 1976
    Assignee: The United States of America as represented by the Secretary of the Army
    Inventor: John F. Rowe